An SRAM (
Static Random Access Memory) storage unit circuit capable of realizing high read-write stability under
low voltage is of a nine-
tube structure, a grid
electrode of a sixth NMOS (N-channel
Metal Oxide Semiconductor) tube is connected with a grid
electrode of a fifth NMOS tube and a first writing line, a drain
electrode of the sixth NMOS tube is connected with a writing
bit line, and a source electrode of the sixth NMOS tube is connected with a drain electrode of the fifth NMOS tube; the grid electrode of the second NMOS tube is connected with a third writing line, the drain electrode of the second NMOS tube is connected with the source electrode of the fifth NMOS tube, the drain electrode of the first PMOS tube and the grid electrodes of the third PMOS tube, the third NMOS tube andthe fourth NMOS tube, and the source electrode of the second NMOS tube is connected with the drain electrode of the first NMOS tube; the grid electrode of the second PMOS tube is connected with the second writing line, the drain electrode of the second PMOS tube is connected with the source electrode of the first PMOS tube, and the source electrode of the second PMOS tube is connected with the source electrode of the third PMOS tube and the
power supply voltage; the drain electrode of the third NMOS
transistor is connected with the drain electrode of the third PMOS
transistor and the grid electrodes of the first NMOS
transistor and the first PMOS transistor, and the source electrode of the third NMOS transistor is connected with the source electrode of the first NMOS transistor and the ground; and the drain electrode of the fourth NMOS transistor is connected with a
read bit line, and the source electrode is connected with a read word line. The method can improve the writing capability of the SRAM storage unit, reduces the static
power consumption of the
system, does not affect the reading stability, and is especially suitable for low-
voltage application.