42 results about "Low dose rate" patented technology

A method for increasing the rate of thrombus formation and / or proliferative cell growth of a selected region (21) of cellular tissue (22) including the step of endovascularly irradiating the selected region (21) with radiation, having a dose range of endovascular radiation of about 1 Gy to about 600 Gy at a low dose rate of about 1 cGy / hr to about 320 cGy / hr, to increase thrombus formation and / or cell proliferation of the affected selected region (21). Preferably, the delivery means includes a deformable endovascular prosthesis (25) adapted for secured positioning adjacent to the selected region (21) of cellular tissue (22), and a radioactive source. This source cooperates with the deformable endovascular device (25) in a manner endovascularly irradiating the selected region with radiation, having the above-indicated dose range and low dose rate of endovascular radiation to increase thrombus formation and / or cell proliferation of the affected selected region (21).

A method for increasing the rate of thrombus formation and / or proliferative cell growth of a selected region (21) of cellular tissue (22) including the step of endovascularly irradiating the selected region (21) with radiation, having a dose range of endovascular radiation of about 1 Gy to about 600 Gy at a low dose rate of about 1 cGy / hr to about 320 cGy / hr, to increase thrombus formation and / or cell proliferation of the affected selected region (21). Preferably, the delivery means includes a deformable endovascular prosthesis (25) adapted for secured positioning adjacent to the selected region (21) of cellular tissue (22), and a radioactive source. This source cooperates with the deformable endovascular device (25) in a manner endovascularly irradiating the selected region with radiation, having the above-indicated dose range and low dose rate of endovascular radiation to increase thrombus formation and / or cell proliferation of the affected selected region (21).

Methods of forming a low-dose-rate (LDR) brachytherapy device include depositing a solution comprising a soluble form of a radioactive material on a substrate. A water-insoluble form of the radioactive material is formed on the substrate by chemical precipitation and / or thermal decomposition.

An X-ray image capturing apparatus includes: scanning and signal lines; an X-ray sensor; detecting elements; a switching element to make charges accumulated in response to an OFF voltage and released in response to an ON voltage; a scan driving unit to switch a voltage applied to the scanning lines between ON and OFF voltages; a readout circuit to read the charges as image data; and a control circuit to detect an irradiation start by a first scheme based on a current increase due to X-ray irradiation or a second scheme based on an output from the X-ray sensor and to turn off the switching element to make charges accumulated if the first or second scheme detects the irradiation start, wherein a detection threshold is set such that the second scheme has a slower response and can detect an X-ray at a lower dose rate than the first scheme.

The invention relates to the technical field of electronics, in particular to a low-dosage-rate enhancement effect accelerated testing method based on temperature and dosage rate changes. The method aims to solve the problem that due to the fact that the testing time of a low-dosage-rate enhancement test is long, surplus base currents and current gains generate large influence. The low-dosage-rate enhancement effect accelerated testing method is simple in step and easy to operate. The technical approach can greatly lower the time and cost of the low-dosage-rate enhancement effect test, the time and cost are lowered by more than 15 percent on year-on-year basis, necessary bases can be provided for optimizing a bipolar transistor and circuit radiation resisting performance, the influence generated by the surplus base currents and the current gains is reduced, the influence is reduced by 15 percent on year-on-year basis, and the method is of great significance in the low-dosage-rate enhancement effect test and study of an electronic component. The method is suitable for the technical field of the electronics.

In order to provide a high accuracy radiation dose rate measurement system by good energy characteristics without deteriorating the original energy characteristics of a low dose rate range due to widening range, the dose rate measurement system is composed of: a radiation detector which sends a discrete current pulse having electric charge proportional to incident radiation energy and a DC voltage in which a DC current proportional to the radiation energy is converted; a high voltage power source which supplies a high voltage that operates the radiation detector; and a measurement unit in which the current pulse and the DC voltage are applied from the radiation detector to be converted to a low range dose rate and a high range dose rate respectively, and the low range dose rate and the high range dose rate are switched to be sent depending on the dose rates.

The invention provides an electron ray source generation device and a method for generating a low-dose-rate electron ray. The electron ray source generation device is used for irradiating an illumination face and comprises an electro ray generator, as well as a fan, wherein the electro ray generator is used for outputting the electro ray; the electro ray is emitted from an exit face of the electro ray generator; an absorption plate and a scanning mechanism are orderly arranged on the transmission route of the electron ray; the absorption plate is used for sheltering the electron ray; a leakage hole through which a part of the electron ray is emitted in a leakage way is formed in the absorption plate; the scanning mechanism is used for scanning the electron ray which is emitted through the leakage hole in the leakage way in the air, so that the scanned electron ray can be evenly irradiated to the illumination face; and the fan is used for decreasing the temperature of the absorption plate and the scanning mechanism. With the adoption of the electron ray source generation device and the method for generating the low-dose-rate electron ray provided by the invention, the low-dose-rate electron ray can be output; and meanwhile, the structure is simple and the cost is low.

The invention belongs to the technical field of in-situ calibration of fixed ambient dose equivalent meter, and in particular relates to an energy-compensating ambient dose equivalent secondary standard ionization chamber for on-site setting the ambient dose equivalent of a portable [gamma] ray radiation field. The energy-compensating ambient dose equivalent secondary standard ionization chamber comprises a collector (2) disposed in a closed ionization chamber formed by a housing (1), the housing (1) of the ionization chamber being a high voltage pole; a current output wire (4) connected to the collector (2) through the casing (1), and an outer side of the housing (1) is provided with an energy compensation layer (5). The energy-compensating ambient dose equivalent secondary standard ionization chamber can be used for setting the ambient dose equivalent H*(10) of the portable [gamma] ray radiation field, and has the characteristics of a good environmental adaptability and a high measurement accuracy for low dose rate.

A low-dose-rate (LDR) brachytherapy device having a spatiotemporal radiation profile includes an elongated body having a radioactive material in a spatial pattern to provide a spatial radiation profile with a radiation intensity that varies along a length of the elongated body. The radioactive material includes at least first and second radioisotopes having at least first and second respective decay profiles that together provide a temporal radiation profile that is different from the first and second decay profiles. The spatial radiation profile and the temporal radiation profile form a net spatiotemporal radiation profile configured to provide a radiotherapy plan for a patient.

A system and method is disclosed for providing an integrated circuit that has increased radiation hardness and reliability. A device active area of an integrated circuit is provided and a layer of radiation resistant material is applied to the device active area of the integrated circuit. In one advantageous embodiment the radiation resistant material is silicon carbide. In another advantageous embodiment a passivation layer is placed between the device active area and the layer of radiation resistant material. The integrated circuit of the present invention exhibits minimal sensitivity to (1) enhanced low dose rate sensitivity (ELDRS) effects of radiation, and (2) pre-irradiation elevated temperature stress (PETS) effects of radiation.

The invention discloses a method for an in-situ test of a high-energy electron irradiation effect of an electronic component under a temperature changing condition based on an argon environment, and relates to the field of electronic technologies. The invention aims to solve the problem that during ground irradiation of an electronic component, due to influence of an environmental atmosphere and a temperature, an electrical property in-situ test is not accurate and the evaluating efficiency is low. The method disclosed by the invention adopts the argon environment, so that the influence of oxygen in the air and the influence of a negative pressure in vacuum irradiation in a process of irradiation test in the past can be effectively eliminated, and the accuracy of the in-situ test of the electronic component can be improved. Temperature-changing irradiation is performed during irradiation, and an environmental temperature condition for work of a bipolar transistor is selected in a temperature interval, so that according to the method, a low-dose rate enhancement effect acceleration test method that the in-situ test method has simple steps and is easy to operate. The method disclosed by the invention is suitable for space irradiation effect research and test of a bipolar electronic component.

The invention discloses a low-dose-rate irradiation damage enhancement effect judgment method. The method comprises the following steps: 1) obtaining an electrical parameter test result of a to-be-tested object before irradiation; 2) manufacturing a plurality of irradiation test circuit boards, and carrying out ionization irradiation tests with different dose rates and different offsets to obtainelectrical parameter test results of a plurality of irradiation dose points; 3) determining the ratio of the electrical parameter degradation amount of the to-be-tested object and the electrical parameter degradation reliability influence factor of the to-be-tested object; and 4) judging whether the to-be-tested object has low-dose-rate irradiation damage enhancement effect or not according to theratio of the electrical parameter degradation amount and the electrical parameter degradation reliability influence factor. According to the method, high-dose-rate irradiation tests and low-dose-rateirradiation tests are carried out separately, high-dose-rate and low-dose-rate comparison data are obtained, the component parameter degradation factor and the low-dose-rate irradiation damage enhancement factor are considered, and the judgment result about whether an aerospace component has the low-dose-rate irradiation damage enhancement effect or not is obtained.

An X-ray image capturing apparatus includes: scanning and signal lines; an X-ray sensor; detecting elements; a switching element to make charges accumulated in response to an OFF voltage and released in response to an ON voltage; a scan driving unit to switch a voltage applied to the scanning lines between ON and OFF voltages; a readout circuit to read the charges as image data; and a control circuit to detect an irradiation start by a first scheme based on a current increase due to X-ray irradiation or a second scheme based on an output from the X-ray sensor and to turn off the switching element to make charges accumulated if the first or second scheme detects the irradiation start, wherein a detection threshold is set such that the second scheme has a slower response and can detect an X-ray at a lower dose rate than the first scheme.

A method is disclosed for manufacturing an integrated circuit that has increased radiation hardness and reliability. A device active area of an integrated circuit is provided and a layer of radiation resistant material is applied to the device active area of the integrated circuit. In one advantageous embodiment the radiation resistant material is silicon carbide. In another advantageous embodiment a passivation layer is placed between the device active area and the layer of radiation resistant material. The integrated circuit of the present invention exhibits minimal sensitivity to (1) enhanced low dose rate sensitivity (ELDRS) effects of radiation, and (2) pre-irradiation elevated temperature stress (PETS) effects of radiation.

The invention discloses a small GM counting tube wide-range monitoring instrument. The instrument comprises a high-voltage module used for providing high work voltage for a GM counting tube, the GM counting tube used for monitoring the dose rate level of an environment in real time, AD integral collecting units used for collecting integrals of output signals of the GM counter tube, a high-voltagemeasuring unit used for measuring the output voltage of the high-voltage module, a shaping and pulse counting unit used for monitoring the pulse count number of the output signals of the GM counter tube in real time, and an MCU circuit used for logically judging data of each collecting unit and judging whether the pulse count number of the GM counter tube or a collecting result of the integrals ofthe output signals of the GM counter tube is adopted for measuring a dose rate. On the basis of the calculation of a judgement result, a final dose rate measuring result is obtained; the technical effect of automatic switching between a low dose rate level and a high dose rate level of the output signals of the GM counter tube is achieved.

Methods of forming a low-dose-rate (LDR) brachytherapy device include depositing a solution comprising a soluble form of a radioactive material on a substrate. A water-insoluble form of the radioactive material is formed on the substrate by chemical precipitation and / or thermal decomposition.

In order to provide a high accuracy radiation dose rate measurement system by good energy characteristics without deteriorating the original energy characteristics of a low dose rate range due to widening range, the dose rate measurement system is composed of: a radiation detector which sends a discrete current pulse having electric charge proportional to incident radiation energy and a DC voltage in which a DC current proportional to the radiation energy is converted; a high voltage power source which supplies a high voltage that operates the radiation detector; and a measurement unit in which the current pulse and the DC voltage are applied from the radiation detector to be converted to a low range dose rate and a high range dose rate respectively, and the low range dose rate and the high range dose rate are switched to be sent depending on the dose rates.

In an exemplary process for lower dose rate ion implantation of a work piece, an ion beam may be generated using an ion source and an extraction manipulator. The extraction manipulator may be positioned at a gap distance from an exit aperture of the ion source. A current of the ion beam exiting the extraction manipulator may be maximized when the extraction manipulator is positioned at an optimal gap distance from the exit aperture. The gap distance at which the extraction manipulator is positioned from the exit aperture may differ from the optimal gap distance by at least 10 percent. A first potential may be applied to a first set of electrodes. An x-dimension of the ion beam may increase as the ion beam passes through the first set of electrodes. The work piece may be positioned in the ion beam to implant ions into the work piece.

The invention discloses a preparation method of high-performance modified starch. The method comprises the following steps: putting dry starch into a sealed packet, firstly performing positive surfaceirradiation treatment with low dosage rate on the sealed packet, oxygenating the interior of the sealed packet, shaping the oxygenated sealed packet, and finally performing negative surface irradiation treatment with high dosage rate on the sealed packet, so as to obtain the high-performance modified starch. The method has the advantages that comprehensive irradiation technologies, such as oxygenation, alternative irradiation with different dosage rates, packaging and shaping and overturning, are adopted, so that the irradiation dosage unevenness is smaller than 1.1, the viscosity volatilityof the starch subjected to irradiation modification is smaller than 10 percent, the irradiation efficiency is high, and the cost is reduced.

The present invention provides a method for extracting radiation defects in linear circuits, which includes: step 100, analyzing the linear circuit to determine the discrete device to be separated; step 200, cutting and separating the discrete device to be separated; step 300, testing The electrical performance of the separated discrete device is screened; step 400, extracting electrodes from the screened discrete device; step 500, performing defect testing on the discrete device through the extracted electrode. The radiation defect extraction method of the linear circuit in the present invention separates the discrete devices in the linear circuit by means of cutting and screening, and leads out the electrodes, so that the discrete devices in the linear circuit can be independently tested for defects, thereby enriching the present invention. Some researches on the enhanced effect of low dose rate can achieve better research results.

The invention provides a method for an acceleration test of the low-dosage-rate enhancement effect of a bipolar device based on the high-temperature hydrogen soaking technology and relates to the field of the electronic technology. The method aims at solving the problem that due to the fact that the low-dosage rate of an actual spatial environment is adopted by an existing ground experiment to estimate the radiation-resistant capacity of an electronic element, the radiation time is long. According to the method, TCAD software is used for simulating the change rule of the electric performance of the bipolar device and an ionizing radiation shortage in a hydrogen atmosphere; according to charges of oxide and the interface state density in the bipolar device in the hydrogen atmosphere, the hydrogen soaking time and the hydrogen density are obtained; generation of the ionizing radiation shortage in the bipolar device is accelerated through hydrogen soaking and heating, so that the function that low-dosage-rate enhancement effect evaluation is accelerated is achieved and the purpose that the radiation time of high-dosage-rate radiation conducted on the bipolar device on a high-temperature hydrogen soaking condition is shorter than that of low-dosage-rate radiation conducted on the bipolar device is achieved. The method can be applied to a spaceflight electronic system.

The invention discloses a counting method based on segmentation proportion jump threshold judgment, and the method comprises the following steps: segmenting a counting value of a counter, and determining jump smoothing time, non-jump smoothing time and a jump trigger coefficient of each segmented region; judging a segmented region where a count value of a counter is located during dose rate measurement, and obtaining jump smoothing time, non-jump smoothing time and a jump trigger coefficient corresponding to the count value according to the segmented region; for a count value of a counter during dose rate measurement, if a count of mean smoothing calculation by adopting jump smoothing time is greater than a count of mean smoothing calculation by adopting non-jump smoothing time * a jump trigger coefficient of a segmented region where the count value of the counter is located, adopting the jump smoothing time to perform mean smoothing calculation counting; otherwise, using non-hopping smoothing time to carry out mean smoothing calculation counting. According to the invention, the response time to the dose rate change of the surrounding environment of the counter is short, and the counter can also respond quickly under the condition of low dose rate.

The invention discloses an electronic radiation source generating device and a method for generating low-dosage-rate electronic rays. The electronic radiation source generating device is used for radiating an illumination plane, and the electronic radiation source generating device comprises an electronic ray generator for outputting an electronic ray, a shielding plate is arranged on a transmission route of the electronic ray, and the shielding plate is provided with a plurality of leak holes for leaking partial electronic ray. Due to the adoption of the electronic radiation source generating device and the method for generating the low-dosage-rate electronic rays, the electronic ray with a low dosage rate can be outputted; and meanwhile, the structure is simple, and the cost is low.

The invention relates to a method for evaluating biological damage caused by low-dose gamma ray irradiation by utilizing isocitrate dehydrogenase 2. According to the dose-effect relationship between the irradiation dose of low-dose gamma rays received by a C57BL / 6J mouse and the down-regulation rate of the relative expression quantity of IDH2 in serum, the down-regulation rate of the relative expression level of IDH2 in the serum of a C57BL / 6J mouse, biological damage from low-dose gamma radiation was assessed. On the basis of establishing a low dose rate irradiation C57BL / 6J mouse model, significant differential expression protein is screened out by using an iTRAQ technology and is verified by using Western blot. The method for evaluating biological damage caused by low-dose gamma ray irradiation by utilizing isocitrate dehydrogenase 2 has the advantages of sensitivity to low-dose radiation, high reliability, strong specificity and the like.

The invention relates to a bipolar transistor ELDRS (Enhanced Low Dose Rate Sensitivity) suppressing method and belongs to the technical field of space environment effect, nuclear science and application. The method provided by the invention is proposed aiming at a defect of lack of a bipolar transistor ELDRS suppressing means in the prior art. The method includes putting a transistor into a sealed container, vacuumizing the container or filling with protective gas, wherein the transistor is a bipolar transistor; heating the transistor with an electric furnace and performing thermal insulation; cooling the transistor to a room temperature after thermal insulation ends. The method is suitable for anti-radiation treatment on components and parts in electric systems in a spacecraft cabin.

The invention discloses a composite oil phase for preparing bulk emulsified explosives with upward hole charges. The composite oil phase consists of white oil, naphthenic oil, polymer ester emulsifier, crosslinking agent, S-80 , anti-turbulence agent, and prepared by the following method: first heat white oil, naphthenic oil, polymer ester emulsifier, and S-80 in separate melting tanks to 60-70°C, and then mix according to the ratio requirements The oil pump is measured by the electronic scale and then pumped into the reaction kettle one by one. After stirring and heating up to 80-90°C, add the measured cross-linking agent and anti-turbulence agent, and continue stirring for about 30 minutes until the cross-linking agent and anti-turbulence agent are fully After melting, the finished product is obtained after filtering. The bulk emulsion explosive produced by the composite oil phase of the present invention has the remarkable characteristics of good explosive performance, high working capacity, long storage period, anti-turbulence, long-distance transportation, small colloidal viscosity gradient coefficient, and easy pumping at room temperature. When used in underground mines to charge holes, the rate of drug return is extremely low. It can replace imported products to produce high-quality bulk emulsion explosives, and has good economic benefits.

The invention relates to the technical field of electronics, in particular to a low-dosage-rate enhancement effect accelerated testing method based on temperature and dosage rate changes. The method aims to solve the problem that due to the fact that the testing time of a low-dosage-rate enhancement test is long, surplus base currents and current gains generate large influence. The low-dosage-rate enhancement effect accelerated testing method is simple in step and easy to operate. The technical approach can greatly lower the time and cost of the low-dosage-rate enhancement effect test, the time and cost are lowered by more than 15 percent on year-on-year basis, necessary bases can be provided for optimizing a bipolar transistor and circuit radiation resisting performance, the influence generated by the surplus base currents and the current gains is reduced, the influence is reduced by 15 percent on year-on-year basis, and the method is of great significance in the low-dosage-rate enhancement effect test and study of an electronic component. The method is suitable for the technical field of the electronics.

A method for judging the enhancement effect of low-dose-rate radiation damage, comprising the steps of: 1) obtaining the test results of electrical parameters of the object to be tested before irradiation; 1. Ionizing radiation tests with different biases to obtain electrical parameter test results at multiple irradiation dose points; 3) determining the ratio of the electrical parameter degradation of the object to be tested and the reliability influencing factor of the electrical parameter degradation of the object to be tested ; 4) According to the ratio of the electrical parameter degradation amount and the electrical parameter degradation reliability impact factor, it is determined whether the object to be tested has a low dose rate radiation damage enhancement effect. The present invention obtains comparative data of high and low dose rates by carrying out high and low dose rate irradiation tests respectively, and obtains whether aerospace components have low dose rate radiation damage by considering the component parameter degradation factor and the size of low dose rate radiation damage enhancement factor Judgment results of reinforcement effects.