A New Testable Structure of Lookup Table
A testable, look-up table technology, applied in the field of programmable logic devices, can solve the problems of increasing the propagation delay of critical paths, increasing the difficulty of circuit metal wiring, increasing the difficulty of chip wiring, etc., to improve reading efficiency and addressing positioning ability, fast read speed, and reduced power consumption of the write circuit
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[0017] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.
[0018] This application discloses a new testability structure of a lookup table, please refer to figure 1 and 2 , the new testability structure includes a lookup table 1, a flip-flop 2 (DFF), a transmission gate, a configuration memory unit 3 (SRAM) corresponding to the lookup table 1, and a configuration readback circuit for the configuration memory unit 3 . The output port of the look-up table 1 is connected to the input port of the flip-flop 2 and the output signal of the look-up table is stored in the flip-flop 2 through path transmission, figure 1 Taking the lookup table 1 as a six-input lookup table LUT6 as an example, the output port of the flip-flop 2 is connected to the input port of the configuration storage unit 3 through the transmission gate, and the test enable signal GTEST is connected to the transmission gate and drives the ...
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