68 results about "NAND logic" patented technology

A single clock driven shift register comprising multiple stages is provided. The (M)th stage comprises a latch unit, a logic unit, and a non-overlap buffer. The latch unit latches an input signal from the (M−1)th stage according to a clock signal. The logic unit connecting to an output terminal of the latch unit deals with an output signal of the latch unit and the clock signal with an NAND logic calculation. The non-overlap buffer connecting to the output terminal of the logic unit comprises at least three inverters connected in a serial, and an output signal of the first inverter coupled to the output terminal of the logic unit is input to an latch unit of the (M+1)th stage. Meanwhile, an output signal of the non-overlap buffer of the (M−1)th stage is input to the non-overlap buffer or the logic unit to delay the output signal of the non-overlap buffer.

The invention discloses a glitch-eliminating programmable counter, which comprises an asynchronous counter main body circuit, a programmable logic circuit, an reset pulse generation circuit and a counter output generation circuit, wherein the asynchronous counter main body circuit is provided with N-bit frequency division output end (Q0...QN-1), a programmable input end P and a trigger D; the programmable logic circuit is divided into a programmable part and a non-programmable part, the programmable part adopts a NAND logic, while the non-programmable part adopts a NOR logic; the reset pulse generation circuit is provided with two input ends R0 and S0 and three output ends; and the counter output generation circuit is provided with two input ends R1 and S1 and one outlet end. The glitch-eliminating programmable counter has the characteristics of simple design, novel circuit structure, high glitch-eliminating capability, easy realization and the like.

A fully differential phase and frequency detector utilizes a multi-function differential logic gate to implement a differential AND gate operation and provides a fully differential D-flip-flop. The multi-function differential logic gate has four inputs, which can be grouped into two pairs of true and complement signals. By selectively re-assigning the inputs to different signal pairs, the differential logic gate can be made to provide one of either simultaneous AND / NAND logic operations or simultaneous OR / NOR logic operations. The differential D-flip-flop is implemented following a master / slave configuration and is response to the true and complement forms of an input clock signal, an input reset input, and input data signal, and also provides true and complement forms of an output signal. All components within the phase and frequency detector are exemplified in CML circuit configuration.

The embodiments of the invention disclose a chip and a detection method thereof. The chip includes a substrate, at least one laser detection circuit, and multiple key circuit modules. The laser detection circuit includes laser detection units, a NAND logic unit, and an AND logic unit. Each laser detection unit includes a monitoring diode and a first charging transistor; the anode of the monitoring diode is grounded; the input end of the first charging transistor is electrically connected with a power supply; and the cathode of the monitoring diode and the output end of the first charging transistor are electrically connected and serve as the output end of the laser detection unit. Each input end of the NAND logic unit is electrically connected with the output end of one laser detection unit, a first input end of the AND logic unit is electrically connected with the output end of the NAND logic unit, and a second input end of the AND logic unit receives an enable signal. Each key circuit module is set adjacent to at least one laser detection unit. Through the implementation of the embodiments of the invention, the accuracy of laser detection is improved, and missing detection is avoided.

The dual-modulus prescaler circuit (1) is devised to operate at a very high frequency. This circuit includes an assembly formed of two dynamic D-type flip flops (12, 13), and two NAND logic gates (15, 16) arranged in negative feedback between the two flip flops. The two flip flops are clocked by an input clock signal (CK) to supply a divided output signal (OUT) whose frequency matches the input clock frequency divided by 2 or by 3 as a function of a division mode selection signal (divb) applied to the input of the first NAND logic gate (15). One non-inverted output of the second flip flop is connected to one input of the first flip flop (12). The first dynamic flip flop includes three active branches and supplies a single inverted output signal. A third flip flop (14) with three active branches receives an inverted mode selection signal (div) at input in order to supply the mode selection signal to the inverted output thereof, clocked by the non-inverted output signal of the second flip flop.

A method and apparatus are provided for implementing subthreshold leakage current reduction in limited switch dynamic logic (LSDL). A limited switch dynamic logic circuit includes a cross-coupled NAND and inverter logic. A dynamic node provides a first input to the NAND. A sleep signal provides a second input to the NAND. An output of the NAND provides an input to the inverter logic that inverts the NAND output and provides a complementary output. The NAND logic includes a series connected first sleep transistor receiving the sleep input. The first sleep transistor is turned OFF during the sleep mode. A second sleep transistor is connected between a voltage supply rail and the NAND output. The second sleep transistor is turned ON during the sleep mode to force high the NAND output and force low complementary output.

The present invention provides a PLA architecture where the AND plane is implemented with NAND logic. The OR plane may be implemented with various logic, but in one embodiment, the OR plane is implemented with NOR logic. The AND plane may have multiple sequential stages providing hierarchical NAND logic. The NAND logic may be broken into a hierarchy of NAND logic blocks. Each NAND logic block may include one or more series-connected NAND transistor stacks. Each transistor in the transistor stack may receive an input signal representing the product of a PLA clock signal and either a direct PLA input or the complement thereof. As such, the PLA clock is inherently integrated with the input signals that drive the various transistors of the NAND transistor stacks.

A fully differential phase and frequency detector utilizes a multi-function differential logic gate to implement a differential AND gate operation and provides a fully differential D-flip-flop. The multi-function differential logic gate has four inputs, which can be grouped into two pairs of true and complement signals. By selectively re-assigning the inputs to different signal pairs, the differential logic gate can be made to provide one of either simultaneous AND / NAND logic operations or simultaneous OR / NOR logic operations. The differential D-flip-flop is implemented following a master / slave configuration and is response to the true and complement forms of an input clock signal, an input reset input, and input data signal, and also provides true and complement forms of an output signal. All components within the phase and frequency detector are exemplified in CML circuit configuration.

A method and apparatus are provided for implementing subthreshold leakage current reduction in limited switch dynamic logic (LSDL). A limited switch dynamic logic circuit includes a cross-coupled NAND and inverter logic. A dynamic node provides a first input to the NAND. A sleep signal provides a second input to the NAND. An output of the NAND provides an input to the inverter logic that inverts the NAND output and provides a complementary output. The NAND logic includes a series connected first sleep transistor receiving the sleep input. The first sleep transistor is turned OFF during the sleep mode. A second sleep transistor is connected between a voltage supply rail and the NAND output. The second sleep transistor is turned ON during the sleep mode to force high the NAND output and force low complementary output.

The invention discloses a no bridge type power factor corrector with logical control, comprising a high frequency switch controller, a boosting inductor, a filter capacitor, two boosting transistor assemblies, two boosting diodes, two line voltage polarity detectors and two low frequency switch drivers. The two line voltage polarity detectors control the two low frequency switch drivers by signal coupling (optical coupling, magnetic coupling and the like), and the two line voltage polarity detectors and the high frequency switch controller drive the two boosting transistor assemblies by a control logic (or logic, nand logic and the like), so that the boosting inductor can release the stored energy by virtue of the channel of the two boosting transistor assemblies, intrinsic-barrier diode conduction loss can be reduced, and efficiency is improved.

Logic gates using Schmitt trigger circuits are provided. An AND gate using the Schmitt trigger circuit includes: a NAND gate configured to receive two input signals, perform a NAND logic operation, and output a first output signal; and a DTMOS inverter configured to invert the first output signal, and output the inverted first output signal as a second output signal, and a threshold voltage of the NAND gate is controlled using the second output signal. A OR gate using the Schmitt trigger circuit includes: a NOR gate configured to receive two input signals, perform a NOR logic operation, and output a first output signal; and a DTMOS inverter configured to invert the first output signal, and output the inverted first output signal as a second output signal, and a threshold voltage of the NOR gate is controlled using the second output signal.

The invention discloses a universal linear optical all-optical logic gate and an implement method thereof. According to the universal linear optical all-optical logic gate, a first logic input port, asecond logic input port and an invariant input port are adopted and connected to a main waveguide through first to third waveguides respectively, the main waveguide is connected to an output port, and therefore an all-optical logic gate structure is formed; the light intensity of first excitation light, the light intensity of second excitation light and the light intensity of third excitation light are adjusted separately, the phase difference from the first excitation light to the third excitation light is adjusted, optical-field complex amplitude which is contributed by the first and secondlogic input ports and the invariant input port to the output port is controlled, and therefore seven kinds of different linear optical all-optical logic gates are achieved on the single all-optical logic gate structure; regarding OR-logic gates, NOT-logic gates, XOR-logic gates, XNOR-logic gates and NAND-logic gates, under the two conditions that the output sates of the linear optical all-opticallogic gates are logic '1' and logic '0', theoretically, the maximum output signal beam intensity ratio is infinity.

The invention provides a pixel test circuit for an AMOLED. The pixel test circuit comprises a pixel driving module and a NAND logic circuit module. A pixel driving circuit is connected with the power supply end, the data signal end, the current scanning signal end, the front row scanning signal end, the preset voltage end, the light-emitting control signal input end and the output end. Signals of the light-emitting control signal input end of the pixel driving module and signals of a current scanning signal input end serve as input signals of the NAND logic circuit module, and the output end of the NAND logic circuit module is connected with the front row scanning signal input end of the pixel driving module. According to the pixel test circuit for the AMOLED, when a TEG measuring machine table is utilized to perform measurement, the signals of the front row scanning signal input end do not need measuring, and accordingly the number of independent probes needed for measurement is reduced.

The invention provides a DC motor driving circuit. The DC motor driving circuit comprises an H bridge circuit of which an output end is connected with a first motor and a second motor, the H bridge circuit is used for controlling the first motor and the second motor for positive rotation, negative rotation and braking; an NAND logic circuit used for controlling conduction or closing of an H bridge of the H bridge circuit, an optical coupler isolation circuit used for isolating a single-chip microcomputer control circuit from the H bridge circuit to guarantee stability of the single-chip microcomputer control circuit; and a power source circuit used for converting a high voltage into a low voltage for supply for the optical coupler isolation circuit, the NAND logic circuit and the H bridge circuit. The DC motor driving circuit is advantaged in that a sink current driving mode is utilized, direct driving of most of single-chip microcomputers is supported, the large power tube H bridge principle is employed to control positive rotation, negative rotation and braking of the motors, moreover, rotation speeds of two DC motors can be further adjusted, photoelectric isolation is employed, stability of the single-chip microcomputer control circuit is guaranteed, a driving problem of a large power DC motor is solved, and the DC motor is enabled to realize safe, stable and high-efficiency operation in various occasions.

A timing margin circuit of a local clock buffer circuit may include an inverter logic gate having an inverter input and an inverter output, whereby the inverter input receives an input clock signal. A NAND logic gate includes a first NAND input coupled to the inverter output, a second NAND input, and a NAND output. The circuit also includes a logic device having a first logic device input that is coupled to the inverter output, a second logic device input that receives a mode selection signal, and a logic device output that couples to the second NAND input, whereby the NAND logic gate generates a first time delayed input clock signal and a second time delayed input clock signal, such that the first and the second time delayed input clock signal control a falling edge transition of a local clock signal derived from the input clock signal.

The invention discloses a silicon-based electro-optic logic AND / NAND gate. The silicon-based electro-optic logic AND / NAND gate comprises a first 2*2MZI type electro-optic switch, a second 2*2MZI type electro-optic switch and a 2*1MMI coupler. Each of the first and second 2*2MZI type electro-optic switches comprises a first input end, a second input end, a first output end and a second output end, and the 2*1MMI coupler comprises a first input end, a second input and an output end. The first output end of the first 2*2MZI type electro-optic switch is connected with the first input end of the second 2*2MZI type electro-optic switch, and the first output end of the second 2*2MZI type electro-optic switch is an AND logic output end. The second output end of the second 2*2MZI type electro-optic switch is connected with the first input end of the 2*1MMI coupler, the second output end of the first 2*2MZI type electro-optic switch is connected with the second input end of the 2*1MMI coupler, and the output end of the 2*1MMI coupler is an NAND logic output end. The silicon-based electro-optic logic AND / NAND gate has the advantages of high extinction ratio, high speed, large broadband and large fabrication tolerance.

The invention discloses an IGBT driver interlock circuit with a power-on time delay function, including a time delay circuit module 1, an NAND logic circuit module, a plurality of resistors 3s, an inverting drive 4 which are successively connected; the NAND logic circuit module includes a plurality of NAND logic circuit groups composed of an upper pipe and a lower pipe. According to the invention, a drive signal which is sent by a Digital Signal Processor (DSP) chip is subject to a certain time delay, and then is output to a drive board for driving an IGBT module so as to enable the IGBT to have a reliable turn-off within the time period. The circuit is also provided with an interlock circuit, and constitutes a logic relationship with an NAND gate chip such that once one signal turns to be a high level signal, another signal will be a low level signal,thereby guaranteeing the upper and lower pipes of the IGBT are not powered on at the same time and preventing short circuit breakdown of the IGBT. The IGBT driver interlock circuit with the power-on time delay function precludes the short circuit breakdown of the IGBT, effectively protects the bridge arm of the IGBT, and increases the reliability of the IGBT driver circuit.

The invention discloses a level triggered D flip-flop circuit based on a resistive memory. The level triggered D flip-flop circuit comprises an MOSFET, a first memristor, a resistor, a first phase inverter and a second phase inverter. The source electrode of the MOSFET is electrically connected with an input signal; the grid electrode of the MOSFET is electrically connected with a clock pulse signal; the drain electrode of the MOSFET is electrically connected to the positive electrode of the first memristor, one end of the resistor and the input end of the first inverter. The output end of thefirst phase inverter is electrically connected to the input end of the second phase inverter; the output end of the second phase inverter is electrically connected with an output signal; the negativeelectrode of the first memristor is electrically connected to the output end of the NAND logic circuit used for conducting auxiliary setting on the first memristor, one input end of the NAND logic circuit is electrically connected with an input signal, the other input end of the NAND logic circuit is electrically connected with a clock pulse signal, and the other end of the resistor is grounded.According to the invention, the structure of the circuit is simpler and more refined, and the layout area has greater advantages.

A thermal electric (TE) binary NAND gate logic circuit is provided with a method for NAND logic gating. The method accepts a first input voltage representing an input binary logic state and generates a first thermal electric (TE) temperature in response to the first input voltage. A second input voltage is accepted representing an input binary logic state, and a second TE temperature is generated in response to the second input voltage. In response to the first and second TE temperatures, a NAND logic state output voltage is generated. More explicitly, a first control voltage is generated in response to the first TE temperature, and a second control voltage is generated in response to the second TE temperature. Then, a third TE temperature is generated in response to the first and second control voltages, which in turn generates the output voltage.

The invention provides a scan driving circuit for an oxide semiconductor thin film transistor and a NAND logic operation circuit thereof. The NAND logic operation circuit includes: a first inverter and a second inverter applied to a pull-down holding circuit of a GOA circuit, and multiple transistors. The invention uses the combination of NFTF and inverter to replace a function of original PMOS elements and thereby achieves characteristics similar to that of the original CMOS NAND operation circuit. Accordingly, the invention can solve the design problem of IGZO TFT single type of device logic operation circuit and thus is more suitable for integrating a large scale digital integrated circuit on a liquid crystal display device.

A thermal electric (TE) binary NAND gate logic circuit is provided with a method for NAND logic gating. The method accepts a first input voltage representing an input binary logic state and generates a first thermal electric (TE) temperature in response to the first input voltage. A second input voltage is accepted representing an input binary logic state, and a second TE temperature is generated in response to the second input voltage. In response to the first and second TE temperatures, a NAND logic state output voltage is generated. More explicitly, a first control voltage is generated in response to the first TE temperature, and a second control voltage is generated in response to the second TE temperature. Then, a third TE temperature is generated in response to the first and second control voltages, which in turn generates the output voltage.

A fully differential phase and frequency detector utilizes a multi-function differential logic gate to implement a differential AND gate operation and provides a fully differential D-flip-flop. The multi-function differential logic gate has four inputs, which can be grouped into two pairs of true and complement signals. By selectively re-assigning the inputs to different signal pairs, the differential logic gate can be made to provide one of either simultaneous AND / NAND logic operations or simultaneous OR / NOR logic operations. The differential D-flip-flop is implemented following a master / slave configuration and is response to the true and complement forms of an input clock signal, an input reset input, and input data signal, and also provides true and complement forms of an output signal. All components within the phase and frequency detector are exemplified in CML circuit configuration.

The invention discloses an AND logic gate and an NAND logic gate based on magnetic skyrmion. The magnetic skyrmion is placed in the annular magnetic racing track. A voltage driving mode is adopted toenable the skyrmion to circularly move in the magnetic racing track, and the state of the skyrmion in the magnetic racing track is read through the magnetic tunnel junction, so that the logic functions of the AND gate and the NAND gate are realized, and the stability of the NOT gate based on the skyrmion and the AND gate in use is ensured.