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38results about How to "Increase storage window" patented technology

Resistive random access memory based on organic/inorganic hybrid perovskite material and fabrication method of resistive random access memory

The invention discloses a resistive random access memory based on an organic / inorganic hybrid perovskite material and a fabrication method of the resistive random access memory. The resistive random access memory comprises a bottom electrode, a top electrode and a resistance changing functional layer material, wherein the resistance changing functional layer material is arranged between the bottom electrode and the top electrode and comprises one layer or multiple layers of organic / inorganic hybrid perovskite thin film materials. The fabrication method comprises the following steps of (1) cleaning a substrate; (2) depositing the bottom electrode on the substrate by employing a physical vapor deposition technique; (3) forming the organic / inorganic hybrid perovskite thin film material on the bottom electrode as a resistance changing functional layer by techniques such as spin coating, dip coating and vacuum evaporation; and (4) depositing the top electrode on the resistance changing functional layer by employing the physical vapor deposition technique. According to the resistive random access memory, the structure is simple, and low-temperature and low-cost fabrication can be carried out; and the fabricated device has the technical advantages of large memory window, low conversion voltage, high conversion speed, multi-value storage capability, favorable thermal stability and device durability and the like.
Owner:GRIMAT ENG INST CO LTD

Non-volatile memory of multi-layered nano-crystal floating gate structure

The invention discloses a nonvolatile memory with a multi-layer nanocrystal floating gate structure, which belongs to the technical field of the nonvolatile memory. The nonvolatile memory comprises a semiconductor substrate 11 used for supporting the entire nonvolatile memory, a source 9 and a drain 10 which are formed in the semiconductor substrate 11 in a doped way, a channel 12 between the source 9 and the drain 10, a tunneling oxidizing layer 13 positioned on the channel 12, a control oxidizing layer 14 used for controlling oxidation of the multi-layer nanocrystal floating gate structure, a gate electrode 16 positioned on the control oxidizing layer 14 and a multi-layer nanocrystal floating gate structure 15 positioned between the tunneling oxidizing layer 13 and the control oxidizing layer 14 and used as the floating gate storage unit of the nonvolatile memory. The invention also discloses a method for preparing the nonvolatile memory with the multi-layer nanocrystal floating gate structure. The invention solve the contradiction between the programming time/voltage of the single-layer nanocrystal floating gate memory and the storage time, and increases the storage time of the element under the precondition of shorter programming time.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI

Memory and manufacturing method thereof

The invention discloses a memory and a manufacturing method of the memory. The memory structurally comprises a semiconductor substrate, a channel region, a grating stack and a source region or a drain region, wherein the channel region is arranged on the semiconductor substrate; the grating stack is arranged on the channel region and comprises a tunneling layer, a charge trapping layer, a barrier layer and a gate electrode layer; the tunneling layer is arranged on the channel region; the charge trapping layer is arranged on the tunneling layer; the barrier layer is arranged on the charge trapping layer; the gate electrode layer is arranged on the barrier layer; the source region or the drain region is arranged on two sides of the channel region and is embedded in the semiconductor substrate; and the charge trapping layer comprises a first charge trapping layer and a second charge trapping layer(s), wherein the second charge trapping layers which are arranged above or / and below the first charge trapping layer.
Owner:ZHUHAI CHUANGFEIXIN TECH CO LTD

Multistage resistive random access memory and manufacturing method thereof

The invention aims to provide a multistage resistive random access memory and a manufacturing method of the multistage resistive random access memory. The multistage resistive random access memory comprises a substrate, a bottom electrode, a resistive layer and a top electrode, wherein the substrate, the bottom electrode, the resistive layer and the top electrode are arranged from bottom to top in sequence. The multistage resistive random access memory is characterized in that an isolation layer is further arranged between the bottom electrode and the resistive layer. According to the multistage resistive random access memory and the manufacturing method of the multistage resistive random access memory, the nanoscale isolation layer is additionally arranged, so that the magnitude of a storage window of the resistive random access memory is increased to over 105, and the primary condition needed by multistage storage is met; electrochemical active materials are used as the top electrode, different resistance states are achieved under the condition of different voltage drives through the drifting character of the electrochemical active materials, and the purpose of multistage storage is achieved; in addition, due to the additional arrangement of the isolation layer, dissipation of oxygen ions in the movement process is reduced, the bottom electrode is effectively protected, and the stability of a device is improved. In addition, the manufacturing method of the multistage resistive random access memory is simple and easy to control.
Owner:UNIV OF ELECTRONICS SCI & TECH OF CHINA

Multiple-valued non-volatile memory and preparation method thereof

ActiveCN102693984ALow Program Erase VoltageGood programming and erasing speedSolid-state devicesSemiconductor/solid-state device manufacturingMulti valuedHigh density storage
The invention relates to a multiple-valued non-volatile memory and a preparation method thereof. The memory comprises a semiconductor substrate, wherein both ends of the semiconductor substrate include a source electrode and a drain electrode respectively along the direction of a memory bit line and both ends of the semiconductor substrate include a shallow tunnel isolation structure respectively along the direction of a memory sub-line. A tunneling dielectric layer, a charge storage layer, a charge blocking layer, and a gate electrode are sequentially arranged on the semiconductor substrate, wherein the charge storage layer is a combination of two different storage materials which are alternatively arranged along the direction of the memory sub-line. The multiple-valued non-volatile memory of the invention adopts the storage layer formed by alternatively arranging the two different materials, which increases the storage density, promises a large window while reducing the thickness of a gate dielectric layer greatly,. Therefore, multiple-valued storage and high-density storage are realized the cost is reduced in turn.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI

Programing method for ferroelectric dynamic random access single-tube unit array

InactiveCN1848293AThe range of programming voltages increasesReduce restrictionsDigital storageIntegrated circuitRandom access
The present invention provides a programming method of ferro-electric dynamic random memory single-tube unit array, belonging to the field of semiconductor integrated circuit design and manufacture technology. In the course of programming true unit said method can apply the voltage for inhibiting programming to word line, bit line and source line of non-true unit so as to make the range of programming voltage which can be applied to said single-tube unit array be further increased, so that the larger storage window can be obtained.
Owner:PEKING UNIV SHENZHEN GRADUATE SCHOOL

NAND ferroelectric storage unit with three-dimensional structure and preparation method thereof

Provided are a NAND ferroelectric storage unit with a three-dimensional structure and a preparation method thereof. The ferroelectric storage unit comprises an oxide insulating layer, a channel layer,a channel buffer layer, a ferroelectric layer, a gate buffer layer and a gate which are sequentially arranged from inside to outside; a channel buffer layer is arranged between the channel layer andthe ferroelectric layer; and / or a gate buffer layer is arranged between the ferroelectric layer and the gate. According to the storage unit, the buffer layer has the following effects: 1, the ferroelectric film can be induced to crystallize to generate a ferroelectric phase; 2, adverse effects caused by different crystallization characteristics of the channel layer and the ferroelectric layer during unified annealing crystallization can be reduced, and the quality and the uniformity of a deposited film are improved; and 3, the buffer layer can improve the interface performance of the channel layer, reduce the leakage current and improve the anti-fatigue performance of the device. Therefore, the buffer layer can integrally improve the storage performance and uniformity of the storage unit in the three-dimensional structure, increase the storage window of the storage unit, improve the fatigue performance of the storage unit and improve the uniformity of the storage performance of a plurality of transistors.
Owner:XIANGTAN UNIV

Resistive random access memory and manufacturing method thereof

The invention provides a resistive random access memory and a manufacturing method thereof. According to the resistive random access memory and the manufacturing method thereof provided by the invention, a first electrode is formed on the surface of a semiconductor substrate, an intercalation layer is formed on the first electrode, a resistive switching layer is formed on the intercalation layer,a barrier layer is formed on the resistive switching layer, and a second electrode is formed on the barrier layer. The intercalation layer can be matched with the resistive switching layer to achievebetter device performance, and the initial resistance of the resistive random access memory can be modulated through the intercalation layer, so that the storage window of the resistive random accessmemory can be enlarged, and the process uniformity and the performance of the resistive random access memory can be improved.
Owner:SHANGHAI HUALI MICROELECTRONICS CORP

Memory method for nanocrystalline floating gate structure-based multi-value nonvolatile memory

The invention relates to a memory method for a nanocrystalline floating gate structure-based multi-value nonvolatile memory, and belongs to the technical field of memories. In the memory method, hot electron injection is used as a programming mode, Fowler-Nordheim (FN) tunneling is used as an erasing mode, and four memory states of 00, 01, 10 and 11 are differentiated according to amplitude of read current, so that multi-value memory can be realized under the condition of the same area to double memory capacity. In the method, the new programming mode is adopted to simultaneously program at asource end and a drain end, and the multi-value memory is formed, so that the programming efficiency is greatly improved, a memory window is also increased, memory of more points is realized, and thememory capacity which is twice the conventional memory capacity is realized on a memory unit of the same size; in addition, a manufacturing process is not changed while the advantage is realized, andthe cost is greatly reduced.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI

A double-layer floating gate flexible organic memory device and its preparation method

The present invention involves a double -layer floating grid flexible organic storage device and its preparation methods. The invention is mainly based on substrate, medium layer, control grid, blocking layer, first floating grid layer, isolation layer, second floating grid layer, tunnel, tunnel, tunnel, tunnel, tunnelThe wearing layer, organic semiconductor layer, source electrode and leakage electrode composition, where the source electrode and leakage electrode are located on the tunnel through the tunnel layer.The use of double -layer gold nano crystals as the floating grille layer will help improve the storage window of the storage device and increase the working voltage range; use femtosecond laser restoration technology to reduce repeated sedimentary electrodes in the middle, simplify the production process, reduce production, and reduce production.The doping of pollution in China is conducive to improving product yields; the blocking layers, quarantine layers, and then wearing layers used in the present invention are all graphene with high -agency constants, which can effectively reduce the leakage current and improve the stability of the memory.It can reduce the working voltage; the materials used in the present invention are flexible, can be bent, and can be applied to a flexible circuit.The femtosecond laser restoration technology, vacuum thermal evaporation and rotation technology used in the preparation process of the present invention, mature process, low production costs, can achieve large -scale production.
Owner:CHINA JILIANG UNIV

A resistive memory based on organic/inorganic hybrid perovskite material and its preparation method

The invention discloses a resistive random access memory based on an organic / inorganic hybrid perovskite material and a fabrication method of the resistive random access memory. The resistive random access memory comprises a bottom electrode, a top electrode and a resistance changing functional layer material, wherein the resistance changing functional layer material is arranged between the bottom electrode and the top electrode and comprises one layer or multiple layers of organic / inorganic hybrid perovskite thin film materials. The fabrication method comprises the following steps of (1) cleaning a substrate; (2) depositing the bottom electrode on the substrate by employing a physical vapor deposition technique; (3) forming the organic / inorganic hybrid perovskite thin film material on the bottom electrode as a resistance changing functional layer by techniques such as spin coating, dip coating and vacuum evaporation; and (4) depositing the top electrode on the resistance changing functional layer by employing the physical vapor deposition technique. According to the resistive random access memory, the structure is simple, and low-temperature and low-cost fabrication can be carried out; and the fabricated device has the technical advantages of large memory window, low conversion voltage, high conversion speed, multi-value storage capability, favorable thermal stability and device durability and the like.
Owner:GRIMAT ENG INST CO LTD

Nano tunnel and silver nanoparticle coexisting organic field effect transistor memory and preparation method thereof

The invention discloses a nano tunnel and silver nanoparticle coexisting organic field effect transistor memory and a preparation method thereof. The memory structurally comprises a source and drain electrode, an organic semiconductor layer, a charge storage layer, a gate insulating layer, a substrate and a gate electrode formed on the substrate from top to bottom in sequence, wherein the charge storage layer comprises two layers, the first layer is a polymer layer with a nano tunnel structure, and the second layer is a silver nanoparticle layer uniformly distributed on the polymer layer. The charge storage layer is prepared by adopting a secondary spin-coating solution processing method, the preparation process is simple, and large-area preparation can be realized. The film morphology of the nanopore can be regulated and controlled by simply adjusting the spin-coating rotating speed through primary spin-coating, and then the silver nanoparticles are uniformly distributed on the nanopore morphology through secondary spin-coating. The storage capacity, the high mobility and the switch ratio are achieved, the stability is greatly improved, the price is low, the cost is saved, and popularization and integrated commercial application are facilitated.
Owner:NANJING UNIV OF POSTS & TELECOMM

Ferroelectric double-annealing process capable of enhancing storage window

The invention discloses a ferroelectric double-annealing process capable of enhancing a storage window. According to the method, pre-annealing is carried out before a functional layer is grown on a ferroelectric memory, and post-annealing is carried out after an upper electrode is grown; the pre-annealing means that the memory on which the functional layer is to be grown is placed in an annealing furnace, the temperature is raised at the speed of V1 in the atmosphere of nitrogen, when the temperature reaches 200-500 DEG C, the temperature is kept for T1, after T1, rapid annealing is carried out, and when the temperature is reduced to 40-60 DEG C, the memory on which the functional layer is to be grown is taken out; and the post-annealing refers that the memory on which the upper electrode is grown is placed into an annealing furnace, the temperature is raised at a speed of V2 in a nitrogen atmosphere, the temperature for T2 is kept when the temperature reaches 400-700 DEG C, quick annealing is performed after T2, and the memory on which the upper electrode is grown is taken out when the temperature reaches 40-60 DEG C. Compared with a functional layer which is not pre-annealed, the semiconductor device has a larger storage window.
Owner:SHANDONG UNIV

Groove-type silicon nanocrystalline memory and manufacturing method thereof

The invention discloses a groove-type silicon nanocrystalline memory and a manufacturing method thereof. The groove-type silicon nanocrystalline memory comprises a groove formed in the surface of an etching silicon substrate, a main structure of the silicon nanocrystalline memory formed in the groove, a polysilicon gate covered above the groove of the silicon substrate, and a source electrode and a drain electrode formed in the silicon substrate on two sides of the groove, and the main structure comprises a tunneling oxidation layer, silicon nanocrystalline and an inter-gate oxidation layer sequentially from bottom to top. According to the manufacturing method, the groove-type silicon nanocrystalline memory can be manufactured only by etching the groove on the substrate and manufacturing devices on the groove, so that the method is simple; the manufacturing method is completely compatible with conventional CMOS (complementary metal oxide semiconductor) processes, and the devices are good in storage characteristic and high in reliability and quite suitable for large-scale production and wide application; smiling effect in the process of manufacturing of peripheral devices can be thoroughly avoided from oxidizing the silicon nanocrystalline, so that storage characteristics and the like of the devices are guaranteed.
Owner:INST OF MICROELECTRONICS CHINESE ACAD OF SCI
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