The invention discloses an accelerated aging test device of a nonlinear resistor disc and a method for testing aging characteristics of the nonlinear resistor disc. The accelerated aging test device of the nonlinear resistor disc comprises a voltage-stabilized source, a high-voltage test power source, a waveform switch mechanism, a temperature test box, a control unit, a measurement unit and a computer data analysis and processing unit. The high-voltage test power source and the waveform switch mechanism are matched and arranged, so that supply, selection and switch of a direct current high-voltage power supply and an alternating current high-voltage power supply are achieved, the blank is filled, and the application range is wide; data is acquired by the measurement unit and output to the computer data analysis and processing unit for storing statistic and graphic plotting of the data , further, the data can be displayed, inquired and output, functions are complete, and statistics are comprehensive; and the high-voltage power supplies can be automatically switched by virtue of cooperative control of the control unit and the computer data analysis and processing unit, and the operation is simple, safe and efficient. The invention further provides the method for testing the aging characteristics, and according to the method, the test device is utilized, relative data is analyzed and processed, and an aging curve and data parameters can be obtained.