Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and system for automatically guiding server in batch testing

A technology of batch testing and automatic guidance, applied in faulty hardware testing methods, faulty computer hardware detection, functional testing, etc., can solve problems such as inability to realize automation, improve test efficiency, ensure correctness, and avoid scanning errors Effect

Inactive Publication Date: 2018-07-13
ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
View PDF6 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a method and system for automatically guiding server batch testing, aiming to solve the problem that the operator needs to manually input SN and order information when the server is turned on and tested, and cannot realize automation, so as to realize automated testing and avoid manual testing. Operation errors caused by input, improve test efficiency and accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and system for automatically guiding server in batch testing
  • Method and system for automatically guiding server in batch testing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0034] In order to clearly illustrate the technical features of the present solution, the present invention will be described in detail below through specific implementation methods and in conjunction with the accompanying drawings. The following disclosure provides many different embodiments or examples for implementing different structures of the present invention. To simplify the disclosure of the present invention, components and arrangements of specific examples are described below. Furthermore, the present invention may repeat reference numerals and / or letters in different instances. This repetition is for the purpose of simplicity and clarity and does not in itself indicate a relationship between the various embodiments and / or arrangements discussed. It should be noted that components illustrated in the figures are not necessarily drawn to scale. Descriptions of well-known components and processing techniques and processes are omitted herein to avoid unnecessarily lim...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a method and system for automatically guiding a server in batch testing. The method comprises the following steps that a mainboard BMC MAC address, an SN and an order number arescanned; a binding relation between mainboard BMC MAC address information and SN and order number information is established; during start-up testing, the mainboard BMC MAC address of the current server is read; according to the mainboard BMC MAC address of the current server and the binding relation established between the mainboard BMC MAC address information and the SN and order number information, the SN and order number of a machine are determined; according to the SN and the order number, the type of the current server is determined, and a testing program is downloaded. The binding relation between the mainboard BMC MAC address information and the SN and order number information is established, the testing program of the corresponding type is automatically acquired according to themainboard BMC MAC address information during start-up testing, batch testing of the server is achieved, and the problems are solved that during start-up testing of the server, an operator needs to manually input the SN and order number information, and automation cannot be achieved.

Description

technical field [0001] The invention relates to the field of server testing, in particular to a method and system for automatically guiding server batch testing. Background technique [0002] In the current server manufacturing factory, after assembling the complete machine, it must be tested to ensure that the configuration of the complete machine to be shipped meets the requirements, the function is good, and the performance is stable. [0003] At present, most of the machine testing methods use the PXE test network. When the test machine is connected to the PXE test network, the test system is downloaded, the test program is automatically started, and the registration interface pops up, prompting the operator to input SN, order number and other information, and then according to the input Determine the PN and model of the machine based on the information, and download the test components corresponding to the model to start testing. [0004] After the machine is turned on...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F11/26
CPCG06F11/2273G06F11/26
Inventor 王佩孙连震
Owner ZHENGZHOU YUNHAI INFORMATION TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com