69 results about "Probe location" patented technology

A system for probing circuit elements, includes a panel fixture, probe holder and stage. The fixture has a platen surface to support a work piece having work piece surface. The work piece surface is substantially parallel to the platen surface and has a target element thereon. The probe holder is configured to support a probe for detecting a characteristic of the target element. A stage rotates the probe holder about an axis substantially orthogonal to the platen surface, to align the probe with probe locations associated with the circuit element, so that the characteristic of the circuit element can detected by the probe. Fixturing motion can be optimized for efficient work piece manufacturing. Calibration and vision subassemblies are also provided.

A three-dimensional (3-D) interactive display and method of forming the same, includes a transparent capaciflector (TC) camera formed on a transparent shield layer on the screen surface. A first dielectric layer is formed on the shield layer. A first wire layer is formed on the first dielectric layer. A second dielectric layer is formed on the first wire layer. A second wire layer is formed on the second dielectric layer. Wires on the first wire layer and second wire layer are grouped into groups of parallel wires with a turnaround at one end of each group and a sensor pad at the opposite end. An operational amplifier is connected to each of the sensor pads and the shield pad biases the pads and receives a signal from connected sensor pads in response to intrusion of a probe. The signal is proportional to probe location with respect to the monitor screen.

Apparatus and methods for testing conductive bumps or target test points on integrated circuits. A multiplicity of probes are extended through a support substrate. At least one of the multiplicity of probe locations include a second electrically isolated probe such that the test point is in contact with two probes. One of the two probes provides a voltage to the test point and the second probe sensing the voltage so as to provide a Kelvin connection.

Systems and methods for ultrasonic imaging of a jaw and coupling cushions suited for use in the mouth. The system includes a specially configured ultrasonic probe, a position locator module for defining a probe location and transmitting the definition to a central processing unit (CPU) and the CPU. The CPU is capable of receiving digital data from transducers in the probe and receiving the location of the probe and producing an image of at least a portion of a jaw. The method includes providing the ultrasonic probe, defining its location and communicating the location to a CPU and transmitting an signal from a transducer and receiving at least a portion of the signal at at least one of the transducers. The CPU receives transducer data and a location of the probe and produces an image of the at least a portion of the jaw. An ultrasonic coupling cushion is further disclosed.

Ultrasound-based systems are described for use in guiding subdermal probes during medical procedures. The systems include an ultrasound system in conjunction with a probe detection system. The probe detection system can be used to generate a virtual image of a probe in a subdermal environment such that the virtual image is highly correlated with the actual probe location in the subdermal environment. The probe used in the system can include a tag that can provide information concerning the probe characteristics to the probe detection system.

The invention provides an electrostatic microscope and a measurement method. The electrostatic microscope consists of a scan head, a low frequency voltage signal generator, a high frequency voltage signal generator, a low frequency vibration signal detector, a high frequency vibration signal detector and a controller; and the scan head comprises a probe, a probe location inductor, a piezoelectric vibration exciter and a piezoelectric scanner. Based on an existing electrostatic force microscope, a higher order eigenvibration mode of the probe is adopted to measure electrostatic force. As interaction of the probe and the sample is different in different vibration modes, the corresponding performance is different in aspects such as resolution, sensitivity, stability and the like. The electrostatic microscope can help significantly improve spatial resolution of the electrostatic force microscope in atmospheric environment.

This invention is directed to an automatic inspection system of welding spots in the car body and a control method thereof, the automatic inspection system comprising a controller and a robot arm, a probe device, and a visual system, wherein the robotic arm holds a camera and the probe device, the probe device targets at car body welding spot and form the first included angle with the camera. Many lighting sources are distributed around the camera, which form the second included angle with the camera. The camera is connected with Image Collecting and Processing Device to obtain position data of welding spot in the car body, the controller is connected with Image Collecting and Processing Device by network, and foresaid controller rectifies position of the probe on the robotic arm according to the position of welding spot in the car body.

Apparatus and methods are provided for measuring thread leads or pitches using a metrology probe. The probe may be, for example, either a contact probe or a laser probe. The probe is mounted on the end of an articulating arm that has sensors to provide precise three-dimensional coordinates of the probe's location and orientation. The probe determines surface coordinates of the threaded object repetitively in different locations according to a program provided by a computer connected to the arm. When enough data have been gathered, the computer calculates and outputs a surface profile of the threaded object, including a lead or pitch measurement.

An apparatus and method for tracing back a probing location to identify the circuit element being probed on a device under test (DUT). The coordinates of the irregularity on the DUT are used to trace back to the logic cone to decipher the root-cause of the irregularity. The Def and Lef files are interrogated using the coordinates to obtain the cell and net data to enable the investigation. Additionally, a schematic viewer is used to investigate the logic cone to potential root-causes for the irregularities.

Acoustic system for leak detection. The system includes a disk-shaped probe for insertion into fluid flowing within a pipe. The probe has a convex front surface facing in the flow direction and a substantially flat rear surface. The probe further includes wheels to engage a pipe wall to maintain the probe's orientation within the pipe. At least one pressure sensor is embedded in the probe and is responsive to pressure changes resulting from a leak in the pipe wall. Data collection circuitry is disposed in the probe to receive probe location data and to receive an acoustic signal from the pressure sensor from which the pressure and location of a leak may be determined.

Techniques for automating test pad insertion in a printed circuit board (PCB) design and fixture probes insertion in a PCB tester fixture are presented. A probe location algorithm predictably determines respective preferred probing locations from among respective sets of potential probing locations associated with a number of respective nets in a PCB design. Test pads, preferably in the form of bead probes, are added to the PCB design at the respective preferred probing locations along with, where feasible, one or more alternate probing locations chosen from among remaining ones of the respective sets of potential probing locations. During fixture design, nets with multiple test pads implemented in the PCB design are processed by the same probe location algorithm used during PCB design to determine the associated preferred probing location and any associated alternate probing locations for said respective nets. Fixture probes are preferably inserted in the PCB tester fixture design at respective preferred probing locations to exactly align with corresponding preferred test pads of a PCB implemented in accordance with the PCB design should the PCB be mounted in a printed circuit board tester fixture implemented in accordance with the PCB tester fixture design.

The invention discloses an automatic ultrasonic probe location method based on gasbag drive and air pressure detection. The method comprises two ultrasonic probes which are oppositely arranged, and comprises the following location steps: a, a pressure threshold is preset according to the age information of a testee; b, the ultrasonic probes are connected with a gasbag by guide rails, an air pump is controlled to inflate the gasbag, and an ultrasonic probe mechanism is slowly pushed by the gasbag to move along the guide rails; c, a current pressure value is detected in real time by a pressure sensor, and when the pressure value reaches to the preset pressure threshold, the air pump is controlled to stop inflating; d, the distance between the two ultrasonic probes which are oppositely arranged is obtained. According to the automatic ultrasonic probe location method based on gasbag drive and air pressure detection, the probe mechanism is pushed to move in a way that the gasbag is inflated by using an air pump controller, different pressure thresholds are preset for testees of different ages by the matching of the pressure sensor, the self-adaption of movement of the ultrasonic probes is thus realized, and the location accuracy requirement is met.

This invention provides a calibration fixture that enables more accurate calibration of a touch probe on, for example, a CMM, with respect to the camera. The camera is mounted so that its optical axis is approximately or substantially parallel with the z-axis of the probe. The probe and workpiece are in relative motion, along a plane defined by orthogonal x and y axes, and optionally the z-axis and/or and rotation R about the z-axis. The calibration fixture is arranged to image from beneath the touch surface of the probe and, via a 180-degree prism structure, to transmit light from the probe touch point along the optical axis to the camera. Alternatively, two cameras respectively view the fiducial location relative to the CMM arm and the probe location when aligned on the fiducial. The fixture can define an integrated assembly with an optics block and a camera assembly.

A biodisc comprises a CD-type optical disc with small feature oligonucleotide probes disposed on its surfaces. The biodisc's probes are either custom-fabricated in-situ with a master-duplicate tandem arrangement of discs that allows one disc and a reading/tracking head to control the probe locations being synthesized pass-by-pass on the duplicate. Or the biodisc is mass-produced in a manufacturing process that includes a spin-on-and-peel (SOAP) method with nickel master for standardized biodisc oligonucleotide probes. In one embodiment of the invention, such biodisc is fabricated with four masks only, and these are shifted between depositions to synthesize particular individual 4-mer+ nucleotide probes.

A probe apparatus for probing a device on a semiconductor wafer to be tested by a testing equipment is provided. The probe apparatus includes a replaceable probe tile removably mounted in a probing location on a base plate. The probe tile is configured into a self-contained assembly which includes a chassis body containing a plurality of probes for probing devices on a wafer, a dielectric block for supporting the probes, and a wireguide for guiding a plurality of cables from the testing equipment into the chassis body. A wafer station having replaceable base plates and replaceable probe tiles are also provided.

A method for including probe locations in an integrated circuit may include specifying probe cells prior to the place and route stage of the design process. The probe cell locations may be specified in a functional description of the integrated circuit, such as an HDL description from which a netlist may be generated. Alternatively, an existing netlist may be edited to include the probe cells on specified nets. The probe locations are included in the physical layout design along with the rest of the integrated circuit components during place and route. The integrated circuit may be fabricated according to the physical layout design so that the fabricated integrated circuit includes the one or more probe locations.

The invention relates to an optimization method for probe location during immersion ultrasonic detection of filament winding composite material. As focusing rules and characteristics of focused transducers in water or the composite material and with different frequencies, wafer diameters and focal lengths are studied, formulas are given respectively for calculating the focal length F, the distance H from the probe to a piece and others when the reflection method and the transmission method are adopted for detection. Therefore the method for the optimization location of the focusing probe is given so as to improve the defect detection accuracy and the sensitivity during the detection and realize reliable detection for work pieces.

Techniques for automating probing location selection during printed circuit board (PCB) and corresponding PCB tester fixture design are presented. The invention includes a system and algorithm for selecting a probe layout comprising a set of probing locations for a printed circuit board design having a plurality of nets, at least some of which have a number of alternative possible probing locations. The system and algorithm iteratively generates a potential probe layout comprising one or more probing locations per net, and based on the potential probe layout, determines one or more regions of maximum deflection. A probing location from the potential probe layout that is located in a region of maximum deflection and is associated with a net having one or more alternative probing locations is removed from the potential probe layout and replaced in the with one of the one or more alternate probing locations associated with the net. Regions of maximum deflection are recalculated based on the modified potential probe layout, and the replacement process is repeated until respective magnitudes of the respective areas of maximum deflection are below a threshold value.