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139 results about "Open-circuit test" patented technology
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The open-circuit test, or "no-load test", is one of the methods used in electrical engineering to determine the no-load impedance in the excitation branch of a transformer. The no load is represented by the open circuit, which is represented on the right side of the figure as the “hole” or incomplete part of the circuit.
A system debugging method for UHV DC transmission engineering station
ActiveCN102279325AScientific and reasonable arrangementIntegrity guaranteedElectrical testingOpen-circuit testUltra high voltage
The invention discloses an ultra high voltage direct current (UHVDC) transmission engineering station system debugging method. Through carrying out calculating, a sequential operation test, a last trip test, a commutation bus charging and power outage test, an alternating current filter group and capacitor group charging and power outage test, a test of switching performed by a converter transformer instead of a converter and a charged test, an open circuit test and a secondary equipment anti-interference test to the engineering station, station system debugging steps of the UHVDC transmission engineering are clearly provided, work tasks and test projects in each stage are provided and the test projects are arranged scientifically and reasonably. Simultaneously, test contents of each kind of the test projects are provided in the invention. Calculation and research are performed to various kinds of converter station system debugging operation modes based on fully investigation of the equipment and the system. By using an extra-high-voltage change-rheological station debugging scheme, instructiveness and operability of the debugging scheme to engineering enforcement can be greatly raised, test projects listed in the debugging scheme can be guaranteed to be complete, a test sequence is clear and a test mode is safe.
Owner:CHINA ELECTRIC POWER RES INST +1
Method for testing capacitive touch screens and testing equipment thereof
The invention provides a method for testing capacitive touch screens, comprising a novel method for integrated circuit (IC) function test, power consumption test, short circuit test and open test. The invention also provides testing equipment for capacitive touch screens, comprising a screen testing plate and a circuit detecting plate. The screen testing plate comprises a metal cylinder and a screen positioning groove; the metal cylinder is closely pressed against the screen testing plate and two ends of the metal cylinder are respectively placed at two sides of the screen positioning groove; the circuit detecting plate comprises a power supply module, a liquid crystal display (LCD) display module, a power consumption detecting module, a testing plate connecting terminal, a microprogrammed control unit (MCU) control module and an IC chip module. The testing plate connecting terminal is connected with a testing interface of the screen testing plate. The method and the equipment which integrate the short circuit test, the open test, the IC function test and the power consumption test can be used for detection of multiple performances and lines of capacitive touch screens; and the metal cylinder is used for simultaneous one-time detection for a row of sensors, which greatly enhances detection efficiency.
Owner:东莞通华液晶有限公司
Electrical switching apparatus including a trip coil open circuit test circuit and system including the same
A circuit breaker includes separable contacts, an operating mechanism structured to open and close the separable contacts, and a trip circuit including a trip coil and a fault detector. The fault detector energizes the trip coil to cause the operating mechanism to open the separable contacts. A test circuit is structured to test the trip coil and determine an open circuit condition thereof. An annunciation circuit is structured to annunciate the open circuit condition of the trip coil.
Owner:EATON INTELLIGENT POWER LIMITED
Flexible direct current power transmission converter performance testing platform and control method thereof
InactiveCN104714132AReduce capacity requirementsReduced strength requirementsElectrical testingTest powerOpen-circuit test
The invention provides a flexible direct current power transmission converter performance testing platform and a control method thereof. The direct current side of a first modularized multi-level converter and the direct current side of a second modularized multi-level converter are connected in a back-to-back mode, and three phases of the alternating current side of the first modularized multi-level converter are connected with three phases of the alternating current side of the second modularized multi-level converter correspondingly, so that a power circulation pathway is formed; a test power source is in parallel connection with the direct current side of the first modularized multi-level converter and the direct current side of the second modularized multi-level converter and provides loss power for steady-state operation testing; a short circuit generator is in parallel connection with the direct current side of the first modularized multi-level converter and the direct current side of the second modularized multi-level converter. According to the testing platform and the control method thereof, the requirement for power grid capacity is low; meanwhile, the direct current side power supply mode is adopted in the testing platform, and therefore the single test power source is adopted for the whole platform. With regard to test items of the short circuit and over-current turn-off required by IEC standards, due to the fact that the basic structure of the platform is basically the same with that of practical engineering, the short circuit test and the over-current turn-off test can be set through the platform according to double-pole short-circuit faults in a practical flexible direct current power transmission system.
Owner:SHANGHAI JIAO TONG UNIV
Open-Circuit Testing System and Method
ActiveUS20080218175A1Errors in the determination of the connection state due to insufficient capacitive coupling can be advantageously reducedElectric connection testingContactless circuit testingCapacitanceOpen-circuit test
The invention discloses a testing system and method suitable for determining the connection state of an electronic component in an electronic device assembly. In an embodiment, the testing system comprises a signal sensing unit configured to provide a sensed signal induced by capacitive coupling in response to the output of a testing signal passing through a tested pin, a signal processor unit configured to filter and over-sample the sensed signal to obtain a digital signal, and an analyzer unit configured to compute the digital signal for determining a connection state of the test pin.
Owner:TEST RES INC
System debugging method for DC ice melting device
ActiveCN101820153AFull inspection functionFull inspection performanceOverhead installationElectrical testingSystems analysisOpen-circuit test
The invention discloses a system debugging method for a DC ice melting device. The method comprises the following steps of: 1) analyzing and calculating the system under a debugging condition and performing an analog simulation test; 2) performing a closing impact test on the DC ice melting device; 3) performing an open-circuit test without an ice melting bus; 4) performing an open-circuit test with the ice melting bus; 5) performing an unlocking and blocking test with an ice melting circuit; 6) performing a manual emergency shutdown test with load; and 7) performing a heavy current test withthe ice melting circuit. The method can ensure thorough detection of the function and performance of the DC ice melting device through the system debugging and ensure that the DC ice melting deice can be reliably put into operation when needing ice melting. The method is a convenient and practical system debugging method for the DC ice melting device.
Owner:ELECTRIC POWER RESEARCH INSTITUTE, CHINA SOUTHERN POWER GRID CO LTD
Whole-satellite star sensor testing system and method based on optical signal
ActiveCN109029504ARealize quantitative assessmentThe test result is accurateMeasurement devicesOpen-circuit testTransmission channel
The invention discloses a whole-satellite star sensor testing system and method based on an optical signal. The data transmission the optical signal is realized by installing a dynamic satellite modeat a star sensor optical probe part when performing the whole-satellite testing, thereby accomplishing open-circuit testing and close-circuit testing of the star sensor by cooperating with a ground testing system. Through the method disclosed by the invention, a channel to a control computer from the star sensor optical probe can be completely checked without skipping any part, the high-precisionwhole-satellite control subsystem close-circuit testing regarding the star sensor as the input can be realized through the cooperation a data management uplink instruction injection command and a dynamics instruction, thereby precisely contrasting the input and output of the star sensor; an operation condition the star sensor in the satellite-sensitive control mode can be examined so as to solve aproblem that the dynamic response of a transmission channel, to the control computer from the optical probe, of the star sensor cannot be comprehensively verified in the previous whole-satellite testing.
Owner:CHINA ACADEMY OF SPACE TECHNOLOGY
Converter station grounding grid surge impedance testing method based on artificial short-circuit test
The invention provides a converter station grounding grid surge impedance testing method based on an artificial short-circuit test. The method includes the following steps that firstly, measuring equipment is selected according to the practical converter station conditions such as the surge current range and the surge voltage range; secondly, a signal sampling point where the surge current and the surge voltage are measured is arranged on a converter station grounding switch, the measuring equipment is arranged in corresponding protective chambers, and a surge voltage reference zero-potential point is arranged in the position with a proper distance away from a grounding grid of a converter station; thirdly, according to the measured converter station direct-current line condition, artificial short-circuit test points meeting safety conditions are selected, and grounding frame suspension preparatory work is conducted before the artificial short-circuit test. By the adoption of the method, the characteristic that a direct-current transmission system can form a ground current loop is fully utilized, the large surge current is provided through the transmission system, the problem that the large surge current is difficult to provide on the scene is solved, and the truth of surge grounding impedance is reflected.
Owner:YUNNAN POWER GRID CO LTD ELECTRIC POWER RES INST
Shorting or breaking circuit testing method of polyalcohol flexible packing
InactiveCN101114003AAvoid the phenomenon of leakage and swellingGuaranteed reliabilityElectrical testingShort-circuit testOpen-circuit test
The invention discloses a short open circuit test method to the polymer flexible packaging, the technical process is that: firstly a general short open circuit detector is prepared, one of the output ends in the detector is modified, namely, the output end is connected with two circuitries with anode and cathode switches in parallel, each circuitry is corresponding to an anode ear and a cathode ear of the batteries, another output end of the detector is connected with a needle shape conductor joint through a composite switch. The detection method is that: firstly each end of two parallel circuitries is correspondingly connected on the anode and the cathode of the batteries, the battery is detected whether is short circuit between the anode and the cathode, afterward the anode circuitry or the cathode circuitry is opened, another needle shape end is pricked into the redundant edge aluminum plastic film to detect whether the anode and the cathode and the plastic film form a short circuit. Adopting the short circuit test method, the batteries liquid leakage and bulge phenomena resulted form the 'box cancer' are avoided, therefore, the reliability of the battery quality is effectively guaranteed.
Owner:SHENZHEN B&K TECH
Single-phase instant artificial grounding short-circuit test system for power transmission line
InactiveCN104049158AArtificial short circuit to groundAvoid security risksElectrical testingOpen-circuit testMeasuring instrument
The invention relates to a single-phase instant artificial grounding short-circuit test system for a power transmission line, and belongs to the technical field of high-voltage test equipment and measuring. The single-phase instant artificial grounding short-circuit test system comprises metal downleads, a metal arc striking line, a current transformer, a measuring instrument and the like. The two metal downleads are connected with an overhead line of the power transmission line respectively, and a metal bar is fixed between the two metal downleads. A traction insulation rope is connected with a line collecting device, the other end of the traction insulation rope is connected with the metal arc striking line, the metal arc striking line is connected with a power transmission tower through a grounding connecting line, the grounding connecting line is laid on a metal plate, the current transformer is connected to the grounding connecting line in series and is laid on an insulating plate, and a secondary side is connected with the measuring instrument. The single-phase instant artificial grounding short-circuit test system has the advantages of being simple, convenient and good in safety, line collecting is conducted in a power-driven mode, and it is guaranteed that only instant artificial grounding short circuit can be made in the test without continuous failures, and safe operation of a power grid is not affected.
Owner:STATE GRID CORP OF CHINA +3
Engineering automation short circuit and/or open circuit test method
InactiveCN103777111AProtection securityLow test voltageElectrical testingControl powerOpen-circuit test
The invention relates to an engineering automation short circuit and / or open circuit test method which is applied to a short circuit and / or open circuit test device. The short circuit and / or open circuit test device comprises a micro-control processor and a power supply circuit connected with the micro-control processor. N I / O ports of the micro-control processor are used for being connected with N ports to be tested respectively. The engineering automation short circuit and / or open circuit test method provides a scheme which is easy to achieve, capable of being widely used for automatically detecting a PCB port and the short circuit and the open circuit of the PCB port, can satisfy the actual open circuit and short circuit conditions of various ports and circuits of the ports, and is low in test pressure, small in test current, capable of ensuring safety of the tested circuits, high in scanning speed, clear in result indication, and capable of conducting instruction input and output seamless joint control together with other test control power supplies.
Owner:SAMSUNG ELECTRONICS HUIZHOU CO LTD
Line open-short circuit tester
InactiveCN1831548AConvenient instructionsShort-circuit testingContinuity testingShort-circuit testOpen-circuit test
A tester of creel open circuit and short-circuit consists of DC power supply, open circuit indication lamp, short-circuit indication lamp, the first connection interface, the second connection interface and switch unit. It is featured as making all signal wire be series - connected when said tester is switched on, centralizing all odd number and all even number signal wires at two sides of short-circuit indication lamp separately, connecting the second pin to the fourth one when switch is on open circuit test, short-circuiting open circuit indication lamp and connecting the fourth pin to short-circuit indication lamp cathode when switch is on short-circuit test.
Owner:HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
Circuit test system and circuit test and protection method for direct-current traction power supply feeder unit
ActiveCN102496913ASimple structureImprove detection accuracyCurrent/voltage measurementEmergency protective circuit arrangementsOpen-circuit testContact network
The invention relates to a circuit test system and a circuit test and protection method for a direct-current (DC) traction power supply feeder unit, which are used for a city rail transit DC traction power supply system. The system comprises a quick circuit breaker Q00 and a microcomputer measurement and control protection device, wherein the quick circuit breaker Q00 is connected between a power supply network bus and a feeder and used for supplying power to a contact network or a contact rail; a circuit test contactor K05 is connected in parallel with the quick circuit breaker Q00 and connected in series with a circuit test resistor R05; and the microcomputer measurement and control protection device can receive and process bus voltage signals and feeder voltage signals from the bus side and the feeder side of the quick circuit breaker Q00. The system and the method have the advantages of simple circuit structure, high detection accuracy and low influence on equipment of a power supply network.
Owner:ZHENJIANG DAQO SECHERON TRACTION POWER
LVDS signal open-circuit and short-circuit detection device and open-circuit and short-circuit detection method
ActiveCN104034995AImplement open circuit testGraphical display test implementationElectrical testingShort-circuit testOpen-circuit test
The invention discloses an LVDS signal open-circuit and short-circuit detection device. According to the LVDS signal open-circuit and short-circuit detection device, an LVDS signal output end of a graph signal generator is connected with a signal input end of an LVDS driving module through an LVDS bus; a signal output end of the LVDS driving module is connected with a signal input end of a voltage backward flowing-prevention module through an LVDS bus; a signal output end of the voltage backward flowing-prevention is connected with a signal input end of a liquid crystal module set through an LVDS bus; a sampling signal input end of an analog-to-digital conversion module is connected into the LVDS bus connected with the signal input end of the voltage backward flowing-prevention module through a sampling-used LVDS bus; an IIC signal communication end of the graph signal generator is connected with one communication end of an IIC driving module; and the other communication end of the IIC driving module is connected with a sampling control end of the analog-to-digital conversion module. The LVDS signal open-circuit and short-circuit detection device of the invention can simultaneously perform graph display test, LVDS bus short-circuit test and LVDS bus open-circuit test.
Owner:WUHAN JINGCE ELECTRONICS GRP CO LTD
Ultralarge current battery short circuit test device
ActiveCN103698645AReduce contact resistanceAvoid arcingElectrical testingOpen-circuit testElectrical battery
The invention belongs to the technical field of evaluation devices for the safety performance of a battery, and particularly relates to an ultralarge current battery short circuit test device. In the technical scheme, a vacuum pump needs to be started for vacuumizing before a short circuit test, when vacuum degree collected by a data collecting and controlling module achieves the demands, a computer control module sends a switching value command to the data collecting and control module, and a power pump unit of a vacuum breaker starts or closes a short circuit board, wherein the vacuumizing operation is used for preventing the short circuit board from being oxidated during high-temperature contacting and for not increasing the contacting resistance, so the phenomena of oxidation, sparks and arc pulling during the disconnection existing under the aerobic environment in the prior art are avoided; besides, the copper short circuit is made to be sawtooth-shaped, conductive paste is smeared, so the contacting area and the contacting effect are increased; a short circuit resistor is arranged and an air cooling device is arranged, so stable temperature of the resistor in a loop is ensured and the stable resistance value in the loop is ensured.
Owner:CHINA NORTH VEHICLE RES INST
Method for obtaining single-phase double-winding transformer improved pi model considering iron core deep saturation features
ActiveCN108256196AImprove the simulation effectResistance/reactance/impedenceCAD circuit designShort-circuit testOpen-circuit test
The invention discloses a method for obtaining a single-phase double-winding transformer improved pi model considering iron core deep saturation features. The method includes the steps of determiningparameters of a transformer through an open-circuit test and a short-circuit test when the transformer works in a non-saturation area, conducting a deep saturation test when an iron core of the transformer works in a saturation area, exciting the iron core to enter a saturation state through an AC / DC hybrid power supply, testing the port apparent incremental inductance under different saturation degrees, calculating the saturation inductance of two excitation branches according to a pi model circuit structure, converting the saturation inductance into excitation curve data, describing the gradual change process of the iron core from initial saturation to deep saturation through the excitation curve data of the saturation section, and establishing the single-phase double-winding transformerimproved pi model considering the iron core deep saturation features according to the data. By means of the single-phase double-winding transformer improved pi model considering the iron core deep saturation features, a basic transformer model can be provided for EMTP type electromagnetic transient software, and the capacity of the model for simulating the transformer deep saturation physical phenomenon is improved.
Owner:CHONGQING UNIV
BIST-based open-circuit test method for TSVs in 3D SRAM
ActiveCN105203908AReduce Design ComplexityImprove test efficiencyElectrical testingTest efficiencyOpen-circuit test
The invention discloses a BIST-based open-circuit test method for TSVs in a 3D SRAM. The method comprises the steps that March elements of all TSV open-circuit faults are determined, test vectors containing the March elements corresponding to all the TSV open-circuit faults are generated; traversal read-write operation is conducted on all storage units of the 3D SRAM based on the test vectors through a BIST circuit; in the execution process of the March element corresponding to a certain TSV open-circuit fault, if the read result of a certain test address X is different from expected test data in the March element, it is judged that the TSV connected with the test address X has a fault, the TSV is marked with an error, and the type of the fault corresponding to the March element executed currently and the address of the fault of the TSV are recorded; after traversal read-write operation on all the storage units is completed, all TSV fault information is output. By means of the method, the purpose of detecting the TSV open-circuit faults can be achieved without using a special TSV test circuit and increasing extra area expenses; the method has the advantages that the complexity of circuit design is low, and test efficiency is high.
Owner:NAT UNIV OF DEFENSE TECH
Method and related apparatus for performing short and open circuit testing of ink jet printer head
InactiveUS7014290B2Detection problemNot to damageOther printing apparatusOpen-circuit testDriving circuit
Methods for detecting a short-circuit problem and an open-circuit problem in an ink jet printer. The ink jet printer includes at least an ink jet unit having an input end, a corresponding nozzle, and a control end. The ink jet printer further includes a driving circuit for providing energy to the ink jet unit via the input end. When the ink jet unit receives an ink jet signal via the control end, the ink jet unit can spray ink via the corresponding nozzle according to the energy received via the input end. The short-circuit problem detecting method includes stopping transmitting the ink jet signal to the control end of the ink jet unit, stopping providing energy to the input end of the ink jet unit, and measuring currents flowing through the input end of the ink jet unit.
Owner:BENQ CORP
Flexible circuit board touch screen substrate Open-Short test device and method
Owner:SHENZHEN YANMADE TECH CO LTD
PCB capable of detecting depth of back drilling hole and detection method
PendingCN111356290AHigh dimensional accuracyQuality assuranceElectric/magnetic depth measurementPrinted circuit manufactureShort-circuit testOpen-circuit test
The invention discloses a PCB capable of detecting the depth of a back drilling hole. The PCB is formed by overlapping L1, L2,..., LN layers of boards (N > 2) in sequence; the PCB is provided with test holes. The test holes are through holes; the test holes comprise two short-circuit test holes and two open-circuit test holes; each layer of plate is provided with a circuit; the two short-circuit test holes and the two open-circuit test holes respectively form a communication loop with the circuit; the PCB is provided with at least one through hole A except the test holes, copper is plated in the through hole A, a back drilling hole is formed in the at least one through hole A, and the through hole A is electrically connected with a circuit connected with the short-circuit test holes and acircuit connected with the open-circuit test holes respectively. The invention further provides a detection method capable of detecting the depth of the back drill hole, the size precision of the backdrill hole is improved, the quality of the PCB is ensured, and the quality of the back drill hole is well monitored through a power-on test method.
Owner:VICTORY GIANT TECH HUIZHOU CO LTD
No-load applied voltage test and protection method for DC ice-smelting device
InactiveCN101813729AGuaranteed uptimeConvenient and practical test methodOverhead installationTesting dielectric strengthOpen-circuit testEndurance capacity
The invention discloses a no-load applied voltage test and protection method for a DC ice-smelting device. The method comprises the following steps of: 1) connecting the DC ice-smelting device with an ice-smelting bus; 2) opening the circuit on the DC side, and turning on a power switch of the DC ice-smelting device; 3) setting a DC voltage reference value of the open circuit test of the circuit, sending a command for beginning the no-load applied voltage test out, performing linear change on the DC voltage at the preset speed, and maintaining a certain time; and 4) determining no abnormality, stopping the no-load applied voltage test, and locking a converter valve. Due to the adoption of the applied voltage test and protection method, the DC voltage endurance capacity of the converter valve, a DC side disconnecting link and the ice-smelting bus can be checked under the condition of not connecting the DC circuit, the triggering capacity of the converter valve is checked, the control function of the control and protection system is checked, and the DC ice-smelting device can be reliably operated when the ice needs to melt. The no-load applied voltage test and protection method for the DC ice-smelting device are convenient and practical.
Owner:ELECTRIC POWER RESEARCH INSTITUTE, CHINA SOUTHERN POWER GRID CO LTD
Semiconductor device test method and apparatus, and semiconductor device
ActiveUS20110298485A1High dielectric strengthLittle strengthSemiconductor/solid-state device testing/measurementResistance/reactance/impedenceForeign matterOpen-circuit test
A method of testing a semiconductor device includes a conductive foreign matter test step of measuring the resistance value between the first and second conductive patterns to determine whether conductive foreign matter is present between the first and second conductive patterns, a first open circuit test step of measuring the resistance value between two points on the first conductive pattern to determine whether there is an open circuit in the first conductive pattern, and a second open circuit test step of measuring the resistance value between two points on the second conductive pattern to determine whether there is an open circuit in the second conductive pattern. The measurement of the resistance value in each of the test steps is accomplished by pressing probes vertically against the first conductive pattern or the second conductive pattern or both.
Owner:MITSUBISHI ELECTRIC CORP
Electrical switching apparatus including a trip coil open circuit test circuit and system including the same
Owner:EATON INTELLIGENT POWER LTD
Method for realizing short-circuit test between pole lines of converter valve by using high-speed power electronic switch
ActiveCN105137212AAvoid accuracyAvoid security issuesElectrical testingOpen-circuit testElectronic switch
The invention provides a method for realizing short-circuit test between pole lines of a converter valve by using a high-speed power electronic switch. By using a high-speed power electronic switch to carry out breaking and closing in the operation process between the positive and negative electrodes at the direct-current side of a back-to-back converter valve, the duration of short-circuit current in a loop can be controlled accurately, and on-off of short-circuit current test between the positive and negative electrodes at the direct-current side of a flexible direct-current power transmission converter valve is realized. Under the condition that thyristor-level energy taking and synchronous pulse control are solved, the purpose of controlling the duration of short-circuit current in the loop in an efficient, reliable, large-capacity and accurate manner is achieved by using a thyristor assembly as a high-speed power electronic switch.
Owner:CHINA XD ELECTRIC CO LTD
Cable on-line detector
ActiveCN104991164AReduce workloadTo achieve the purpose of short circuit detectionFault locationShort-circuit testOpen-circuit test
The invention relates to a cable on-line detector. The cable on-line detector comprises a signal generator, a first cable accessing end A, a second cable accessing end B, an open-circuit test resistor R2, a short-circuit test resistor R2', a change-over switch K, a rectifier circuit, a comparator and an indicating circuit; and an output end of the signal generator is connected with the first cable accessing end A, the second cable accessing end B is connected with the indicating circuit through the rectifier circuit and the comparator, the open-circuit test resistor R2 and the short-circuit test resistor R2' are connected with the second cable accessing end B through the change-over switch K, and the signal generator, the open-circuit test resistor R2, the short-circuit test resistor R2' and the indicating circuit are grounded. The cable on-line detector is advantageous in that 1) the workload of equipment detachment during equipment testing or maintenance is reduced, 2) cable detection efficiency is improved, and 3) manufacturing cost is reduced.
Owner:CHINA ELECTRONICS TECH GRP NO 7 RES INST
Circuit short/open testing method of flexible circuit boards
InactiveCN103323734AImprove test accuracyImprove test efficiencyElectrical testingTest efficiencyOpen-circuit test
The invention provides a circuit short / open testing method of flexible circuit boards. The method comprises the following steps that a. a flexible circuit board without a short circuit / an open circuit is selected as a standard board, the inductance of a circuit to be tested is tested, a standard inductance value is obtained; b. a flexible circuit board with a short circuit / an open circuit is selected, an inductance changing threshold value is obtained; c. other flexible circuit boards to be tested are selected, and the inductance of circuits to be tested is tested, so that whether the circuits are short circuits / open circuits are judged. The method has the advantages that when a leading wire is a single wire and has multiple circles, if a short circuit exists between the circles, the short circuit can be tested. By testing the inductance value, the short circuit / the open circuit can be tested at one time, testing accuracy is high, and testing efficiency is high.
Owner:SHENZHEN ZHONGRUAN XINDA ELECTRONICS
Method for detecting electronic magnetic disc
InactiveCN1988043ADetermine damageComplete detectionError detection/correctionElectrical testingSpecific testShort-circuit test
This invention discloses a test method for electronic disks including: initializing a disk to set it in a processor system, then carrying out register test and formating it to prepare for reading and writing data, initializing specific test data then testing its data line, testing its open-circuit and short-circuit of the address line, formatting the disk to clear out the test data and quiting from the flow to finish the test.
Owner:ZTE CORP
Method for checking alignment accuracy of a thin film transistor
InactiveUS20120007628A1Test result is easily and speedily obtainedReduced measurement timeSemiconductor/solid-state device testing/measurementStatic indicating devicesOpen-circuit testEngineering
A method for checking alignment accuracy of a thin film transistor includes providing a substrate, forming a first conductive layer on the substrate, performing a first patterning process to form a gate electrode of a thin film transistor and a first terminal and a second terminal of a testing device, forming a first insulating layer covering the first terminal, the second terminal and the gate electrode on the substrate, forming a contact hole substantially corresponding to the first terminal and the second terminal in the first insulating layer, forming a pixel electrode and a connecting electrode of the testing device in the first contact hole, and performing a close / open circuit test. When the first terminal, the connecting electrode and the second terminal construct a close circuit, alignment accuracy is confirmed. When the first terminal, the connecting electrode and the second terminal construct an open circuit, alignment inaccuracy is confirmed.
Owner:CHUNGHWA PICTURE TUBES LTD
LED lamp driving power test method
ActiveCN104122506APrevent inflowReduce the cost of after-sales servicePower supply testingOpen-circuit testPower test
An embodiment of the invention discloses an LED lamp driving power test method. The LED lamp driving power test method comprises the steps of simulating various open circuit states of an LED driving power; conducting an open circuit test on the LED driving power; and passing the test if the performance of the driving power is detected to be normal under the various open circuit states. According to the invention, the LED lamp driving power test method can be used for testing whether the open states of the LED lamp driving power would result in damage to the driving power at before an LED lamp leaves the factory, unqualified LED lamps can be prevented from entering the market, and the after-sales service cost is reduced.
Owner:SHENZHEN OCEANS KING LIGHTING ENG CO LTD +1
Region screening method of alternating current short-circuit test
InactiveCN104849586ATaking into account the accuracyTaking into account efficiencyElectrical testingShort-circuit testOpen-circuit test
The present invention discloses a region screening method of an alternating current short-circuit test. The method comprises a step A of counting alternating current circuits connected with a target plant station and denoting a region formed by the alternating current circuits as a first test fault point region; a step B of calculating corresponding load busbar voltage data of the alternating current circuits in a short-circuit fault within the first test fault point region; a step C of judging if any satisfactory alternating current circuit region exists according to the load busbar voltage data; if not, adjusting an operating method of a near-region power grid and returning back to the step B; and if does, denoting the satisfactory alternating current circuit region as a second test fault point region; and a step D of judging again according to topographic and environmental information; if not, adjusting an operating method of a near-region power grid and returning back to the step B; and if does, determining the satisfactory region as an actual test fault point region. With adoption of the above technical scheme, a load low-pressure trip risk during the alternating current short-circuit test can be reduced, and normal power utilization at the user side is guaranteed.
Owner:ELECTRIC POWER RESEARCH INSTITUTE, CHINA SOUTHERN POWER GRID CO LTD
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