Low-dose-rate irradiation damage enhancement effect judgment method
A technology with low dose rate and enhanced effect, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., to achieve the effect of reducing radiation risk and high reliability
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[0048] Test device selection
[0049] The G7J139MJ type low power consumption, low offset four-voltage comparator produced by Jinzhou 777 Factory was selected as the tested device.
[0050] The radiation source is a cobalt 60 gamma ray source, and the inhomogeneity of the radiation field within the irradiated area of the test sample is less than 10%. The uncertainty of radiation dose rate is less than 5%. Radiation ambient temperature requirements: 15°C to 30°C. Two dose rates of 0.005rad(Si) / s and 50rad(Si) / s were used to irradiate 7J139 devices, and parameters such as input offset voltage, power supply current, input bias current, input offset current, and open-loop voltage gain were mainly tested. .
[0051] The test circuit board requirements are as follows:
[0052] a) Device sockets that are not sensitive to radiation should be selected to make test circuit boards, and the device sockets should not affect the uniformity of the radiation field. Other components on ...
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