Accelerated aging test device of nonlinear resistor disc and method for testing aging characteristics of nonlinear resistor disc
A technology of non-linear resistors and test devices, which is applied in the direction of measuring devices, parts of electrical measuring instruments, and measuring electricity, can solve the problems of inability to test and study DC aging characteristics, and cannot realize data comparison tests and comparisons, etc., to achieve improvement Operability, complete functions, and accurate results
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[0040] The structural working principle and test method of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.
[0041] see figure 1 with figure 2 , the accelerated aging test device of the non-linear resistor sheet of the present invention comprises a stabilized voltage power supply 1, a high voltage test power supply 2, a waveform switching mechanism 3, a temperature test chamber 4, a control unit 5, a measurement unit 6 and a computer data analysis management unit 7; The test power supply 2 includes a voltage regulator, a transformer and a rectifier. The voltage regulator is set at the input end of the transformer, and the rectifier is set at the output end of the transformer; the output end of the regulated power supply 1 is connected to the input end of the high-voltage test power supply 2; the high-voltage test The output end of the power supply 2 is correspondingly connected to the input end of...
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