The invention discloses a method for controlling the distance from a needle point of an atomic force
microscope to a sample by the aid of a
quartz tuning fork and an atomic force
microscope system with a
quartz tuning fork. The atomic force
microscope system is built on the basis of the method, and comprises an atomic force needle (1), a
quartz tuning fork detector (2), a
quartz tuning fork driving and detecting circuit (3), a three-dimensional sample position controller (4), an atomic force microscope controller (5) and other facilities of an atomic force microscope, and the other facilities of the atomic force microscope include a shock-resistant isolation component, a needle feeding
motor controller (6) and the like. The
quartz tuning fork driving and detecting circuit (3) comprises a
signal source A and a
signal source B, the amplitude of the
signal source A and the amplitude of the
signal source B are identical, the phase position of the
signal source A is opposite to the phase position of the
signal source B, the frequency and the amplitude of each signal source can be adjusted simultaneously, the signal source B is connected with a
capacitor, and the signal source A is connected with the
quartz tuning fork detector. The other end of the quartz tuning fork
detector is connected with the other end of the
capacitor and a
resistor, and the other end of the
resistor is grounded.
Voltage difference between two ends of the
resistor is amplified by an
amplifier and then is outputted in a phase lock manner.