Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Nonlinear-fitting infrared non-uniform correction method based on time-domain Kalman filtering correction

A Kalman filtering and non-linear fitting technology, applied in image data processing, instrumentation, computing, etc., can solve problems such as inconsistent output response of infrared focal plane detectors, image degradation, etc.

Inactive Publication Date: 2012-11-14
NAT UNIV OF DEFENSE TECH
View PDF2 Cites 17 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] The purpose of the present invention is to provide a non-uniform infrared image correction method to solve the problem of image degradation caused by inconsistent output responses of infrared focal plane detectors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Nonlinear-fitting infrared non-uniform correction method based on time-domain Kalman filtering correction
  • Nonlinear-fitting infrared non-uniform correction method based on time-domain Kalman filtering correction
  • Nonlinear-fitting infrared non-uniform correction method based on time-domain Kalman filtering correction

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0048] The present invention will be further described below in conjunction with the accompanying drawings.

[0049] Figure 2 to Figure 5 As a result of the experiment, the abscissa is the image frame number, and the ordinate is different image non-uniformity description parameters. When utilizing the first step of the present invention to carry out parameter estimation in the experiment, select four different temperature points T 1 , T 2 , T 3 , T 4 They are 15°C, 25°C, 40°C, and 55°C respectively. The infrared images to be corrected at the temperature point T are processed, and the values ​​of the temperature T are 20°C, 50°C and 40°C respectively.

[0050] figure 2 (a) is the change curve of the gray mean square error of the infrared image sequence at 20°C, the left picture is the result before correction, and the right picture is the result after correction; figure 2 (b) is the non-uniformity change curve of the infrared image sequence at the temperature point of...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a nonlinear-fitting infrared non-uniform correction method based on time-domain Kalman filtering correction. The technical proposal is as follows: firstly, assuming that a response change curve of each array unit of an infrared focal plane detector is continuous on time, and using a high-order multi-parameter nonlinear polynomial to fit and describe the response change curve; secondly, acquiring a response output value of each array unit at four different temperature points, using a nonlinear equation solution method to determine a plurality of parameters in each array unit response expression; thirdly, using time-domain Kalmn filtering to carry out time-shift correction on each parameter in the response expression for solving a problem that the detector response shifts with the time, and acquiring an analysis expression of the response curves of the detector array unit; and finally, using the analysis expression to calculate the response output of each array unit of the detector under any time and any temperature conditions. The nonlinear-fitting infrared non-uniform correction method realizes the correction of inconsistent response of the detector and solves non-uniformity problem of the infrared image.

Description

technical field [0001] The invention belongs to the technical field of infrared image preprocessing, and relates to a method for non-uniform correction of infrared images. Background technique [0002] Non-uniform correction of infrared images is an important research direction in the field of image processing. The main purpose of infrared image non-uniformity correction is to use image processing methods to solve the problem of inconsistent detector output response due to material defects, circuit stability and integration process level limitations, so that the corrected image is convenient for subsequent processing. At present, the main methods of infrared image non-uniformity correction can be divided into two categories: temperature calibration correction method based on reference source and adaptive correction method based on scene. The basic principles and technical characteristics of these two types of methods are as follows: [0003] 1. Temperature calibration and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T5/00
Inventor 张焱杨卫平李吉成鲁新平张志龙石志广
Owner NAT UNIV OF DEFENSE TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com