Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Method for detecting electronic magnetic disc

A test method and electronic technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve problems such as inability to use, no one-to-one correspondence, incomplete testing, etc., to achieve good detection results, and facilitate faults and elimination. glitch effect

Inactive Publication Date: 2007-06-27
ZTE CORP
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For memories such as FLASH, SDRAM, and RAM, there is a one-to-one correspondence between the memory space and the address; however, the electronic disk manufacturer integrates a file management system (TrueFFS) in the chip. A software interface is established, and the operating system reads and writes the internal space of the electronic disk indirectly through the file management system; generally, no matter how large the memory capacity of the electronic disk chip is, its external address space is only 8K, and this 8K space is completely mapped to the electronic disk. The internal controller of the disk, all access to the internal space of the electronic disk is realized through this controller, so there is no one-to-one correspondence between the address space of the electronic disk and the peripheral address lines
Therefore, the electronic disk test cannot use the traditional FLASH and SDRAM test methods, which is also the difficulty of the electronic disk test.
[0003] But, do not find any relevant patent of electronic disk testing aspect at home and abroad at present, the test to electronic disk usually is to utilize operating system to write file to electronic disk through the file management system inside electronic disk now, read out file again, will read out This method has the following disadvantages: it cannot effectively detect the welding defects of the data line of the electronic disk, and cannot locate the welding fault of the data line; because the electronic disk has the function of bad area management , cannot effectively detect whether the storage space of the electronic disk is good or bad; cannot effectively detect all address line breaks and short circuits; therefore, this test is incomplete

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for detecting electronic magnetic disc
  • Method for detecting electronic magnetic disc
  • Method for detecting electronic magnetic disc

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0039] The invention provides a testing method for an electronic disk to realize a complete test for the electronic disk on the premise that the existing testing method cannot effectively test the welding defects of the address line and the data line of the electronic disk.

[0040] At the beginning of the test, the electronic disk is initialized first, so that the electronic disk is connected to the processor system, and then the register test is performed on the electronic disk; if the test is successful, the electronic disk is formatted to prepare for reading and writing data; if the electronic disk is formatted successfully , then initialize the specific test data; then conduct the electronic disk data line test; if the test is successful, then conduct the electronic disk address line open circuit test; if the test is successful, then conduct the electronic disk address line short circuit test; after all the tests are completed, format the electronic disk , clear the test d...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

This invention discloses a test method for electronic disks including: initializing a disk to set it in a processor system, then carrying out register test and formating it to prepare for reading and writing data, initializing specific test data then testing its data line, testing its open-circuit and short-circuit of the address line, formatting the disk to clear out the test data and quiting from the flow to finish the test.

Description

technical field [0001] The invention relates to a method for detecting an electronic disk (DiskOnChip). In the field of production testing, faults such as open circuit and short circuit of the data line and address line of the electronic disk chip are detected by performing page erasing, reading and writing operations on the electronic disk. As well as the quality of the storage space of the chip itself, it provides a guarantee for improving the quality of the electronic circuit board production and delivery. Background technique [0002] Electronic disk is a storage device that has been widely used in mobile phones, industrial equipment, telecommunication equipment, and mobile memory cards. This storage device is different from general flash memory FLASH, random access memory SDRAM, and RAM. For memories such as FLASH, SDRAM, and RAM, there is a one-to-one correspondence between the memory space and the address; however, the electronic disk manufacturer integrates a file ma...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/00G01R31/00G06F11/00
Inventor 谭子求唐新平文海军
Owner ZTE CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products