The invention relates to a method for preparing a powdered
test sample for a transmission
electron microscope. The method comprises the following steps of:
cutting a
crystal with a flat and neat surface from a soluble monocrystalline material according to a cleavage surface of the soluble monocrystalline material; placing an
electron microscope carrying net onto the
cut crystal block; ultrasonically dispersing the powdered sample to be observed by using absolute
ethanol, dropping a proper amount of dispersed liquid onto the carrying net and naturally
drying in the air;
sputtering and depositing a layer of
metal thin film by adopting a magnetron
sputtering technology, and wrapping and fixing particles to be analyzed onto the carrying net by using the deposited thin film; after
sputtering, shearing off a sputtered thin film along the edge of the carrying net; placing the carrying net with the fixed particles to be analyzed into an
ion milling for milling until leakage; and taking down the sample and placing into the
electron microscope for observation after the center of the sample is punctured. By the method, the problems that a plurality of powdered samples which have
large particle size and complicated structure and are hard to smash or
grind are hard to prepare, and an observation area is limited and the sample is easy to pollute can be solved; and the method is a
sample preparation method with high
sample preparation success rate and high suitability.