The invention relates to a
high concentration superfine particle
measurement device and method based on a backward
photon correlation spectrum. An incident light path consists of a
laser, a pane mirror, a lens group, a pinhole aperture and a sample
cell. A receiving light path consists of a sample
cell, a lens group and a pinhole aperture. An acquisition and
processing unit of scattering signals consists of a
light detector, a digital correlator and a computer. The measurement steps include that firstly, the
laser is used as a
light source to irradiate the sample
cell filled with particles. Secondly, a
photomultiplier is used as a
light detector to continuously measure the scattering signals with a scattering angle of 180 degrees. Thirdly, the digital correlator is used to calculate pulse signals output by the
photomultiplier and an autocorrelation function, which are input into a computer. Fourthly, the computer works out the
diameter of a particle. The invention has the advantages of high precision,
fast speed and on-line measurement. Common optical elements are adopted in the light path part. Therefore, the cost of the device is greatly lowered and the device is easy to be maintained.