225 results about "Reference structure" patented technology

A lithographic apparatus comprises a substrate table to hold a substrate, a reference structure and a measurement system to measure a position of the substrate table with respect to the reference structure. The measurement system comprises a first measurement system to measure a position of the substrate table with respect to an intermediate structure and a second measurement system to measure a position of the intermediate structure with respect to the reference structure. The intermediate structure may be connected or connectable to a drive mechanism to drive the substrate table. A distance between the substrate table and the intermediate structure, resp. a distance between the intermediate structure and the reference structure may be small which results in a highly accurate position measurement.

A lithographic apparatus comprises a substrate table to hold a substrate, a reference structure and a measurement system to measure a position of the substrate table with respect to the reference structure. The measurement system comprises a first measurement system to measure a position of the substrate table with respect to an intermediate structure and a second measurement system to measure a position of the intermediate structure with respect to the reference structure. The intermediate structure may be connected or connectable to a drive mechanism to drive the substrate table. A distance between the substrate table and the intermediate structure, and a distance between the intermediate structure and the reference structure may be small which results in a highly accurate position measurement.

Disclosed are embodiments of an integrated circuit structure that incorporates at least two field effect transistors (FETs) that have the same conductivity type and essentially identical semiconductor bodies (i.e., the same semiconductor material and, thereby the same conduction and valence band energies, the same source, drain, and channel dopant profiles, the same channel widths and lengths, etc.). However, due to different gate structures with different effective work functions, at least one of which is between the conduction and valence band energies of the semiconductor bodies, these FETs have selectively different threshold voltages, which are independent of process variables. Furthermore, through the use of different high-k dielectric materials and / or metal gate conductor materials, the embodiments allow threshold voltage differences of less than 700 mV to be achieved so that the integrated circuit structure can function at power supply voltages below 1.0V. Also disclosed are method embodiments for forming the integrated circuit structure.

A lithographic apparatus comprises a substrate table to hold a substrate, a reference structure and a measurement system to measure a position of the substrate table with respect to the reference structure. The measurement system comprises a first measurement system to measure a position of the substrate table with respect to an intermediate structure and a second measurement system to measure a position of the intermediate structure with respect to the reference structure. The intermediate structure may be connected or connectable to a drive mechanism to drive the substrate table. A distance between the substrate table and the intermediate structure, resp. a distance between the intermediate structure and the reference structure may be small which results in a highly accurate position measurement.

Diffraction models and scatterometry are used to reconstruct a model of a microscopic structure on a substrate. A plurality of candidate structures are defined, each represented by a plurality of parameters (p1, p2, etc.)). A plurality of model diffraction signals are calculated by simulating illumination of each of the candidate structures. The structure is reconstructed by fitting one or more of the model diffraction signals to a signal detected from the structure. In the generation of the candidate structures, a model recipe is used in which parameters are designated as either fixed or variable. Among the variable parameters, certain parameters are constrained to vary together in accordance with certain constraints, such as linear constraints. An optimized set of constraints, and therefore an optimized model recipe, is determined by reference to a user input designating one or more parameters of interest for a measurement, and by simulating the reconstruction process reconstruction. The optimized model recipe can be determined automatically by a parameter advisor process that simulates reconstruction of a set of reference structures, using a plurality of candidate model recipes. In the generation of the reference structures, restrictions can be applied to exclude unrealistic parameter combinations.

A lithographic apparatus comprises a substrate table to hold a substrate, a reference structure and a measurement system to measure a position of the substrate table with respect to the reference structure. The measurement system comprises a first measurement system to measure a position of the substrate table with respect to an intermediate structure and a second measurement system to measure a position of the intermediate structure with respect to the reference structure. The intermediate structure may be connected or connectable to a drive mechanism to drive the substrate table. A distance between the substrate table and the intermediate structure, and a distance between the intermediate structure and the reference structure may be small which results in a highly accurate position measurement.

The invention discloses a no-reference structural sharpness image quality evaluation method, which comprises the following steps of: acquiring an original image input in a computer; preprocessing the original image, removing influence of isolated noise points on the sharpness of the original image and acquiring an original image to be evaluated; constructing a reference image for the original image to be evaluated through a low pass filter; respectively performing gradient calculation on the original image to be evaluated and the reference image, and extracting sub-image vectors with rich texture information; calculating the structural similarity between corresponding sub-image vectors so as to obtain structural similarity results of the sub-image vectors; and calculating no-reference structural sharpness by using the obtained structural similarity results of the sub-image vectors so as to obtain quality evaluation index no-reference structural sharpness of the original image. The reference image is constructed through an imaging model, no-reference image quality evaluation is performed by a reference image quality evaluation method aiming at image blurring, and the method is applied to the fields of imaging quality detection and control of an imaging system, evaluation of an image processing algorithm, and the like.

Spinal apparatus including reference structure spatially fixed relative to a plurality of pedicle screws that are mounted in adjacent vertebrae of a patient, and a device connected to the reference structure which is adapted to install an anterior spinal prosthesis, wherein the reference structure defines a spatial relationship between the anterior spinal prosthesis and a posterior spinal prosthesis attached to the pedicle screws.

Methods, systems, and computer-readable media are disclosed herein for virtually planning a cranial guided surgery in a subject. These include, in some embodiments, generating a first data set based on input data obtained of a reference structure having a defined fixed relation to a bone structure of said subject and generating a second data set based on input data obtained of a master structure for a surgical template, where the master structure has a defined relation to said reference structure. Further, in some embodiments, a third data set for production of said surgical can be generated based on the first data send and the second data set, wherein the relation of said reference structure to said master structure is preserved.

Mechanisms and techniques operate in a computerized device to perform a memory management technique such as garbage collection. The mechanisms and techniques operate to detect, within a storage structure associated with a thread, general memory references that reference storage locations in a general memory area such as a heap. The storage structure may be a stack utilized by the thread, which may be, for example, a Java thread, during operation of the thread in the computerized device. The system maintains a reference structure containing an association to the general memory area for each detected general memory reference within the storage structure. The system then operates a memory management technique on the general memory area for locations in the general memory area other than those for which an association to the general memory area is maintained in the reference structure, thus increasing the performance of the memory management technique.

A method for programming of a robot application comprising an industrial robot having a robot coordinate system, a tool having a tool coordinate system and a work object (3) to be processed by the tool. The application is programmed by means of a position-measuring unit (15) adapted for measuring positions relative a measuring coordinate system (db). The programming method comprises: selecting an object reference structure (25) on the object, defining a mathematical model for the object reference structure, defining an object coordinate system (o2), providing measurements by the position-measuring unit on the surface of the object reference structure, determining the object coordinate system in relation to the measuring coordinate system (db) by best fit between said measurements and said mathematical model of the object reference structure.

A system and method of optically inspecting a structure on a surface of a production object which is supported on a moving inspection platform. The method reliably traces structure edges and stores structure and structure island characteristics. The system uses a camera and a light or energy source to sharply delineate the structure edges. A sequence of images of the object and the structure are captured, and the structure is detected in each image. The structure is then symbolically decomposed into primitives, and a histogram is produced for each image identifying the slope and length of each edge of the structure. The histograms are compared in each image, and are aligned to eliminate differences due to wobble of the inspection platform or differences in magnification. A production structure grammar is then produced from the aligned images. The production structure grammar is compared to a reference structure grammar generated from a defect-free object. Differences in the two grammars, if any, are used to identify missing, misaligned, or misoriented structures on the production object, and to detect foreign objects and other defects.

A method for the three-dimensional imaging of a sample in which image information from different depth planes of the sample is stored in a spatially resolved manner, and the three-dimensional image of the sample is subsequently reconstructed from this stored image information is provided. A reference structure is applied to the illumination light, at least one fluorescing reference object is positioned next to or in the sample, images of the reference structure of the illumination light, of the reference object are recorded from at least one detection direction and evaluated. The light sheet is brought into an optimal position based on the results and image information of the reference object and of the sample from a plurality of detection directions is stored. Transformation operators are obtained on the basis of the stored image information and the reconstruction of the three-dimensional image of the is based on these transformation operators.

An apparatus and method for implanting and securing an implanted medical device in a recipient. The implantable medical device of the generally includes a stimulating lead assembly that comprises an elongate carrier member having at least one stimulating element positioned thereon. The stimulating lead assembly further has an expandable portion thereon configured to be inserted into said reference structure in a first dimension, expand to a second dimension, and interact with a portion of the reference structure to help longitudinally secure the carrier member in the recipient.

A MEMS sensor includes a substrate and a MEMS structure coupled to the substrate. The MEMS structure has a mass movable with respect to the substrate. The MEMS sensor also includes a reference structure positioned radially outward from the MEMS structure. The reference structure is used to provide a reference to offset any environmental changes that may affect the MEMS sensor in order to increase the accuracy of its measurement.

A portable and wearable tumor detector includes a brassier and devices for enabling optical tomography in a non-clinical setting. Light emitting devices and light sensing devices are provided on the brassier, and a controller for performing a tomographic scanning is attached to the brassier. A computing means and a communication means may be provided to generate at least one tomographic image. Each of the two breasts under examination can be employed as a reference structure for generating a tomographic image for the other of the two breasts, thereby providing a self-referencing image generation mechanism. The images and / or data can be reviewed by the subject of the tomographic scanning or by a medical professional. The tomographic scanning can be performed at any location if provided with a portable power supply system.

A MEMS sensor includes a substrate and a MEMS structure coupled to the substrate. The MEMS structure has a mass movable with respect to the substrate. The MEMS sensor also includes a reference structure electrically coupled to the mass of the MEMS sensor. The reference structure is used to provide a reference to offset any environmental changes that may affect the MEMS sensor in order to increase the accuracy of its measurement.

A method to extract gate to source / drain and overlap capacitances is disclosed. A first capacitance of a first test key having a reference structure and a second capacitance of a second test key having a novel structure are measured. The second test key may comprise at least a gate formed on an insulation structure, at least a contact formed on the insulation structure aside, and a metal layer formed on the contact. Another embodiment of the second test key may comprise at least a gate formed on the semiconductor substrate, a contact formed aside, and a metal layer formed on the contact. Further another embodiment uses a test key comprising at least an elongated gate and an elongated doping region aside, and only one or a few contacts are formed on an end portion of the elongated doping region.

An energy harvesting device and a method of using the energy harvesting device to generate an electrical charge are described. The energy harvesting device comprises a mass and at least two tethers, at least one of which comprises a piezoelectric material that is mechanically stressable upon deflection of the at least two tethers. Each of the tethers comprises a first end coupled to the mass and a second end coupled to a reference structure, and the tethers are arranged about the mass such that the mass is moveable within a straightline path relative to the reference. The movement of the mass causes the deflection of the tethers, resulting in the generation of an electric charge. The device is preferably operable at the microscale.

The invention provided a sewing machine, improved to automatically switch the sewing machine to the thickness of cloth. This sewing machine includes: a housing having a base plate; a top arm; and a strut for integrating the base plate with the top arm. A metallic presser presses a cloth piece near a stitch forming position. The metallic presser driven by a movable rod is capable of moving between the lift position for releasing the cloth piece and the pressing position for the cloth piece to be pressed. When the metallic presser moves between these positions, the distance of at least one movable rod part from a reference structure fixed to the housing stably changes. The position sensor detects the position of the metallic presser in the pressing position. A control system makes signal connection thereto. The system sets an adjustment variable for the sewing machine depending upon the output value of the position sensor. As a result, the obtained sewing machine automatically performs switching to the thickness of variable cloth piece.

A moving picture decoding device includes a cache memory for storing a reference picture, in addition to a multi-frame memory (external memory) for storing reference pixel data of a plurality of reference pictures, for processing of a HD image size large in angle of view. A reference structure analyzer analyzes the reference structure of pictures. A reference picture manager not only writes a reference picture high in the possibility of being referred to by an object picture to be decoded in the multi-frame memory but also stores such a reference picture in the cache memory, using the analysis results of the picture reference structure. This minimizes the capacity of the cache memory and also reduces the data transfer amount from the external memory.

A cabinet for a projection television system, the cabinet including a one-piece molded structure for mounting the components, and reference surfaces unitary with the structure, for mechanically aligning critical optical components of the television system with one another.

A signal transmission cable with adaptive contact pin reference structure includes a first cable having a connecting edge; a second cable having a connecting edge; a component lay-out section having a first lateral edge adjacent to the connecting edge of the first cable, and a second lateral edge; and an overlapping section having an inner lateral edge adjacent to the second lateral edge of said component lay-out section with a folding line formed between them, and an outer lateral edge adjacent to the connecting edge of the second cable with another folding line formed between them. Signal transmission lines included in the component lay-out section and the first cable are correspondingly connected with one another, and signal transmission lines included in the overlapping section are correspondingly connected to those included in the second cable and the component lay-out section.

A method for localizing an internal body structure during an image-guided procedure that includes obtaining a three dimensional image of a body portion containing a targeted structure and selected reference structures; determining a set of landmark point coordinates for defining the location of each of the targeted and reference structures; computing triangulation parameters relating the location of the landmark points for the targeted structure and the reference structures; and, during an image-guided procedure, using the computed triangulation parameters to plot an estimated location of the targeted structure on an intra-operative image in which the reference structures have been identified.

An actuator assembly having a primary load path for tightly coupling an actuated surface to a reference structure and a secondary load path having a backlash portion for coupling the actuated surface to the reference structure with backlash, wherein the secondary load path is unloaded during an operative state of the primary load path and loaded during a failure state of the primary load path. The actuator assembly includes at least one sensor configured to sense the failure state of the primary load path when a relative displacement between a portion of the primary load path and a portion of the secondary load path exceeds a predetermined value or is within a predetermined range of values.

A method for the three-dimensional imaging of a sample in which image information from different depth planes of the sample is stored in a spatially resolved manner, and the three-dimensional image of the sample is subsequently reconstructed from this stored image information is provided. A reference structure is applied to the illumination light, at least one fluorescing reference object is positioned next to or in the sample, images of the reference structure of the illumination light, of the reference object are recorded from at least one detection direction and evaluated. The light sheet is brought into an optimal position based on the results and image information of the reference object and of the sample from a plurality of detection directions is stored. Transformation operators are obtained on the basis of the stored image information and the reconstruction of the three-dimensional image of the is based on these transformation operators.

A signal transmission cable with adaptive contact pin reference structure includes a first cable having a connecting edge; a second cable having a connecting edge; a component lay-out section having a first lateral edge adjacent to the connecting edge of the first cable, and a second lateral edge; and an overlapping section having an inner lateral edge adjacent to the second lateral edge of said component lay-out section with a folding line formed between them, and an outer lateral edge adjacent to the connecting edge of the second cable with another folding line formed between them. Signal transmission lines included in the component lay-out section and the first cable are correspondingly connected with one another, and signal transmission lines included in the overlapping section are correspondingly connected to those included in the second cable and the component lay-out section.

The embodiment of the invention discloses a transmission method and equipment of non-periodic SRS (signal reference structure) in a TDD (Time Division Duplexing) system. By adopting the technical scheme of the embodiment of the invention and defining the sign of non-periodic SRS transmission in a special sub-frame of the TDD system, the condition that the transmission position cannot be determined when a plurality of signs which can be used for non-periodic SRS transmission exist in an uplink pilot frequency timeslot is avoided, the non-periodic SRS transmission problem in the special sub-frame of the TDD system is solved, and the modification on corresponding indication information is little, and no excessive system resource is occupied.