Method for detecting electronic magnetic disc

Abstract

This invention discloses a test method for electronic disks including: initializing a disk to set it in a processor system, then carrying out register test and formating it to prepare for reading and writing data, initializing specific test data then testing its data line, testing its open-circuit and short-circuit of the address line, formatting the disk to clear out the test data and quiting from the flow to finish the test.

Description

technical field [0001] The invention relates to a method for detecting an electronic disk (DiskOnChip). In the field of production testing, faults such as open circuit and short circuit of the data line and address line of the electronic disk chip are detected by performing page erasing, reading and writing operations on the electronic disk. As well as the quality of the storage space of the chip itself, it provides a guarantee for improving the quality of the electronic circuit board production and delivery. Background technique [0002] Electronic disk is a storage device that has been widely used in mobile phones, industrial equipment, telecommunication equipment, and mobile memory cards. This storage device is different from general flash memory FLASH, random access memory SDRAM, and RAM. For memories such as FLASH, SDRAM, and RAM, there is a one-to-one correspondence between the memory space and the address; however, the electronic disk manufacturer integrates a file ma...

AI Technical Summary

Problems solved by technology

For memories such as FLASH, SDRAM, and RAM, there is a one-to-one correspondence between the memory space and the address; however, the electronic disk manufacturer integrates a file management system (TrueFFS) in the chip. A software interface is established, and the operating system reads and writes the internal space of the electronic disk indirectly through the file management system; generally, no matter how large the memory capacity of the electronic disk chip is, its external address space is only 8K, and this 8K space is completely mapped to the electronic disk. The internal controller of the disk, all access to the internal space of the electronic disk is realized through this controller, so there is no one-to-one correspondence between the address space of the electronic disk and the peripheral address lines

Therefore, the electronic disk test cannot use the traditional FLASH and SDRAM test methods, which is also the difficulty of the electronic disk test.

[0003] But, do not find any relevant patent of electronic disk testing aspect at home and abroad at present, the test to electronic disk usually is to utilize operating system to write file to electronic disk through the file management system inside electronic disk now, read out file again, will read out This method has the following disadvantages: it cannot effectively detect the welding defects of the data line of the electronic disk, and cannot locate the welding fault of the data line; because the electronic disk has the function of bad area management , cannot effectively detect whether the storage space of the electronic disk is good or bad; cannot effectively detect all address line breaks and short circuits; therefore, this test is incomplete

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