60results about How to "High temperature resolution" patented technology

The invention discloses a high-stability length expansion die quartz temperature sensor provided with non-contact electrodes and relates to the field of sensors. The sensor comprises a packaging bodyand a resonance component located in the packaging body, wherein the resonance component is made of a quantity crystal; and the resonance component is of an integrated structure and comprises a base with two I-shaped beams, a supporting frame, m comb pieces and n resonance arms, wherein the m comb pieces and the n resonance arms are located in the supporting frame, m and n are both positive integers, m is greater than n, and the quantity of the metal electrodes on the m comb pieces is 2n. A new structure of the multi-resonance-arm length expansion die quartz temperature sensor which is provided with the non-contact electrodes and can prevent and suppress leakage of resonance energy of the resonance arms is disclosed, a non-contact electrode structure which is made of a high-temperature-resistant and aging-resistant four-layer composite metal thin film is groped, therefore, the maximum working temperature can reach 300 DEG C or above, thermal hysteresis is lowered, and the long-term stability of the sensor is improved.

Thermal-type infrared imaging device comprises an infrared ray detection unit in which pixels, each of which includes a bolometer, are arranged two-dimensionally; and a signal processing unit that sequentially reads signal of each bolometer in synchronization with switching operation of a horizontal shift register and a vertical shift register, integrates the read signal using an integration circuit, and outputs the integrated signal. The signal processing unit is configured so that it can set a sensitivity (for example, voltage applied to bolometer, capacitance of a capacitor in the integration circuit, and / or period of time for integrating the signal) for each pixel according to a predetermined pattern in synchronization with switching operation for classifying a plurality of pixels into a plurality of types of pixels for which different sensitivities are set, for example, high-sensitivity pixels 15 with a narrow temperature measurement range and a high temperature resolution and low-sensitivity pixels 16 with a wider temperature measurement range and a lower temperature resolution than those of the high-sensitivity pixels 15.

An infrared sensor and infrared imaging system, wherein said infrared sensor comprises: a first film structure, a second film structure, a gap between said first film structure and said second film structure. Reference light is incident from one of said first film structure and said second film structure. When said gap distance changes, the intensity of transmitted reference light changes, and the intensity of reflected reference light changes. When infrared light is incident, at least one of the said first and second film structures absorbs infrared light and the temperature changes, causing said gap distance to change. By detecting the intensity of said transmitted reference light or reflected reference light, the incident infrared light can be measured.

The invention discloses a measuring device and method for a phase interface of a composite phase change material melting / solidifying process based on a thermochromic liquid crystal. The device is applied to the field of thermal storage of a composite phase change material with high thermal conductivity and is composed of a hot end, a cold end, a testing main body and a data acquisition system, wherein the testing main body is internally provided with a thermal storage cavity, a thermochromic liquid crystal layer, an isolation layer and a vacuum glass layer. The visualized measurement of the wall surface temperature of the thermal storage cavity and a solid liquid interface of the composite phase change material is realized by utilizing the characteristics of reversible thermochromism, hightemperature resolution, high spatial resolution and high response speed of the thermochromic liquid crystal layer; by utilizing the isolation layer, the response speed of the thermochromic liquid crystal is increased, and influences to thermal transfer in a thermal storage body are reduced; the conflict between visualized measurement and device thermal insulation is solved by utilizing the vacuumglass layer; and the temperature of the hot end / the cold end is monitored by utilizing the data acquisition system. The measuring device and method are used for realizing the visualized measurement of a composite phase change material melting / solidifying phase interface and a temperature field change process while realizing thermal insulation and is conductive to the research of a thermal transfer process of the composite phase change material in a differential thermal square cavity.