124 results about "Slit width" patented technology

A tuning fork-like terminal is accommodated in a terminal-containing section. The tuning fork-like terminal is provided on the central end with a slit adapted to receive a tab being connected. Clamping portions are projected from the opposed surfaces of the slit to pinch the tab between the clamping portions. A slit gage is inserted into a rectangular terminal hole formed in an end of the terminal-containing section to inspect a slit width between the clamping portions of the tuning fork-like terminal. A wide hole portion is formed in the rectangular terminal hole at the insertion position of the slit gage. The wide hole portion is formed by widening a length of a short side of the rectangular terminal hole. The central position of the slit in the tuning fork-like terminal and the central position of the slit gage coincide with each other, even if the tuning fork-like terminal is maximally shifted from the central position in the terminal-containing section, whereby the slit width can be precisely inspected to precisely inspect a slit width in a tuning fork-like terminal accommodated in a terminal-containing section of an electrical junction box.

This VSB lithography system includes a first, second and third aperture for forming a single electron beam in each of the rectangular opening portion that are provided, and draws a figure pattern using the single electron beam formed by passing the beam through the first, second and third aperture in sequence. Each of the first, second and third aperture has a mechanism for rotationally driving the aperture around an optical axis up to an arbitrary angle from 0 to 360°. Further, in the third aperture, a mechanism for varying the opening slit width of the rectangular opening portion is provided.

The invention discloses a Hadamard-transform near-infrared spectrograph added with a light harvesting structure, and relates to the field of Hadamard-transform near-infrared spectrographs. The spectrograph comprises a light source, the light harvesting structure consisting of a collimation lens and a cylindrical lens, a slit, a collimation lens, a plane grating, a DMD (digital micro mirror device), an imaging lens, a single-point detector, a static drive circuit and a spectral information acquisition and processing system. According to the Hadamard-transform near-infrared spectrograph, the light harvesting structure is added between an optical fiber and the slit, so that the energy utilization ratio of the system for light to be detected is improved greatly, and the detection for near-infrared spectrum is facilitated; appropriate slit width, grating incident angle and the like are selected, then the resolution ratio of the spectrograph is higher, simultaneously, the energy utilization ratio is higher, and the detection capacity of the spectrograph for a weak spectrum signal is improved; and a single-point photodiode is used to perform spectrum detection, accordingly, the spectrograph cost and the spectrograph size are reduced, and the detection sensitivity is improved.

The invention relates to a method for quickly identifying refuse landfill percolate in the sewage water discharged into a sewage treatment plant, in particular to a method for quickly judging whether percolate is illegally discharged into the sewage treatment plant. The method comprises the following steps: taking residual active sludge in the sewage treatment plant, then carrying out centrifugation on the residual active sludge so as to obtain a supernatant liquid; carrying out filtration on the supernatant liquid by a filter membrane (0.45 mu m) so as to remove suspended matters in the supernatant liquid to obtain a sample; taking a point every 2nm and then carrying out three-dimensional fluorescence spectrum survey on the sample so as to obtain a numerical three-dimensional fluorogram under the conditions that the excitation wavelength is 200 to 500nm, the emission wavelength is 250 to 600nm, the slit width is 5nm, and the scanning speed is 1200nm / min, wherein in case the fluorescence peak of the sample only refers to fulvic acid-lile substances (Ex / Em: 240 / 440nm) and humic acid-like substances (Ex / Em: 330 / 420 nm), but without protein-like substances, the numerical three-dimensional fluorogram shows that the refuse landfill percolate exists in the sewage water discharged into the sewage treatment plant, otherwise, the numerical three-dimensional fluorogram shows that no refuse landfill percolate exists in the sewage water discharged into the sewage treatment plant. The method of the invention has the advantages of simpleness, speediness, less required samples, high sensitivity, low cost, and capability of being widely applicable for quickly judging whether percolate is discharged into a sewage treatment plant.

The invention discloses a slit adjusting device capable of adjusting slit width in double directions, which relates to the technical field of optical precision machinery and solves the problems of complex mechanical structure, poor processing manufacturability, large size, assembly difficulty and high cost of the conventional device capable of adjusting the slit. The device comprises an adjusting screw, two slit blades, a belt main body base, an upper cover, guide vanes, a tension spring, a thrust bearing and a supporting plate. The symmetrically arranged guide vanes are adopted so as to ensure linear motion of the slit blades; the two blades are connected by adopting a thin steel wire going around a small pulley so as to ensure the symmetry of the two blades moving in opposite directions; and a pre-tightening force is applied to the two blades by adopting the tension spring so as to ensure the tension of the steel wire and eliminate crawl and backlash errors of a screw. The device has the advantages of easy processing and manufacture, low cost, capability of ensuring bidirectional adjustment, simple and convenient installation and large slit width adjusting range. The device is applicable in the precision machinery processing field.

The invention relates to a micro accurate slit arrangement with adjustable slit width for various spectrographic instruments, which solves the problems of the prior adjustable slit arrangement of complicated structure, low precision and large volume. The slit arrangement comprises an elastic hinge body, a left slit slice, a right slit slice and a driving mechanism and the clearance between the adjacent edges of the left slit slice and the right slit slice is slit; a middle junction rigid body is mounted on the top of the elastic hinge body and one end is connected with a left upper connection rod and another two ends are respectively connected with a left right-angle rigid body and a right right-angle rigid body; the left right-angle rigid body and the right right-angle rigid body are respectively connected with a left tie bar and a right tie bar; the left tie bar and the right tie bar are respectively connected with a left rigid body and a right rigid body; the left rigid body and the right rigid body are respectively connected with more than two left support bars and right support bars; the driving mechanism is a differential micro-meter screw and steps screwed holes mated with the differential micro-meter screws are vertically set on the frame basal-body top and the middle connection rigid body on the elastic hinge body; the parallelism and symmetry of the slit are good. The slit arrangement has features of simple structure, compactness, small size and high accuracy.

A tuning fork-like terminal is accommodated in a terminal-containing section. The tuning fork-like terminal is provided on the central end with a slit adapted to receive a tab being connected. Clamping portions are projected from the opposed surfaces of the slit to pinch the tab between the clamping portions. A slit gage is inserted into a rectangular terminal hole formed in an end of the terminal-containing section to inspect a slit width between the clamping portions of the tuning fork-like terminal. A wide hole portion is formed in the rectangular terminal hole at the insertion position of the slit gage. The wide hole portion is formed by widening a length of a short side of the rectangular terminal hole. The central position of the slit in the tuning fork-like terminal and the central position of the slit gage coincide with each other, even if the tuning fork-like terminal is maximally shifted from the central position in the terminal-containing section, whereby the slit width can be precisely inspected to precisely inspect a slit width in a tuning fork-like terminal accommodated in a terminal-containing section of an electrical junction box.

An optical measurement device capable of improving optical spectrum measurement accuracy without the need to structurally decrease a slit width. A diffraction grating for dispersing measurement light into respective different wavelengths is rotated in a given direction to produce diffracted light of selected wavelengths. A focusing lens converges the diffracted light to produce a converged beam. A slit control section varies the slit width at a constant scan speed to open or close the slit, thereby varying the passing bandwidth for the converged beam. A light receiving / measuring section receives the light passed through the slit, obtains a level function indicative of the power level of the received light that varies with change in optical frequency, and differentiates the level function by the scan speed to reproduce the spectrum profile of the measurement light.

A bandstop filter where variation in characteristics is suppressed to minimum and which realizes an increased production yield. The physical length of a line joint portion between a main line and an oscillator can be enlarged by providing an impedance non-continuous structure portion in a strip conductor of the oscillator. In comparison to the case where the impedance non-continuous structure portion is not provided, the width of a joint slit required to obtain an equal joint amount can be enlarged. When the joint slit width is enlarged, variation in filter characteristics caused by pattern accuracy can be reduced because of the enlarged joint slip width, thus improving a filter yield. This means that pattern accuracy requirement for production is loosened. Freedom in selecting a dielectric substrate is increased, which also provides an advantage that a filter can be produced using a less expensive dielectric substrate with not very high pattern accuracy.

The invention discloses a radar / infrared two-waveband frequency selective surface which solves the technical problems that a latticed metal mesh FSS in the prior art cannot further improve optical transmittance, the distribution of stray light is centralized, and the application in high-precision detection and imaging observation is not facilitated, and belongs to the technical field of electromagnetic shielding. The radar / infrared two-waveband FSS is a cross-hole-shaped periodic array on a metal mesh, the metal mesh is a round-hole-shaped metal mesh or a hexagonal metal mesh, the periods of cross hole shapes are the integer multiples of the period of the metal mesh, and each cross hole shape meets the two following constraint conditions that the slit width of the cross hole shapes is the integer multiples of the period of the metal mesh minus the wire width of the metal mesh; the difference between the slit length of the cross hole shapes and the slit width of the cross hole shapes is the even times of the period of the metal mesh. The radar / infrared two-waveband FSS is higher in optical transmittance, more even in diffraction light distribution and capable of effectively restraining the stray light.

A device and method for recording holographic gratings by the use of a single illuminating beam, two diffraction gratings, light detectors and a slit-scanning system. The beam illuminates two slits that then define two beams that are incident on the gratings. One diffracted order from one beam and one diffracted order from the other beam then interfere on a recording plane to produce sinusoidal variations of intensity. The interfering region may instantaneously be limited by a third slit. Also, another order of diffraction from one beam may be directed toward its own light detector and so is another order of diffraction from the other beam. These two detectors allow real time monitoring of the light intensity of each beam. By moving the slits in a direction parallel to the recording plane, an area larger than the slits' width can be exposed by the interfering pattern.

The invention discloses a computational spectral imaging device comprising a first imaging object lens, a collimating object lens, a semitransparent and semi-reflecting mirror, a dispersion element, a second imaging object lens, a reflecting type spatial light modulator, a third imaging object lens and a detector. The first imaging object lens, the collimating object lens, the semitransparent and semi-reflecting mirror and the dispersion element are arranged in turn in a manner of sharing an optical axis. The second imaging object lens and the reflecting type spatial light modulator are arranged in turn in a dispersion light direction. The third imaging object lens and the detector are arranged in the reflecting light path of the semitransparent and semi-reflecting mirror. All the optical elements are coaxial and equal in height relative to the base of the imaging device. Two-dimensional image information and one-dimensional spectral information including a complete detection scene can be acquired by the computational spectral imaging device in one time, while only one dimension of image information of the detection scene can be acquired by a conventional dispersion imaging spectrometer in one time. Imaging splicing is not required, spatial resolution is not limited by slit width and thus the computational spectral imaging device has the advantage of high spatial resolution.

An X-ray CT apparatus includes X-ray tubes, slit mechanisms which are respectively provided for X-ray tubes and whose slit widths can be changed, two-dimensional array type X-ray detectors which form pairs with the X-ray tubes, a support mechanism which supports the X-ray tubes and the X-ray detectors so as to allow them to rotate about a rotation axis parallel to the slice direction, a correction unit which corrects data from each detection element located in an area which X-rays passing through the slit mechanism directly strike, by using data from at least one detection element located outside the area and associated with the same channel in order to reduce a scattered radiation component originating from X-rays generated by an X-ray tube other than the X-ray tube forming the pair, and a reconstruction unit which reconstructs image data on the basis of the corrected data.

A gating device to delimit an x-ray beam, said gating device comprising a device housing, first and second absorber elements mounted in said device housing opposite each other, an adjustment device connected to said first and second absorber elements for moving said absorber elements relative to each other to set a spacing between said first and second absorber elements forming a slit for passage of an x-ray beam therethrough, each of said absorber elements having an absorber element edge shaped to give said slit a slit width that varies in a longitudinal direction of the slit, said slit width increasing outwardly, from a central position, toward respectively opposite ends of said slit, each slit edge, in said longitudinal direction of said slit, having a middle region producing a uniform width of said slit and, further regions respectively disposed on opposite sides of said middle region that produce a linearly increasing slit width in said longitudinal direction of said slit, and said adjustment device producing a parallelogram-like relative movement between said absorber elements.

The invention discloses a preparation method of a micro-fracture rock core model. The method comprises steps of: a. selecting a rock core sample; b. splitting the selected rock core along the axis into two rock samples, and maintaining the rock core split surface with a certain roughness; c. arranging at least two supports for supporting the width of the crack on a section of one of the rock samples; d. placing the second rock sample on the section on the section of the support so that the two rock samples are connected to each other according to the original section; and e. jointing, sealingand fixing the joint of the produced model by an adhesive, and integrally jointing and fixing the whole model to obtain the micro-crack rock core model. The micro-fracture rock core model of the invention can have a slit width of 20 to 500 [mu]m and a rough section, better simulates the micro-fracture morphology of the real stratum relative to the smooth iron core section, and can be reused.

Disclosed is a slit width adjusting device comprising: a pair of slit members parallel to each other, which is moved to approach each other or to be separated from each other to adjust a slit width; a driving section to move the pair of slit members; an absolute position original point detection section to detect an arbitrary absolute position of the slit members as an original point; and an adjustment section to adjust the slit width, wherein the adjustment section comprises: a storage unit to store a slit width table in which a displacement amount of the slit width from the original point, and a drive instruction value corresponding to the displacement amount, are corresponding to each other; and a drive control unit to extract the drive instruction value corresponding to a specified slit width, to drive the driving section according to the extracted drive instruction value.

The invention relates to an electronic dynamic control and chemical auxiliary corrosion-based machining method for an oval microlens, which belongs to the technical field of application of functionality surfaces. The method comprises the following steps: adjusting a light path of a femtosecond laser system, and ensuring that laser can be vertically incident to a material surface to be machined which is horizontally placed; placing a slit in a position where the light path passes by, adjusting the position of the slit, adjusting a width of the slit to a required size, and ensuring that the laser vertically passes by a center of the slit; performing imaging by means of an imaging CCD and a lighting white light source, observing a surface topography and a machining process of the machined material, matching turning on and off of a mechanical switch, and performing machining of a certain region and a certain interval on the material surface to be machined; and immersing a sample with an overall modified region into an etching solution of certain concentration for etching. Compared with the prior art, the invention provides a simple, controllable and efficient machining method for efficient and high-quality preparation of the oval lens.

This VSB lithography system includes a first, second and third aperture for forming a single electron beam in each of the rectangular opening portion that are provided, and draws a figure pattern using the single electron beam formed by passing the beam through the first, second and third aperture in sequence. Each of the first, second and third aperture has a mechanism for rotationally driving the aperture around an optical axis up to an arbitrary angle from 0 to 360°. Further, in the third aperture, a mechanism for varying the opening slit width of the rectangular opening portion is provided.

The invention relates to an experimental device for measuring Young modulus by using single slit diffraction. The experimental device comprises a transverse beam arranged on a first bracket, wherein the lower side surface of the transverse beam is hinged with a suspension beam; the lower side at one side of the suspension beam is connected with a test sample by virtue of a tension meter; the experimental device also comprises a blade bearing connected to a second bracket in an adjustable manner; a first blade and a second blade which correspond to each other are arranged in the blade bearing; a slit is formed between cutting edges of the first blade and the second blade; an ejector rod is movably connected to the transverse beam which corresponds to the upper side of a pressing rod; the ejector rod is in pressing fit with the suspension beam; and the device is provided with a laser and a white screen used for receiving laser light emitted by the laser. The experimental device disclosed by the invention has the advantages that a lever principle is adopted, the slit distance between the cutting edges of the first blade and the second blade is adjusted, tension is read on the tension meter, the variation of the slit width is obtained according to the relation between the spacing among single slit diffraction fringes and the slit width, the Young modulus is further calculated, and the small change length is measured by adopting a single slit diffraction method, so that the actual measurement accuracy is improved, and the experimental error is reduced.

The invention relates to a cotton-picking spindle, and belongs to the technical field of cotton-picking machines. The cotton-picking spindle mainly solves the problem in a current cotton-picking spindle that the impurity content in picked cotton is increased. The cotton-picking spindle is mainly characterized in that a cotton-picking part is provided with at least one continuous spiral groove along the axial direction and a threaded protrusion, the position in the spiral groove and / or the side wall of the threaded protrusion are provided with hook teeth, and the hook teeth do not rise above the threaded protrusion where the hook teeth are located; the threaded protrusion is continuous, or at least a small part of the slit width of top face of the threaded protrusion is lesser than 1.5 mm; the rotation direction of the threaded protrusion is the same as the rotation direction of the spindle when cotton-picking is carried out. The cotton-picking spindle is mainly used for cotton picking, when the spindle is in contact with hard objects such as cotton branches, cotton bolls or cotton stalks, the piercing depth of the hook teeth is limited by the threaded protrusion, the probability for picking impurities by the spindle is lowered, when the spindle is in contact with the soft and fluffy cotton, the spindle rotates to hook the cotton and winds the cotton onto the spindle-self so that the cotton can be picked off from the cotton bolls, and therefore the impurity content in the picked cotton is greatly lowered.

An array light source for a pericoel high-power semiconductor laser is provided, which utilizes a collimating mirror to conduct collimation to a fast axis, utilizes two convex-plane cylindrical mirrors to conduct collimation to a slow axis, the light of the collimated fast axis is divided into two roads for propagation, a cylindrical reflector and a raster are separately utilized to conduct feedback to the two roads of light, thereby realizing laser output of lightness and narrow line width of semiconductor laser array. The rectangular convex-plane cylindrical mirrors and the cylindrical reflector are relatively easy to be assembled with the semiconductor laser array. In addition, the laser output brightness can be adjusted through adjusting rectangular slit width, and the output laser power can be adjusted through rotating the half-wave plate.

Disclosed is an X-ray apparatus having an X-ray source, an X-ray detector, a divergence slit, and a scattering slit. The incident angle θ of X-ray to be irradiated on a sample is changed at a predetermined angular speed at measurement time and diffracted X-ray detection angle 2θ at which the X-ray detector detects X-ray is changed in the opposite direction to the θ-direction at an angular speed double that of the X-ray incident angle θ. The slit width of the divergence slit is changed such that the X-ray irradiation width always coincides with the sample width while the slit width of the scattering slit is retained at a constant value. The width of X-ray received by the X-ray detector is restricted by the narrower one of the divergence slit and the scattering slit. The resolution in the high angle region can be kept at a high level.

A variable-angle single slit diffraction experiment instrument belongs to the field of university physics teaching experiment instruments. The variable-angle single slit diffraction experiment instrument mainly comprises a variable-angle slit, a screen and a laser pointer. The variable-angle single slit diffraction experiment instrument is characterized in that: the variable-angle slit is composed of two like straight cylindrical posts and sheet irons, the surfaces of the straight cylindrical posts are smooth, the straight cylindrical posts do not transmit light, one end of one straight cylindrical post and one end of the other straight cylindrical post lean against each other, the sheet irons are respectively fixed on the other ends of the straight cylindrical posts, and the variable-angle slit is vertically fixed on a horizontal flat iron plate by a strip-shaped magnet; the screen is vertically fixed on one end of the horizontal flat iron plate, the laser pointer is attracted on a strip-shaped straight steel pole vertically fixed on the other end of the horizontal flat iron plate by a magnet, and moreover, the light emitted by the laser pointer can be projected to the center of the screen via the variable-angle slit. The characteristics of the patent are as follows: different from the prior art, the variable-angle single slit diffraction experiment instrument realizes the phenomenon that the diffraction angles of diffraction fringes of the same order can be decreased under the same slit as the slit width is increased, the design is ingenious, the variable-angle single slit diffraction experiment instrument is extremely easy to fabricate, the effect is obvious, and more educational functions can be added when the variable-angle single slit diffraction experiment instrument is popularized in teaching.