516results about "Counting chain synchronous pulse counters" patented technology

A circuit for adding or subtracting an amount of charge from a charge sample, such as in a Charge Coupled Device (CCD), by portioning and pipelining the processing stages, to avoid introducing a memory effect. The operation, such as subtraction, is split into multiple stages, with each stage responsible for removing only a portion of the total amount of charge that is desired to be removed. The subtraction pipeline stages operate together to remove the total desired charge amount. In one embodiment each successive subtraction stage removes a corresponding lesser amount of charge. As a result, greater accuracy in the amount of charge removed is achieved as well operation at higher frequencies than previous charge subtraction approaches.

A shift register has a plurality of stages which output driving signals, each stage including a pull-up transistor to output a first clock signal in response to a logic value of a Q node; a pull-down transistor to supply a voltage from a first voltage supply source to the output in response to a logic value of a Qb node; a Q node controller to control the logic value of the Q node in response to any one of the previous stage's output signal and the next stage's output signal; and a Qb node controller to control the logic value of the Qb node to alternate repeatedly between low and high by use of at least one of a second clock signal, a third clock signal and the logic value of the Q node when the output signal is in a low state.

Cross-channel interference can be a problem in multi-channel switched power systems. A multi-channel switched power converter is provided a reference count generator that generates a reference count signal that is commonly distributed to multiple, pulse width modulating (PWM) channels of the converter. The common reference count signal counts through a sequence of successive timing values. Events in each channel are scheduled relative to the common reference count. Examples of such events include the amplification or de-application of a driving voltage pulse to an inductive means of the channel and the taking of voltage and current measurement samples. Cross channel interference is avoided or minimized by scheduling or re-scheduling events in each active channel so that they do not occur simultaneously in potentially-interfering channels, for example the taking of a current measurement sample in one channel and the turning on of an inductance-driving voltage pulse is a second channel.

An asynchronous counter that is capable of switching count mode includes flip-flops, and three-input single-output tri-value switches respectively provided between the adjacent pairs of the flip-flops. The tri-value switches switch among three values, namely, non-inverting outputs and inverting outputs of the flip-flops and a power supply level. Each of the tri-value switches switch among the three input signals according to two-bit control signals, and input a selected signal to a clock terminal of a subsequent flip-flop. When count mode is switched according to the control signals, a count value immediately before the mode switching is set as an initial value, and counting after the mode switching is started from the initial value.

Described is a compact, lower power gated ring oscillator time-to-digital converter that achieves first order noise shaping of quantization noise using a digital implementation. The gated ring oscillator time-to-digital converter includes a plurality of delay stages configured to enable propagation of a transitioning signal through the delay stages during an enabled state and configured to inhibit propagation of the transitioning signal through the delay stages during a disabled state. Delay stages are interconnected to allow sustained transitions to propagate through the delay stages during the enabled state and to preserve a state of the gated ring oscillator time-to-digital converter during the disabled state. The state represents a time resolution that is finer than the delay of at least one of the delay stages. A measurement module determines the number of transitions of the delay stages.

A shift register minimizing bias stress applied to transistors is disclosed. A shift register including n stages outputting scan pluses that are sequentially delayed in a forward or reverse direction thereof, where n is positive integer and wherein each stage includes: a scan direction controller that provides a first or second voltage to a scan direction control node according to a first or second enable signal and controlling the forward or reverse direction output; a first node controller that controls a first node according to a voltage on the scan direction control node; a second node controller that controls a second node according to the voltage on the scan direction control node and a voltage on the first node; an output unit that outputs a clock signal as scan pulse according to voltages on the first and second nodes; a third node controller that provides one of the first and second voltages to a third node according to the first and second enable signals; a first discharge circuit unit that discharges the voltage on the first node according to voltages of the second and third nodes; and a second discharge circuit unit that discharges the voltage on the third node according to one of a third enable signal and a fourth enable signal.

Circuits for measuring TOF between two electrical signals comprises 1) a slow TAF-DPS clock signal generator for generating a slow clock signal, a fast TAF-DPS clock signal generator for generating a fast clock signal, said slow TAF-DPS clock signal generator comprises a gated ring oscillator and a TAF-DPS frequency synthesizer, said fast TAF-DPS clock signal generator comprises a gated ring oscillator and a TAF-DPS frequency synthesizer; 2) a phase detector for receiving said slow and fast clock signals and detecting point-of-coincidence between said slow and fast clock signals; 3) a first digital counter driven by said slow clock signal for storing the number of slow clock cycles and a second digital counter driven by said fast clock signal for storing the number of fast clock cycles; 4) a calibrator for calibrating said gate ring oscillators; 5) a calculation block for calculating TOF measurement result. Methods of using a slow TAF-DPS clock generator and a fast TAF-DPS clock generator for measuring TOF between two electrical signals are also disclosed.

An embodiment of the invention is a circuit for adaptive phase noise cancellation for a fractional-N PLL. A preferred embodiment employs a split loop filter architecture. Two loop filter halves separately drive half-sized parallel varactors in a voltage controlled oscillator (VCO) and also drive a differential-input lowpass frequency selective circuit, e.g., a differential-input integrator in a least mean squared (LMS) feedback loop. The output of the differential-input lowpass frequency selective circuit controls the gain matching of a phase noise cancellation path to minimize phase noise arising from quantization error associated with the sequence of divider modulus values in the fractional-N PLL. The two varactor capacitances add together in the VCO tank, so the VCO frequency depends on the common-mode loop filter voltage and is relatively insensitive to differential-mode voltage. In contrast, the differential integrator operates on the differential-mode voltage from the two loop filter halves but attenuates their common-mode voltage.

This invention controls the signal amplification rate in a simple way with high precision in a CMD or CMD-carrying CCD device. CMD 12 has plural sections, such as M sections (U1-UM), each of which is a CMD unit U that can perform a charge multiplication operation, set in series. Each section of CMD unit Ui has plural (such as 4) electrodes G1, G2, G3, G4 set in a row via an insulating film, such as silicon oxide film 100, on a silicon insulating film. Among driving voltages P1, P2, P3, P4 applied on the electrodes G1, G2, G3 and G4, P1 and P2 are applied in the same cycle as the transfer clock, P4 for impact ionization is applied in intermittent cycles with respect to P1 and P2, and P3 is applied as a DC voltage at a prescribed level.

This invention controls the signal amplification rate in a simple way with high precision in a CMD or CMD-carrying CCD device. CMD 12 has plural sections, such as M sections (U1-UM), each of which is a CMD unit U that can perform a charge multiplication operation, set in series. Each section of CMD unit Ui has plural (such as 4) electrodes G1, G2, G3, G4 set in a row via an insulating film, such as silicon oxide film 100, on a silicon insulating film. Among driving voltages P1, P2, P3, P4 applied on the electrodes G1, G2, G3 and G4, P1 and P2 are applied in the same cycle as the transfer clock, P4 for impact ionization is applied in intermittent cycles with respect to P1 and P2, and P3 is applied as a DC voltage at a prescribed level.

The present invention provides permutation instructions usable in a programmable processor for solving permutation problems in cryptography, multimedia and other applications. PPERM and PPERM3R instructions are defined to perform permutations by a sequence of instructions with each sequence specifying the position in the source for each bit in the destination. In the PPERM instruction bits in the destination register that change are updated and bits in the destination register that do not change are set to zero. In the PPERM3R instruction bits in the destination register that change are updated and bits in the destination register that do not change are copied from intermediate result of previous PPERM3R instructions. Both PPERM and PPERM3R instructions can individually do permutation with bit repetition. Both PPERM and PPERM3R instructions can individually do permutation of bits stored in more than one register. In an alternate embodiment, a GRP instruction is defined to perform permutations.