Engineering automation short circuit and/or open circuit test method

Abstract

The invention relates to an engineering automation short circuit and / or open circuit test method which is applied to a short circuit and / or open circuit test device. The short circuit and / or open circuit test device comprises a micro-control processor and a power supply circuit connected with the micro-control processor. N I / O ports of the micro-control processor are used for being connected with N ports to be tested respectively. The engineering automation short circuit and / or open circuit test method provides a scheme which is easy to achieve, capable of being widely used for automatically detecting a PCB port and the short circuit and the open circuit of the PCB port, can satisfy the actual open circuit and short circuit conditions of various ports and circuits of the ports, and is low in test pressure, small in test current, capable of ensuring safety of the tested circuits, high in scanning speed, clear in result indication, and capable of conducting instruction input and output seamless joint control together with other test control power supplies.

Description

technical field [0001] The invention relates to a test method, in particular to an engineering automation short circuit and / or open circuit test method. Background technique [0002] In the production process of electronic equipment, especially the production process of PCB boards, it is necessary to perform short circuit and / or open circuit tests on various pins and solder joints to ensure product quality. The current general practice is to use a multimeter for manual measurement or to purchase special equipment for testing. Using a multimeter for testing is inefficient and error-prone, and the special equipment purchased is generally limited in application. Patent application number 201210035239.3, the patent application name is "a line open circuit, short circuit detection device" Chinese invention patent application disclosed open circuit and short circuit test device circuit structure is simple, but its working voltage is as high as 8.5V-9.3V easy to cause damage to te...

AI Technical Summary

Problems solved by technology

Using a multimeter for testing is inefficient and error-prone, and the special equipment purchased is generally limited in application

Patent application number 201210035239.3, the patent application name is "a line open circuit, short circuit detection device" Chinese invention patent application disclosed open circuit and short circuit test device circuit structure is simple, but its working voltage is as high as 8.5V-9.3V easy to cause damage to test parts , and the operation is cumbersome, requiring operators to make records according to the signals of LED lights and buzzers, and the efficiency is low

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