The present invention provides a general
processing method for testing
assembly of different electronic devices. The method comprises: 1. establishing a protocol
master file table, a sending variable slave
list and a receiving variable slave
list in one-to-one correspondence with different electronic devices; 2. according to an instruction of an electronic device, adding a protocol instruction into a protocol instruction acquisition strip of a corresponding protocol
master file table; 3. according to the instruction, discomposing to-be-sent content into different sending variable names, sending variable notes and default values, putting the different sending variable names, sending variable notes and default values into a sending variable acquisition strip of a sending variable slave
list, and connecting serially and sequentially corresponding default values into a sending command and sending the sending command to the electronic device; 4. after the electronic device receives the sending command, returning data, and after the protocol
master file table receives the data, analyzing the data and putting a variable value obtain through analysis into a receiving variable acquisition strip of a receiving variable slave list; and 5. performing
verification on an electronic device test logic result according to a variable obtained through analysis. The method provided by the present invention improves compatibility and fastness of testing.