Atomic force microscope system with quartz tuning fork

Abstract

The invention discloses a method for controlling the distance from a needle point of an atomic force microscope to a sample by the aid of a quartz tuning fork and an atomic force microscope system with a quartz tuning fork. The atomic force microscope system is built on the basis of the method, and comprises an atomic force needle (1), a quartz tuning fork detector (2), a quartz tuning fork driving and detecting circuit (3), a three-dimensional sample position controller (4), an atomic force microscope controller (5) and other facilities of an atomic force microscope, and the other facilities of the atomic force microscope include a shock-resistant isolation component, a needle feeding motor controller (6) and the like. The quartz tuning fork driving and detecting circuit (3) comprises a signal source A and a signal source B, the amplitude of the signal source A and the amplitude of the signal source B are identical, the phase position of the signal source A is opposite to the phase position of the signal source B, the frequency and the amplitude of each signal source can be adjusted simultaneously, the signal source B is connected with a capacitor, and the signal source A is connected with the quartz tuning fork detector. The other end of the quartz tuning fork detector is connected with the other end of the capacitor and a resistor, and the other end of the resistor is grounded. Voltage difference between two ends of the resistor is amplified by an amplifier and then is outputted in a phase lock manner.

Description

technical field [0001] The invention relates to an atomic force microscope system, which is characterized in that the distance between the needle point and the sample is controlled by a quartz tuning fork. Background technique [0002] In 1986, Gerd Binning and Heinrich Rohrer of Zurich Laboratory in Switzerland developed the world's first Atomic Force Microscope (AFM). AFM enables humans to observe in real time the arrangement of single atoms on the surface of matter and the physical and chemical properties related to the surface electronic behavior. It has great significance and broad application prospects in the research of surface science, material science, life science and other fields. Its basic working principle is: use the tip on the flexible cantilever which is extremely sensitive to weak force to scan the surface of the sample, the interaction force between the tip and the sample surface makes the cantilever produce slight bending, and use the principle of optical ...

AI Technical Summary

Problems solved by technology

However, before using the atomic force microscope to observe the sample, the user must adjust multiple knobs of the optical lever to obtain a good image, which requires high experience and ability of the operator

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