55 results about "Partial scan" patented technology

A system for performing a scan test on an integrated circuit such as a System on a Chip (SoC) that may be packaged in different package types and with different features enabled includes a bypass-signal generator and a first scan-bypass circuit. The bypass-signal generator generates a first bypass signal based on chip package information. The first bypass signal indicates whether a first scan chain associated with a first non-common circuit block of the SoC is to be bypassed. The first scan chain is bypassed in response to the first bypass signal. By enabling partial scan testing based on package information, unintentional yield loss caused by a full scan test determining an SoC is faulty can be avoided.

The present invention is directed to a method and system of controlling rotation of a gantry to rotate at a rotational speed such that a desired relationship between center projection angles of neighboring partial scans is maintained.

The invention relates to a partial-scan-based CT image reconstruction method, apparatus and CT device. The method comprises the following steps: CT scanning is started when a scanning angle is [beta]start, the CT scanning ends when the scanning angle is [beta]end, original data of the scanning angle which ranges from [beta]start to [beta]end can be obtained, first projection data can be obtained by weighing the original data, second projection data of the scanning angle which ranges from [beta]start-z to [beta]end+z are obtained according to extension of the first projection data, rearrangement data are obtained by rearranging the second projection data, and a CT reconstruction image is obtained by subjecting the rearrangement data to image reconstruction operation. According to the partial-scan-based CT image reconstruction method, apparatus and CT device, parallel processing of the projection data can be realized, and waiting time of a system can be reduced.

A method for conducting a perfusion study includes performing an initial full scan of an area of interest in an object, and performing at least one subsequent partial scan of the area of interest to detect motion of a contrast agent.

A method and a system for obtaining an object three-dimensional model are disclosed. The invention is applicable to the technical field of three-dimensional visualization and provides a method for generating a three-dimensional object model. The method comprises a step of obtaining the information of the color image and collected by a camera, a step of removing a plane and downsampling, a step of selecting a random sample point and a computer descriptor, a step of carrying out model preprocessing, calculating a model descriptor and filling the descriptor into a hash table, a step of determining a matching area of inputting 3D data and a 3D object model, a step of using the 3D model data to fill the missed and fuzzy points in the matching area, a step of using the 3D model data to extrapolate an area which can not be observed, and a step of obtaining a complete 3D model with high precision. According to the method and the system, the object three-dimensional model can be rapidly and automatically established, a known data structure is directly obtained, the subsequent analysis and measurement are facilitated, even a noise or partial scan information exists, a fully formed 3D model can be outputted always, and the method and the system are suitable for a moving object.

A method for conducting a perfusion study includes performing an initial full scan of an area of interest in an object, and performing at least one subsequent partial scan of the area of interest to detect motion of a contrast agent.

A flat panel display comprises a substrate, a plurality of data lines, a plurality of scan lines, a source electrode driver element and a grid electrode driver element. The substrate comprises a pixel array. The plurality of data lines are electrically connected to the pixel array. The plurality of scan lines comprise p groups of scan lines and are electrically connected with the pixel array, and P is a positive integer. In the same group of the scan lines, at least partial scan lines are not adjacent. The source electrode unit is electrically connected to the partial scan lines. The grid electrode driver element comprises p shift register circuits which are respectively used to enable the p groups of scan lines. In a first picture frame period, the p groups of scan lines are enabled by a first group sequence; in a second picture frame period, the p groups of scan lines are enabled by a second group sequence, and the first group sequence is different from the second group sequence.

The present invention is directed to a method and system of blending data acquired from neighboring partial-scans. Data is acquired from an imaging volume in a series of fractional or partial-scans. Each partial-scan samples a fraction of the imaging volume. During reconstruction, data from the partial-scans are combined to compensate for the unsampled portion of the imaging volume that is experienced in any partial-scan alone.

A method for performing an exact volume imaging with a C-arm digital x-ray imaging system by moving the source through two partial circular scans which form a complete source trajectory. The partial circular scans form a complete source trajectory when the plane defined by the C-arm is repositioned for the second scan at an angle equal to the cone angle with respect to the long axis of the patient.

A system for performing a scan test on an integrated circuit such as a System on a Chip (SoC) that may be packaged in different package types and with different features enabled includes a bypass-signal generator and a first scan-bypass circuit. The bypass-signal generator generates a first bypass signal based on chip package information. The first bypass signal indicates whether a first scan chain associated with a first non-common circuit block of the SoC is to be bypassed. The first scan chain is bypassed in response to the first bypass signal. By enabling partial scan testing based on package information, unintentional yield loss caused by a full scan test determining an SoC is faulty can be avoided.

A scanning method for determining the touch position of a touch input apparatus is disclosed. First of all, a first exposure process on light sensors of the touch input apparatus by light emitting device of the touch input apparatus is performed. Then the light sensors are scanned. A light sensor generating a signal with a maximum value is located. A region of partial scan of the light sensors is determined according to the position of the light sensor generating the signal with the maximum value. A second exposure process is performed on the light sensors. Then the light sensors within the region of partial scan are scanned. A light sensor generating a signal with a maximum value within the region of partial scan is located and a next region of partial scan is determined. The maximum value of the signal is calculated and the maximum value of the signal is compared to a predetermined value to determine whether the maximum value is higher than the predetermined value.

A design supporting apparatus is disclosed, including: an inputting part; a syntactic analyzing part; and a scanning and searching part. The inputting part inputs functional description data of a register transfer level. The syntactic analyzing part conducts a syntactic analysis for the functional description data and develops a parse tree. The scanning and searching part scans and searches for the parse tree being developed by the syntactic analyzing part and searches for a description representing a comparison operator having multiple bits, the comparison operator being difficult to detect a fault by test data formed by pseudo-random numbers, which are applied from a pseudo-random number generator of a logic built-in self-test.

A virtual training system includes a 3D scanner in recording space and a camera. A scan of the recording space are received and combined to make a sequence of models of the recording space while a tasks is being performed. The model states are presented in sequence to a trainee in a playback space and the actions of the trainee are detected. Deviation of the trainee or objects in the playback space from the trainer and objects in the recording space may be detected and alerts generated. Scanning of the recording space may be accelerated by making a full scan followed by partial scans. The partial scans may be performed in response to detected movement.

Embodiments of the present invention can be configured to recognize and / or track certain types of touch input detected by a touch sensor, such as stylus input, during the performance of standard “full” touch scans in which each drive line of the touch sensor is generally scanned. Upon detection of these input types, “partial” touch scan operations can advantageously be performed which can dynamically reduce the number of lines scanned in a power-saving manner. These partial scans can be configured to intelligently initially scan the area where these input types were last detected so that there is minimal need to return to a previous “full” scan mode. If these specified touch inputs types are not detected during a “partial” scan mode, the touch sensor can be restored to a “full” scan mode until a subsequent detection of the touch input is determined, in which the touch sensor can be returned to a “partial” scan mode. Each time a partial scan is used, power is saved.

A system and method is provided for reducing partial scan reconstruction artifacts in sinogram data acquired as a series of sets of partial-scan projection views, each set of projection views extending over an angular range of less than 360 degrees. A full-scan sinogram matrix for each of the sets of projection views in the series is created and each set of partial-scan projection views is stored in a respective full-scan sinogram matrix to create an array of full-scan matrices having respective empty spaces not filled by partial-scan projection view data stored therein. The empty spaces are filled in each of the full-scan sinogram matrices using the partial-scan projection view data stored therein and an image of the subject is reconstructed from the full-scan sinogram matrices having the empty spaces filled using the partial-scan projection view data stored therein.

A method and system for partial scan testing of integrated circuits is disclosed. The invention includes determining at least one failed functional block during testing of the integrated circuit. The failed functional block is then logically isolated from the remaining non-failing functional blocks. Scan testing of the remainder of the non-failing functional blocks then occurs to determine the integrity of the remainder of the integrated circuit. The data coming out of the failing functional block is not allowed into the other functional blocks as input data. The invention allows the integrated circuit to be used and sold at a reduced functionality for applications not requiring the failed functional block(s).