192 results about "Functional failure" patented technology

The present invention relates to a safety system for use in protection functions, which system prevents that an error in one control circuit do not result in a function failure by using supervising functions comprising at least two sensors connected to a monitoring unit which receives and processes information about a position of a machine from both sensors and compares the results with stored values and a number of input conditions for the monitoring unit, whereby said sensors comprise means for generating data with respect to a position of a machine movement and said monitoring unit comprises means, which with respect to the result of the comparison is arranged to stop a machine movement if conditions for a stop are fulfilled. The monitoring unit is arranged to compare values from said sensors and when detecting deviating value from either one of sensors detecting a functional error with the sensors.

A framework by which arbitrary routines may be executed in reaction to specific events for analysis and testing, while avoiding the need to manipulate the actual code being monitored. A method for performing functional failure testing of a software-based system comprises monitoring execution of target software for occurrence of a specified event, in response to detecting occurrence of the specified event, performing an action to cause or simulate a failure of the target software or of software or hardware that operatively interacts with the target software, and monitoring the target software for a response to the performed action.

The invention discloses an onboard high-accuracy time synchronization method for a satellite, which is used for effectively solving the problem of unavailability of meeting time synchronization in the sensitive acting process of the satellite due to low accuracy and poor stability of an onboard time system. By adopting the high-accuracy time synchronization method, the time accuracy (an error between the time accuracy and GPS (Global Positioning System) standard time is less than 25 mus) of a satellite central computer is enhanced, the time synchronization accuracy among subsystems of the entire satellite is higher than 0.1 ms (based on the GPS standard time), and the defect of unavailability of continuing working when a GPS receiver is not positioned existing in a design method in which only GPS second pulse is taken as time synchronization of each subsystem of the entire satellite is overcome. Once one of the GPS receiver and a satellite-to-ground observing and controlling channel exists at the in-orbit flying period of the satellite, time synchronization of the satellite can be realized, so that the risk of functional failure of the system is lowered effectively, the time synchronization mode can be changed in time as required or along with the change of environment, and the time synchronization flexibility, reliability and security of the satellite are enhanced remarkably.

A ductless fumehood system comprising: at least one ductless fumehood comprising a housing; a workspace formed within the housing; a door for selectively closing off the workspace; an air inlet for introducing air into the workspace; a master module for receiving air from the workspace, purging unwanted substances from that air, and then exhausting that filtered air to the ambient room atmosphere; and a slave module for receiving air from the workspace, purging unwanted substances from that air, and then exhausting that filtered air to the ambient room atmosphere; wherein the slave module is in communication with the master module such that the master module central processing unit is capable of (i) controlling the operation of the active elements of the slave module, (ii) detecting a function failure of the slave module, and (iii) activating the master module alarm in the event of a failure within that slave module.

A functional coverage based test generation technique for pipelined architectures is presented. A general graph-theoretic model is developed that can capture the structure and behavior (instruction-set) of a wide variety of pipelined processors. A functional fault model is developed and used to define the functional coverage for pipelined architectures. Test generation procedures are developed that accept the graph model of the architecture as input and generate test programs to detect all the faults in the functional fault model. A graph model of the pipelined processor is automatically generated from the specification using functional abstraction. Functional test programs are generated based on the coverage of the pipeline behavior. Module level property checking is used to reduce test generation time.

A magnetic power connector and an electronic system using a magnetic power connector are disclosed, wherein a magnetic element of the magnetic power connector is magnetically attracted to a matching magnetic connector to ensure a stable contact. In addition, the electrical conductive path created between the contact elements does not pass through any elastic elements, thereby avoiding heating and improving the lifespan of the elements. Furthermore, sealing can be disposed in the gaps between the connector elements to make the connector waterproof. In addition, a trigger signal can be generated by establishing an electrical connection between a signal contact element and the conductive element in the magnetic power connector so as to achieve the purpose of identification or control, thereby avoiding the functional failure caused by the damage of the contact element of the matching magnetic connector.

Methods of providing maintenance management of a machine are disclosed. In one embodiment, the method involves identifying a machine component failure that, if not repaired, will result in a functional failure of the machine. A criticality factor is assigned to the machine component failure based on at least a probability of occurrence of the functional failure and a consequence of the functional failure to a machine user. A maintenance task is generated to repair the machine component failure, and a triggering condition that activates the maintenance task is defined. The method further involves conducting a machine repair in response to a detection of the triggering condition, and maintaining a record that includes information relating to the conducted machine repair. The method of providing maintenance management is also modified based on at least the record.

A method of diagnosing semiconductor device functional testing failures by combining deterministic and functional testing to create a new test pattern based on the functional failure by determining the location of and type of error in the failing circuit. This is accomplished by identifying the failing vector during the functional test, observing the states of the failed device by unloading the values of the latches from the LSSD scan chain before the failing vector, generating a LOAD from the unloaded states of the latches, applying the generated LOAD as the first event of a newly created independent LSSD deterministic pattern, applying the primary inputs and Clocks that produced the failure to a correctly operating device, unloading the output of the correctly operating device to generate a deterministic LSSD pattern; and applying the generated deterministic LSSD pattern to the failing device to diagnose the failure using existing LSSD deterministic tools.