68results about How to "Implement batch testing" patented technology

The invention discloses a method and system for testing a user interface, a use case management platform and an operating terminal, and relates to the field of application testing. The method and system, the use case management platform and the operating terminal are invented for solving the problem that testing use case compiling is long in consumed time. The method includes the steps of displaying an interface window of a tested application, and receiving clicking operation for a window object in the interface window; intercepting function calling of a clicking event through a Hook mechanism, and obtaining a coordinate parameter corresponding to the clicking event; searching for a window object corresponding to the coordinate parameter, and obtaining an object parameter of the window object, wherein the object parameter is used for uniquely signing the window object; generating a testing use case according to the object parameter. The method and system, the use case management platform and the operating terminal are mainly applied to UI testing of the Android application.

The invention discloses a prediction method for crankshaft fatigue life based on a genetic nerve network, belongs to the field of crankshaft fatigue life testing of an internal combustion engine. The purpose of the method is to solve the deficiency of a DC resonant-type crankshaft fatigue life testing machine for possessing destructiveness to the crankshaft testing and having long testing time. The principle of the method is to normalize the historical data of the crankshaft testing by utilizing the conventional DC resonant-type crankshaft fatigue life testing machine to obtain a training sample set; to optimize a BP artificial nerve network model through genetic algorithm; to carry out iteration training to the genetic algorithm-based and optimized BP artificial nerve network by utilizing the training sample set to obtain a trained BP artificial nerve network prediction model; to use the prediction model to carry out rapid prediction for the crankshaft fatigue life. The method optimizes the BP artificial nerve network based on the genetic algorithm, avoids the "over fitting" problem of the single BP nerve network, improves the training speed and prediction precision effectively; rapidly predicts the crankshaft fatigue life in a short time without destroying the crankshaft quality, is capable of carrying out a batch testing for the crankshafts of a whole production batch.

The invention provides a method and system of testing nodes in batches. The method includes the following steps: obtaining a test script for testing multiple nodes; storing the obtained test script in a main node; accessing each slave node one by one through the main node so that the test script is copied in each slave node during access; and carrying out a command to make the test script run for the main node, logging in each slave node remotely one by one through the main node, and carrying out the command to make the test script run when each slave node is logged in. According to the scheme, nodes in batches can be tested, and the performance test efficiency is further improved.

The invention provides a machine learning-based tunnel rock quartz content test system and method. The system comprises an information acquisition system and a learning system, wherein the informationacquisition system is borne on a mechanical arm, approaches to surrounding rocks along with the movement of the mechanical arm and is used for learning indoor rock sample images and rock sample images practically observed via well logging according to received acquired data, recognizing texture features of different rocks through a local binary pattern feature extraction algorithm so as to different differences of different rocks in the aspects of color, structure and construction, integrating feature amounts through a support vector machine algorithm, and establishing a response informationquartz content prediction model so as to calculate contents of quartz in front rocks in TBM tunneling projects.

The invention discloses an anti-interference test method and system of a wireless communication module. The anti-interference test system comprises a test device and an interference source generating device. The test device and the interference source generating device are in communication connection with a communication module to be tested. The test device, when receiving a first test script, starts an interference-free test and obtains the first packet loss rate of the communication module to be tested under various test signal strengths. When the first packet loss rate is within a first preset range, the test device sends a second test script to the interference source generating device and starts an interference test. A first control unit acquires the second packet loss rate of the communication module to be tested under various interference signal strengths. When the second packet loss rate is within a second preset range, a second control unit generates a test result according to the current interference signal strength. The anti-interference test method and system achieve the automatic anti-interference test of the communication module, greatly reduce the work intensity of testers, can realize a batch test, and greatly improve efficiency.

The invention provides a method, a device, a test board and a system for testing traffic of an interface board. The method comprises: acquiring a first test data packet; encoding and performing mapping processing on the first test data packet to obtain a processed first data packet; converting the first data packet to a first data packet that can be received by a to-be-tested interface board, and sending the first data packet to the to-be-tested interface board; acquiring a second data packet returned by the to-be-tested interface board; converting the second data packet to a second data packet that can be received by a packet receiving module; decoding and performing mapping processing on the second data packet to obtain a processed second data packet; and determining, according to a result of matching between the processed second data packet and the first test data packet, whether the to-be-tested interface board is faulty. The method in the present invention can be used to improve test efficiency.

The invention discloses a solid insulation voltage resistance performance test system under a high voltage and low temperature Paschen condition. The solid insulation voltage resistance performance test system comprises a detection container and a substance to be tested, wherein the substance to be tested is suspended in the detection container; an insulation socket is arranged on the side face of the detection container; the substance to be tested comprises a metal tube; an insulation layer to be tested is coiled outside the metal tube; both ends of the metal tube are fixedly communicated with extension tubes with closed outer ends respectively; insulators are additionally arranged on the extension tubes respectively; insulation layers are additionally coiled on the extension tubes and the insulators respectively to form extension sections; the extension sections are led out of holes formed on the front end face and the rear end face of the detection container respectively; a temperature sensor is arranged on the insulation layer to be tested and an aluminum foil is wrapped on the insulation layer to be tested so as to form a grounding pole; and a measurement line of the temperature sensor and the aluminum foil grounding pole are lead out of the insulation socket. By the solid insulation voltage resistance performance test system, Paschen condition electric performance test of a solid insulation layer of a high voltage part of a large-size superconducting magnet can be realized; and the problems of a voltage resistance performance test method and a judgment measure of a high voltage insulation part working in a vacuum environment can be solved basically.

The invention discloses a batch testing device and method of a PCIE built-out card. The testing device comprises a processing module, a data transmitting module and a testing module which are sequentially connected. The processing module comprises a plurality of CPUs connected through QPI. Each CPU is provided with a plurality of PCIE testing grooves. The processing module is used for processing test data. The data transmitting module is used for data transmission between the testing module and the processing module. The testing module comprises a network card testing unit and a storage testing unit which are connected with the data transmission module. The network card testing unit is used for testing network cards. The storage testing unit is used for testing storage cards. The testing method includes the steps that the tested cards are inserted in the corresponding PCIE testing grooves on a main board; corresponding testing is conducted according to the types of the tested cards; the test result is displayed and recorded. Compared with the prior art, the batch testing of the PCIE cards of multiple types can be conducted at the same time, testing efficiency is improved, and cost is saved.

The invention is suitable for the technical field of bracelets, and provides a starting method and device, a bracelet, and a bracelet testing system. The method comprises the steps: obtaining the movement state of the bracelet; starting an aging testing program when the movement state is a preset rotating state, so as to carry out the aging testing of the hardware equipment of the bracelet. The method simplifies the stating mode of the aging testing program of the bracelet, solves a problem that a conventional method of starting the aging testing program through an APP of an intelligent terminal is tedious in operation, improves the starting efficiency of testing, and facilitates the implementation of batch testing of bracelets.

The present invention discloses a terminal test system and method. The terminal test system comprises a controller and a server. The server stores a plurality of content to be tested, and the controller is in communication with the server, wherein the controller receives an operation instruction emitted by a tester and generates a test instruction according to the operation instruction; the terminals to be tested receive the test instruction, downloads the content to be tested according to the test instruction by the server and performs test according to the content to be tested. The terminaltest method comprises the steps of: receiving an operation instruction of a tester, and generating a test instruction according to the operation instruction; controlling one or more than one terminalsof the terminals to be tested to download one or more than one content to be tested according to the test instruction; and performing test according to the content to be tested. The terminal test system and method can perform centralized management and control test for the terminals to be tested as required to improve the test consistency and efficiency.

The invention relates to the technical field of a material and particularly relates to a rubber material consistency monitoring method. The method comprises steps of (1), establishing a vehicle rubberpart basic information database; (2), performing performance tests on defined materials, and constructing a vehicle rubber material performance database including density, Fourier transform infraredspectrum, TG test, etc.; (3), testing sampled parts or failed return parts; and (4), comparing test data of the (3) with the performance database of the (2) to determine the consistency. The method isadvantaged in that whether the materials used in batch parts are consistent with original definition materials can be effectively identified, and no special testing equipment is needed; the method can serve comparison and selection of multi-platform and multi-vehicle model parts, and non-professional technicians can further rapidly determine whether the materials are consistent, and strong generalization property is realized.

The invention discloses a storage device testing method and device, an electronic device and a computer readable storage medium. The method comprises the steps of determining a to-be-tested target storage device and a target test item; acquiring actual state information of the target test item of the target storage equipment by calling an acquisition command in a test script corresponding to the target test item; and comparing the actual state information with standard state information in the test script to obtain a test result of the target test item of the target storage device. According to the storage device testing method provided by the invention, batch testing of a plurality of storage devices is realized, the testing efficiency is improved, the detection period is shortened, testing of the storage devices is realized on a client site, and the reliability of the storage devices tested on site is ensured.

The invention discloses a system and a method for detecting a test instrument. The system comprises an environment establishment unit, a data processing unit, a data transmission unit, a data storage unit and an intelligent terminal. The method comprises the following steps: 1, the environment establishment unit establishes different test environments and detects the test instrument; 2, the data processing unit receives a detection result transmitted from the environment establishment unit and converts the detection result into data; 3, the data transmission unit transmits the data converted by the data processing unit to the data storage unit and the intelligent terminal; 4, the data storage unit stores the data converted by the data processing unit; 5, the intelligent terminal analyzes the data converted by the data processing unit. The technical problems, which cannot be realized in the prior art, of performing batch testing on the test instruments, saving time and labor, further improving the working efficiency, reducing the time consumed for switching the testing environments back and forth and detecting related performance of the test instruments are solved.

The invention discloses a thermal-protection material thermal prevention and insulation system, a testing method and a heat treatment method. It can be achieved that a spacecraft thermal-protection material is closer to multi-state thermal prevention and insulation performance testing of a service environment. In the meanwhile, in the preparing process of the thermal-protection material, single-face heat treatment or sintering is conducted, the gradient temperature is formed in the thickness direction, the surface undergoes high temperature, service is stable at high temperature, while the inward temperature is gradually lowered, and both the mechanical property and the thermal insulation performance of the material are improved. As is tested, the overall mechanical property of the material can be improved by around 20%, and the heat conductivity can be lowered by 10% or above. Therefore, by means of the testing system, it can be achieved that the thermal-protection material is closerto the multi-state thermal prevention and insulation performance testing of the service environment, it can also be achieved that in the material preparing process, single-surface high-temperature quick heating is conducted, and the comprehensive performance of the thermal-protection material is improved.

The invention discloses a function testing machine for a key circuit board. The function testing machine comprises a testing platform and a testing mold which is arranged above the testing platform and can move up and down relative to the testing platform, wherein a programmable logic controller (PLC) information acquisition module corresponding to a key of the key circuit board is arranged on the testing mold. Due to the adoption of the testing machine with the structure, short circuits in the circuit board and the current of a light-emitting diode can be detected, so that the effect of safe and effective detection is achieved; simultaneously, by the detection device, the defects of single testing functions during production in the prior art are overcome, integral boards can be tested in batches, quality problems caused by personal factors are solved, and the bottleneck of production capacity caused by testing links is effectively prevented.

The invention discloses a method for rapidly elevating the reliability of SONOS (silicon-oxide-nitride-oxide-silicon) by measuring a tunneling electric field. The method comprises the steps of measuring relevant parameters of an operating voltage window and a tunneling electric field window of the SONOS; completing the ONO (oxide-nitride-oxide) filming of the SONOS to be tested, then measuring the tunneling electric field window; deducting the operating voltage window of the SONOS to be tested according to the tunneling electric field window and the relevant parameters of the SONOS to be tested; and elevating the properties of the data retention of the SONOS to be tested according to the operating voltage window of the SONOS to be tested. According to the method, an electronic / hole escape mechanism of the SONOS device and a principle corresponding to a measuring method of the tunneling electric field are utilized, a positive tunneling electric field and a negative tunneling electric field of an ONO film are measured, and the properties of the data retention of the SONOS device are judged, so that the technique process of the elevation of the reliability is simplified, the elevation time is shortened, and the batch test is facilitated.

The invention provides an OTDR testing method based on an industrial internet platform, comprising the following steps of: setting an OTDR testing device and an edge server for testing optical fibers,wherein the device end program set in the OTDR testing device sequences the original data of an optical fiber testing, and sending the original data to the edge server through a network; performing process calculation on the original data through the process algorithm module set in the edge server, and uploading the intermediate calculation result to an application program workstation through thenetwork; the application program workstation comparing the intermediate calculation result with the threshold value prestored in the database, performing the logic judgment to analyze whether the testing result meets the requirement or not, and sending the corresponding unqualified item number to the edge server if there is a super-scalar item; and the edge server drawing a testing report according to the original data, the intermediate calculation result, and the unqualified item number of the optical fiber testing, and pushing them to a corresponding display device for a tester to check.

The invention relates to a station switching device of a valve sealing performance test platform. The station switching device of the valve sealing performance test platform comprises a base, guide racks, a height adjusting cylinder, a base platform, a sliding pillar, a sliding platform, a position adjusting motor, a lead screw, a station switching motor and a pusher dog disk, wherein the guide racks are fixed to the top of the base, the sliding pillar is in sliding fit with the guide racks, the base platform is fixed to the upper half of the sliding pillar, the position adjusting motor is installed on the front portion of the base platform, the front end of the lead screw is connected with the position adjusting motor, the rear end of the lead screw is connected with the rear portion of the base platform, a transverse exhibition stand is arranged on the rear half of the sliding platform, the left side and the right side of the transverse exhibition stand are in sliding fit with the base platform, the lower portion of the transverse exhibition stand is in thread fit with the lead screw, the station switching motor is fixed to the upper portion of the sliding platform, and the pusher dog disk is installed on the station switching motor. The station switching device of the valve sealing performance test platform has the advantages of being reasonable in structural design and high in automation degree and can automatically switch stations and open and close valves in the process of valve sealing performance tests, manual operation is replaced, the labor intensity of workers is greatly reduced, and batch tests of the sealing performance of the hydraulic valves can be carried out easily.

The invention discloses testing equipment for a radio frequency chip, and belongs to the field of chip testing. A probe and at least two pressure sensors are arranged on a first surface, opposite to a second supporting plate, in a first supporting plate of the test equipment; a second surface, opposite to the first supporting plate, of the second supporting plate is provided with a chip groove used for placing a radio frequency chip, a pin of the radio frequency chip is opposite to the probe, and the pressure sensor is used for measuring a pressure value between the probe and the pin; when the probe makes contact with the pin for the first time and the pressure values measured by the at least two pressure sensors are equal, the probe is controlled to be away from the pin; when the probe makes contact with the pin for the second time and the pressure value reaches a target pressure value, the radio frequency chip is tested through the probe, and the target pressure value is the pressure value when the radio frequency chip can be tested and the probe and the radio frequency chip are not damaged. According to the invention, waste of human resources can be avoided, the probe and the radio frequency chip can be protected while the radio frequency chip is normally tested, and the service life of the test equipment and the radio frequency chip is prolonged.

The invention relates to an insulation and voltage-withstanding automatic test system for a fault indicator collection unit. The insulation and voltage-withstanding automatic test system comprises aninsulation and voltage-withstanding test management system, a program-controlled insulation and voltage-withstanding tester and a program-controlled channel switching device which are in communicationconnection with one another; a plurality of collection units are accessed to the insulation and voltage-withstanding test management system through the program-controlled channel switching device; under the control of the insulation and voltage-withstanding test management system, the plurality of collection units are accessed to the program-controlled insulation and voltage-withstanding tester one by one; and the insulation and voltage-withstanding test management system is used for issuing an instruction to the program-controlled insulation and voltage-withstanding tester to test the plurality of accessed collection units. The system can greatly improve the test efficiency and precision of the insulation performance of the collection units and reduce the personnel investment, and has good social benefits.

The invention discloses a full-airspace phased-array measured antenna rotation simulation calibration system and method. The system comprises a calibration antenna array, a measured phased-array antenna, a three-dimensional holder which fixes the measured phased-array antenna, a digital signal processing platform, a computer and an optical instrument. The digital signal processing platform is connected with the calibration antenna array, the measured phased-array antenna and the computer. The computer is connected with the three-dimensional holder and the optical instrument. According to the full-airspace phased-array measured antenna rotation simulation calibration system and method, high-efficiency calibration of the channel uniformity and the antenna pointing performance of the full-airspace phased-array antenna is realized, which helps to ensure the work performance of the antenna.

The invention provides a method and system for automatically guiding a server in batch testing. The method comprises the following steps that a mainboard BMC MAC address, an SN and an order number arescanned; a binding relation between mainboard BMC MAC address information and SN and order number information is established; during start-up testing, the mainboard BMC MAC address of the current server is read; according to the mainboard BMC MAC address of the current server and the binding relation established between the mainboard BMC MAC address information and the SN and order number information, the SN and order number of a machine are determined; according to the SN and the order number, the type of the current server is determined, and a testing program is downloaded. The binding relation between the mainboard BMC MAC address information and the SN and order number information is established, the testing program of the corresponding type is automatically acquired according to themainboard BMC MAC address information during start-up testing, batch testing of the server is achieved, and the problems are solved that during start-up testing of the server, an operator needs to manually input the SN and order number information, and automation cannot be achieved.

The embodiment of the invention discloses a probe card, a preparation method and a chip testing method. The probe card comprises a substrate and a patterned substrate layer located on one side of thesubstrate. The patterned substrate layer comprises at least one vacant groove and at least one cantilever probe located on the side, away from the substrate, of the patterned substrate layer. The cantilever probe extends to the vacant groove and is suspended on the vacant groove. The cantilever probe comprises a first thermal deformation layer, a second thermal deformation layer and a conductive contact. The first thermal deformation layer is located between the patterned substrate layer and the second thermal deformation layer, the thermal expansion coefficient of the first thermal deformation layer is larger than that of the second thermal deformation layer, the conductive contact is arranged at the end, suspended in the vacant groove, of the cantilever probe, the first thermal deformation layer and / or the second thermal deformation layer are / is a conductive layer, and the conductive layer is electrically connected with the conductive contact. The cantilever probe card solves the problems that an existing probe card is insufficient in butt joint precision and prone to poor contact, automatic contact of the probe is achieved, and effective contact between the cantilever probe anda chip to be detected can be guaranteed.

The invention provides a Micro-LED test circuit, device and method. The test circuit comprises a first metal lead, a second metal lead, a first test electrode and a second test electrode. The first metal lead is connected with an anode of an LED of a wafer and extends to the outer side of an epitaxial wafer or a light-emitting area of the wafer; the second metal lead is connected with the cathode of the LED of the wafer and extends to the outer side of the epitaxial wafer or the light-emitting area of the wafer; the first test electrode is located on the extension section of the first metal lead; the second test electrode is positioned on the extension section of the second metal lead; and when the first test electrode and the second test electrode are electrically connected with external test equipment respectively, batch test is carried out on the LEDs of the wafer. According to the invention, the technical problem that the LED test efficiency of the wafer is low can be solved, batch test of wafer LEDs is realized, and the test efficiency is significantly improved.

The embodiment of the invention discloses an optical fiber cutting head zero focus measurement system and method, and relates to the technical field of laser processing. The optical fiber cutting headzero focus measurement system is applied to detecting of an optical fiber cutting head and comprises an optical fiber light-entering point stimulation jig, a cutting nozzle end surface stimulation jig and a lens integrated measuring instrument; the optical fiber light-entering point stimulation jig is mounted at a light-entering opening of the optical fiber cutting head, and the cutting nozzle end surface stimulation jig is mounted at a cutting nozzle of the optical fiber cutting head; and the optical fiber cutting head is arranged on the lens integrated measuring instrument, wherein the lensintegrated measuring instrument emits a first testing light ray and a second testing light ray for measuring of the zero focus absolute height and the cutting nozzle absolute height. According to theoptical fiber cutting head zero focus measurement system, the accuracy of zero focus measurement of the optical fiber cutting head is improved, meanwhile, operation is easy, and batched testing of the optical fiber cutting head can be achieved.

The invention provides a memory test device and a test method. The memory test device comprises a test control module and a test execution module, the test control module comprises a control chip anda first communication chip, and the control chip is in communication connection with the first communication chip; the test execution module comprises a second communication chip and a plurality of test execution groups, and the plurality of test execution groups are in communication connection with the second communication chip; the test execution group comprises a terminal capable of mounting atested memory; and the first communication chip is electrically connected with the second communication chip. Batch automatic testing can be carried out on the memory banks, the testing efficiency isgreatly improved, a C2 control chip is adopted in the testing control module, the structure is simple, a special control server is not needed, and the cost is saved.

The invention relates to the technical field of communication, in particular to a radiated spurious test method, a radiated spurious test device, a radiated spurious test system, a computer readable medium and electronic equipment. The method comprises the following steps: controlling a reference signal source to transmit a calibration reference signal in a test environment so as to obtain space compensation data; controlling a test machine to transmit a first radio frequency signal corresponding to a first test state in the test environment so as to obtain a first receiving signal; acquiringa first test signal of the test machine in the first test state in combination with the first receiving signal and the spatial compensation data; and comparing the first test signal with a preset threshold to obtain a first test result corresponding to the first state. According to the scheme of the invention, the method can achieve the quick radiated spurious testing of the terminal equipment based on the near-field coupling principle, reduces the testing time, can cover more testing machines, and achieves the batch testing.

The invention provides a metering chip reference voltage measurement device and method. According to the method, a metering chip measurement circuit is electrically connected with an SOP-DIP converter. A metering chip to be measured is electrically connected on the surface of the SOP-DIP converter. The reference voltage value of the metering chip to be measured in the metering chip measurement circuit is read by using a universal meter. The difference value between the reference benchmark voltage value and the reference voltage value of the metering chip to be measured read by the universal meter is calculated and whether the difference value is within the allowable error value is judged so that the performance of the metering chip to be measured is monitored and batch testing of the metering chip can be realized. Batch testing of the core device, i.e. the metering chip, of the electric energy meter can be realized, and the performance of the metering chip can be monitored by detectingthe reference voltage value of the metering chip so as to guarantee the metering accuracy of the electric energy meter and maintain the vital interests of the user and the state grid.

The embodiment of the invention provides an IC card distortion testing device. The device mainly includes two oppositely-placing combined devices; each combined device is provided with an IC card testing rack, each IC card testing rack is provided with at least one transmission wheel, and each IC card testing rack is connected with a distortion rotation motor through a transmission shaft; IC cards are arranged between the transmission wheels on the two IC card testing racks on the two combined devices; the two distortion rotation motors rotate a certain angle in the opposite directions, and the two distortion rotation motors drive the IC card testing racks through the transmission shafts to rotate the same angle in the opposite directions, so that the IC cards are twisted at the same angle. The device provided by the embodiment of the invention achieves IC card transfer function and IC card distortion testing function, can achieve IC card batch testing, also can perform distortion fatigue pressure testing on the IC cards, and changes the distortion quantity and the distortion direction of the IC cards by changing the motor rotation angles and direction parameters.