129 results about "Sample rotation" patented technology

A solid-state nuclear magnetic resonance probe that includes multiple sample spinning systems and detection coils is disclosed. The probe can be repositioned within the bore of the magnet to selectively maximize the throughput and sensitivity of the instrument by acquiring a spectrum from one sample at a time while at least one other sample is at or returning to an equilibrium spin state. Methods for the utilization of the probe are also disclosed.

Generally, and in one form of the present invention, is a polarization-maintaining fiber-based polarization sensitive optical low coherence reflectometer for depth resolved birefringence measurement. With the present invention, linear birefringence of a sample may be measured from data recorded in a single A-Scan. In addition, the present invention provides for the simultaneous measurement of retardation and orientation of birefringent axes, wherein measured retardation is insensitive to sample rotation in the plane perpendicular to ranging.

The related liquid surface and interface dynamic behavior test and analysis device based on high-speed image process comprises: with a general platform, arranging an optical system, a video imaging system, a control system for locating and feeding, a rotating platform, a LED monochromatic cold light source, and a computer-control light modulation system. This invention has well effect and reliability.

A metrology system that uses an imaging system to monitor alignment features on the sample or sample holder of an X-ray laminography or tomography system. the metrology system has the capability to provide both sample shift and sample rotation movement data to a data acquisition system. These shift and rotation data can be used in alignment routines to produce 3D reconstructions from the X-ray images / projections. The metrology system is based on an imaging and focusing measurement of intrinsic feature of the sample or artificial features fabricated on the sample or sample holder.

The invention discloses a method and device for measuring thickness and refractive index of a thin film and an application thereof. The method comprises the following steps of: projecting at least three light beams onto the same point or position on the surface of a thin film sample in different incident angles, receiving intensity of a reflected light beam by an array photoelectric detector, comparing the intensity with the light intensity of an incident light beam, calculating the refractive index of each light beam, and finally fitting with a theoretical formula to obtain the thickness and the refractive index of the thin film to be measured. The device comprises a power supply, a transmission grating, a diaphragm, a condenser lens, a polarizer and a sample rotating platform are sequentially arranged along optical axis; axis of the sample rotating platform is coincided with the axis of a photoelectric detector rotating platform, wherein the diameter of the photoelectric detector rotating platform is more than the diameter of the sample rotating platform; and a photoelectric detector, a signal sampling, amplifying and AD conversion circuit and a computer which are arranged on the photoelectric detector rotating platform are sequentially connected. The method and device disclosed by the invention have the characteristics of fast measuring speed and high spatial resolution, and integrated circuits (IC) and / or functional thin-film devices can be detected in a large scale.

An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polarized illumination beam at non-normal incidence onto a periodic structure on a sample, can measure optical properties of the periodic structure. An E-O modulator in the illumination path can modulate the polarization. The head optics collect light reflected from the periodic structure and feed that light to a spectrometer for measurement. A beamsplitter in the collection path can ensure both S and P polarization from the sample are separately measured. The measurement head can be mounted for rotation of the plane of incidence to different azimuthal directions relative to the periodic structures. The instrument can be integrated within a wafer process tool in which wafers may be provided at arbitrary orientation.

The invention relates to a multifunctional high-efficiency laser damage test device and method in a vacuum environment. Five samples can be placed on a sample stage in a vacuum chamber at one time; the samples can be sequentially rotated to the laser irradiation position for testing laser damage by rotating the sample stage; online monitoring and judgment of damage conditions can be realized by using an online imaging and scattered light detection device of a CCD (Charge Coupled Device) camera and a pressure detection element; and the samples can also be rotated to an observation window and then the damage morphology of the samples is observed in an off-line manner and analyzed. Meanwhile, the function that front sides and back sides of the samples are respectively irradiated by laser can be achieved by using the rotation of the sample stage. The device is simple and easy to operate; according to the device, the data test time in the vacuum environment is greatly saved and the efficiency of damage test is increased; and meanwhile, test method and functions are diversified and comprehensive damage information can be obtained.

The invention discloses a multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device. A synchrotron radiation X-ray light source, an undulator, a monochromator crystal, an X-ray shutter, a first lifting platform, a focusing device cavity, a vacuum piping, a second lifting platform, a multi-purpose sample room, a vacuum piping, a third lifting platform, a detector, and a computer which is used for collecting data and controlling an electric controlled translation platform are sequentially and coaxially arranged along the forward motion direction of light beam, wherein the monochromator crystal, the X-ray shutter and the first lifting platform are arranged on an electrical rotary platform, the focusing device cavity, the vacuum piping and the second lifting platform are arranged on the first lifting platform, the multi-purpose sample room, the vacuum piping and the third lifting platform are arranged on the second lifting platform, and the detector and the computer are arranged on the third lifting platform. According to the multi-purpose synchrotron radiation coherent X-ray diffraction microscopic imaging device, a low vacuum operating mode, a ventilation working mode, a freezing operating mode, X-ray focusing mode imaging or X-ray non-focusing mode imaging are achieved, the collection of three-dimension diffraction signals of samples are achieved by using a three-dimension rotating platform, a high quality three-dimension rebuilding result is obtained by using computer software, dying treatment and slicing treatment to the samples are needless, and train of thought is supplied to enrich a synchrotron radiation beam line imaging method.

In an ion milling system and an ion milling method for making unnecessary the effort of resetting a sample in a sample stage mechanism whenever a machining region is changed, the system includes an ion gun that generates an ion beam with which a sample is to be irradiated, a sample chamber within which the sample to be subjected to irradiation processing by the ion beam is put, an exhaust that evacuates air in order to maintain vacuum in the sample chamber, a gas injection mechanism that injects ion-generating gas, and a sample stage mechanism in which the sample is placed and which rotates with the sample set thereon. The sample stage mechanism has a rotary table that rotates with the sample set thereon, a rotating mechanism that drives the rotary table, an eccentric mechanism capable of eccentrically adjusting a positional relationship between a rotation center axis of the rotary table and a centerline of the ion beam, and a sample position adjusting mechanism capable of eccentrically adjusting a positional relationship between a centerline of the sample set on the sample stage and the rotation center axis of the rotary table.

The invention discloses a multifunctional X-ray orientation device and a method, and belongs to the field of single crystal material processing. The multifunctional X-ray orientation device comprises a working table, a radiation-proof protection cover, an X-ray generating system, a diffracted-ray receiving system, a crystal sample rotating table and a computer control system. A sample containing table in the crystal sample rotating table can be replaced through detachable bolts. The method includes the steps that the multifunctional X-ray orientation device is used to carry out crystal defect identification, different crystal characteristic measurement, manual orientation measurement and angle error obtaining. The multifunctional X-ray orientation device is integrated with an X-ray orientation device measurement system for a plurality of single crystals, the device cost is reduced, and the product homogeneity is guaranteed; detection data of all single crystal materials is fused and finished, the defect types of the single crystal materials are obtained in an intelligent mode, and the utilization efficiency of existing data is improved; a scintillation detector is used as an X-ray detector, the stability degree is high, the anti-interference capability is high, and the defects of a Geiger pipe are recovered.

The invention discloses a three-dimensional terahertz tomography system, a scanning method and an image reconstruction method thereof. The three-dimensional terahertz tomography system comprises a terahertz emitting source, a wave chopper, a sample rotation translation table, a light beam transmission unit, a terahertz detector and a lock-in amplifier. The imaging method comprises a scanning method for acquiring projection data and an image reconstruction method. According to the present invention, when a sample is scanned by the imaging system, only the single-frequency transmitted light intensities of each detection point are required to be recorded, such that the imaging time is reduced, and the power is high so as to image the thick object; when the image reconstruction is performed according to the projection data, the absorption rate distribution of the sample at the angle according to the projection data at each angle is obtained, and the absorption rate distribution and the terahertz light beam light intensity distribution are subjected to deconvolution, such that the actual absorption rate distribution of the sample can be obtained; and with the imaging method and the system of the present invention, the problem that the light approximation on the terahertz light beam can cause the blurred image in the existing imaging technology can be effectively solved.

A focused ion beam system capable of acquiring surface structure information, internal structure information, and internal composition information about a sample simultaneously from the same field of view of the sample. A method of sample preparation and observation employs such focused ion beam system to accurately set a sample processing position based on information about the structure and composition of the sample acquired from multiple directions of the sample, and to process and observe the sample. The system includes, in order to acquire the sample structure and composition information simultaneously, a secondary electron detector, a transmission electron detector, and an energy dispersive X-ray spectroscope or an electron energy loss spectroscope, and employs a stub having the sample rotating and tilting function. The method includes a marking process.

The invention relates to a corrosion simulation test method and a relative device, which is characterized in that the invention uses one motor to rotate the sample rotation shafts in a plurality of autoclaves, respectively fixes and connects the motor and autoclaves with one rotary mount capable of being positioned, and adjusts the inclination angle of the mount to realize the sample corrosion simulation test under variable flow forms in the autoclaves. The device comprises a base which can be rotationally connected with a mount, a motor on the top of the mount, a plurality of autoclaves in the bottom of the mount, a multi-concave-channel belt wheel fixed on the extrusion shaft of the motor while the extrusion end of the sample rotation shaft in each autoclave is fixed with a multi-concave-channel belt wheel and each concave channel on the multi-concave-channel belt wheel is connected with one belt relative with the multi-concave-channel belt wheel on one sample rotation shaft. The invention is suitable for simulating the corrosion tests of collecting and feeding pipe of oil and natural gas.

The invention discloses an optical three-dimensional correlation identification device based on an integrated imaging system and an identification method. The device comprises a three-dimensional information acquisition device and a correlation identification system, wherein the three-dimensional information acquisition device comprises a sample rotation device, an optical microscope, a diffuse transmission element, a micro lens array, an imaging lens and a computer, the correlation identification system comprises a laser device, a first reflective mirror, a second reflective mirror, a reverse telescope system, a spatial light modulator, a first Fourier light transmission mirror, a third reflective mirror, a diaphragm, a light refractive crystal, a second Fourier light transmission mirror, a second CCD sensor and a spatial light modulator. The device has advantages of good amplification capability, high imaging quality, comprehensive three-dimensional information and excellent identification effect.

A magazine-type sample rotation body (7) is arranged in a high frequency chamber (5) so that it rotates away from the horizontal, the body (7) accommodating, in fixed location, reactor blocks (10) that are sealed or sealable from fluids such that fluids contained in sample vessels in the reactor blocks can be mixed before, during and after high frequency exposure because of the rotational movement of the sample rotation body.

An optical measurement system for evaluating a sample has a motor-driven rotating mechanism coupled to an azimuthally rotatable measurement head, allowing the optics to rotate with respect to the sample. A polarimetric scatterometer, having optics directing a polarized illumination beam at non-normal incidence onto a periodic structure on a sample, can measure optical properties of the periodic structure. An E-O modulator in the illumination path can modulate the polarization. The head optics collect light reflected from the periodic structure and feed that light to a spectrometer for measurement. A beamsplitter in the collection path can ensure both S and P polarization from the sample are separately measured. The measurement head can be mounted for rotation of the plane of incidence to different azimuthal directions relative to the periodic structures. The instrument can be integrated within a wafer process tool in which wafers may be provided at arbitrary orientation.

A three-dimensional measuring apparatus for fabric pendency based on grating fringe comprises main driving system, elevation system, optics system and image collection system. The sample rotation step motor (5) controls the rotation of rotation platform (17), and elevation platform step motor (7) controls the up and down movement of elevation platform, and step motor (11) controls the up and down movement of ring reflection pyramidal face (14). The diffused light sent by point source (6) is converted into parallel light by ring paraboloid (8) and then forms light and shade even grating fringe with clear outline on the three dimensional surface of the fabric to be measured through ring reflecting pyramidal face (14) with 45 degree angle and two grating molds (9). The image collection (21) directly gets two-dimensional contour chart of the sample, which is processed by computer to get three-dimensional outline curved surface. And it can realize the whole dynamic and static measuring of the fabric and stepless speed regulating realizes the continuity of pendency dynamic and static measuring.

The present invention discloses an imaging system which comprises the following components: a sample carrying table which is placed with a sample to be imaged; a beam source part which radiates beam; a beam detecting collecting part which receives a beam image; a rotation control part which has two ends respectively fixedly connected with the beam source part and the beam detecting collecting part and drives the beam source part and beam collecting part to rotate; and a computer which transmits control instruction to the beam source part, the rotation control part and the detecting collecting part and receives the image received by the beam detecting collecting part for imaging processing. The invention also correspondingly provides an imaging method. According to the imaging method, an expected imaging requirement is input. The related parameters are calculated. A control instruction is transmitted. The beam source part and the beam detecting collecting part are fixed at two ends of the rotation control part. According to the control instruction, the beam source part radiates beam, the beam detecting collecting part collects the projection image of beam after transmitting the sample. The projection image is executed with imaging. The invention settles the problems of deformation and motion artifact caused by sample rotation.

The invention discloses an automatic online near infrared spectrum detecting device and a control method. The device comprises two parts, namely, an automatic sample feeding system and a near infrared spectrum acquisition system, wherein the automatic sample feeding system comprises an intermittent sample feeding mechanism and a sample rotating mechanism which is positioned above the intermittent sample feeding mechanism; the near infrared spectrum acquisition system comprises a diffuse reflection and diffuse transmission integrated acquisition light path and a light source adjustment and control mechanism thereof. The invention innovatively provides that two acquisition modes for diffuse reflection and diffuse transmission are integrated in one spectrum detecting device; multi-station automatic feeding is provided; the adjustability of the angle of a light source and the rotation of a sample to be detected are realized; the online detecting efficiency of a spectrograph is improved; comprehensive sample spectrum acquisition information can be obtained; great convenience is provided for scientific research and production.

The present invention provides a hand vein recognition method based on curve matching. The method comprises the steps of firstly scanning the vein branch curves according to the venous line endpoints and the intersection points, then extracting the characteristics of each curve, such as the curvature, the length, etc., and finally, realizing the reliable recognition of the hand veins by combining the coarse screening and the curve matching. Under the premise of enhancing the anti-interference ability of the characteristics, the inter-cluster distinguishing ability of the characteristics is improved, and the reliable recognition of the hand veins is realized. The hand vein recognition method based on curve matching of the present invention solves the problems that the sample rotation and translation influences the recognition, the algorithm matching speed is accelerated, etc., and the efficiency of the method accords with the requirements of a mode recognition system. The hand vein recognition method based on curve matching of the present invention enables the hand vein recognition performance to be improved effectively, and is widely used in an intelligent access control system.

A measurement jig having a position indicator is set so as to rotate integrally with a sample, and a magnified image of the position indicator formed by a microscope is picked up by an imaging camera at plural time points during the rotation of the sample. A movement locus of the magnified images picked up is founded, and position variation amount of a rotation center line of the sample is calculated on the basis of the found movement locus.

The invention provides a handheld grinding pan and a use method thereof and is used for grinding transmission electron microscope film samples. The handheld grinding pan is provided with an object stage, a fixed ring, a bearing and a balance weight; a sample is stuck to the bottom of the object stage by modified wax, and the object stage can move up and down in the fixed ring; when the handheld grinding pan is in grinding, the jacket of the bearing is held by the hand of a person; because friction action exists between the fixed ring and a grinding platform of a grinding and polishing machine, the fixed ring is driven by the grinding platform to passively rotate and further drives the object stage and the sample to rotate so as to obtain the ground sample with higher parallelism and planarity; meanwhile, the bottom periphery of the fixed ring is provided with a liquid guide groove so as to ensure that a material to be ground smoothly passes by and reaches the ground sample, the material can be stirred and recycled under the passive rotation, the loss of the material due to the centrifugal effect is reduced and the material is ground with high efficiency and high quality. The grinding pan can be also used for grinding common metallographic samples and has the advantages of simple operation, high efficiency, practicability, low price, and the like.

An ion milling device of the present invention is provided with a tilt stage (8) which is disposed in a vacuum chamber (15) and has a tilt axis parallel to a first axis orthogonal to an ion beam, a drive mechanism (9, 51) which has a rotation axis and a tilt axis parallel to a second axis orthogonal to the first axis and rotates or tilts a sample (3), and a switching unit which enables switching between a state in which the ion beam is applied while the sample is rotated or swung while the tilt stage is tilted, and a state in which the ion beams is applied while the tilt stage is brought into an untilted state and the sample is swung. Consequently, the ion milling device capable of performing cross-section processing and flat processing of the sample in the same vacuum chamber is implemented.

The invention discloses an intersection recognition method based on a GoogLeNet neural network. The intersection recognition method comprises the following steps: S1, sampling: selecting road networkdata of main cities throughout the country as a sampling source of a complex intersection sample; S2, constructing a Delaunay triangulation network: carrying out the initial positioning of the complexintersection, and preliminarily determining the central position and spatial range of the complex intersection; S3, enhancing the sample size: enhancing the sample size through sample simplification,sample rotation and mirroring; according to the method, a research hotspot GoogLeNet neural network in the field of machine vision is introduced into complex intersection recognition, and rapid and high-quality positioning of the OSM data complex intersection is realized in a mode of combining vector data and raster images.

A measuring device for calculating sample volumes and changes in sample volumes is disclosed. The device includes a rotatable platform upon which the sample is placed and rotated in increments with an image of the sample being recorded at each rotational position to which the sample is rotated. The recorded images are digitized and outlined such that the outline can be divided into a plurality of parallel slices. The volume of each slice is calculated by calculating the volume of each portion of the slice represented by each image. The portions are then summed to provide the volume of each slice with the volume of each slice then being summed to provide the volume of the total sample. The device further includes a display apparatus to enable an operator to not only view before and after calculated volumes, but to be provided with a graphical display of the shape of the sample both before and after an event which changes the volume of the sample.

The invention relates to a urine sampling device which comprises a sampling funnel, locking devices, a sampling device and a conduction device. The upper end of the sampling funnel is funnel-shaped, the lower end of the sampling funnel is of a square hollow structure, the left side and the right side of the upper end of the sampling funnel are respectively provided with the locking device, the lower end of the sampling funnel is provided with the sampling device, and the conduction device is arranged at the left end of the middle of the sampling funnel; each locking device comprises a height bracket, a connecting cross column, a locking fastener, a telescopic sliding column, a sliding column spring and a locking clamping plate. The sampling device comprises a sampling rotation plate, a sampling rotation shaft, a tensioning mechanism, a containing frame, a containing telescopic rod, a telescopic spring and a sampling clamping sleeve. The problems of incapability of automatically collecting midstream urine, possibility of pollution of the midstream urine, incapability of automatically controlling the amount of urine taken, occurrence of urine spillage during urine taking and the likewhen a man inconvenient to move performs urine taking are solved.

The invention discloses a clamping strip type full-automatic sample loading detection immunity analyzer which can perform colloidal gold immunity quantitative analysis and fluorescence immunity quantitative analysis and comprises a case, a sample rotating disc, a clamping strip rotating disc, a rotation driving device, a sample loading component, a detection component and an output component. The sample rotating disc and the clamping strip rotating disc are arranged on the case in a manner of being capable of rotating around own axes, and the rotation driving device is used for driving the sample rotating disc and the clamping strip rotating disc to rotate. Automatic conveying of sample tubes and detection clamping strips is realized respectively through the sample rotating disc and the clamping strip rotating disc, samples are automatically fetched from the sample tubes to be detected and released onto the corresponding detection clamping strips through the sample loading component, the samples complete the chromatographic process on the detection clamping strips and then are detected automatically by the detection component, and detection results are output by the output component finally. The immunity analyzer realizes automatic sample loading and automatic detection, errors caused by artificial operation are avoided, and the objectives of single-sample detection and small-lot continuous detection can be achieved. The immunity analyzer is simple in structure, and space and cost are saved.

The invention discloses a micro-nano structure inscribing device based on sample rotation and laser double-beam interference. The micro-nano structure inscribing device comprises a He-Cd laser, a photoelectric shutter, a short-focus lens, a long-focus lens, a beam splitter, a planar reflector A, a planar reflector B, a photoresist sample and a sample rotation control system, wherein a laser beam emitted from the He-Cd laser is split into two laser beams with equal intensity after passing through the photoelectric shutter, the short-focus lens, the long-focus lens and the beam splitter, is reflected by the planar reflector A and the planar reflector B and then irradiates the photoresist sample for exposure. By rotation of the photoresist sample and multiple times of double-beam interference exposure as well as selection for the wavelenth of the laser, various micro-nano structures such as a one-dimensional grating, a two-dimensional lattice, a hexagon, concentric equal-interval rings and vertical-horizontal two-dimensional rectangular lattices with different periods can be prepared by inscription. The micro-nano structure inscribing device disclosed by the invention has the advantages of simple structure and low cost, and has wide application in the field of manufacture of the micro-nano structure.