3113 results about "Multi parameter" patented technology

The present invention relates to the field of x-ray imaging. More particularly, embodiments of the invention relate to methods, systems, and apparatus for imaging, which can be used in a wide range of applications, including medical imaging, security screening, and industrial non-destructive testing to name a few. Specifically provided as embodiments of the invention are systems for x-ray imaging comprising: a) a first collimator-and-detector assembly having a first operable configuration to provide at least one first dataset comprising primary x-ray signals as a majority component of its data capable of being presented as a first image of an object subjected to x-ray imaging; b) a second collimator-and-detector assembly having a second operable configuration or wherein the first collimator-and-detector assembly is adjustable to a second configuration to provide at least one second dataset comprising primary and dark-field x-ray signals as a majority component of its data capable of being presented as a second image of the object; and c) a computer operably coupled with the collimator-and-detector assemblies comprising a computer readable medium embedded with processing means for combining the first dataset and the second dataset to extract the dark-field x-ray signals and produce a target image having higher contrast quality than the images based on the first or second dataset alone. Such systems can be configured to comprise at least two collimator-and-detector assemblies or configurations differing with respect to collimator height, collimator aperture, imaging geometry, or distance between an object subjected to the imaging and the collimator-and-detector assembly.