The invention provides a high-temperature calibration device for
microwave dielectric material testing and a calibration method thereof. The device includes: a vector network analyzer, and two sets of waveguides respectively connected to the vector network analyzer. Joints, cooling waveguides, high-reflection and straight-through conversion waveguides, heat-insulated waveguides, high-temperature waveguides, short-circuit boards, high-reflection and straight-through conversion waveguides are slotted into high-reflection inserts to form a
short circuit; the calibration method includes opening the test
software and opening a slot in the
waveguide Control the
insertion of the high-reflection insert, run the test
software for automatic calibration, test the reflection coefficients S11r and S22r in the two high-temperature waveguides at
room temperature, test the S11h and S22h after loading the medium sample to be tested at high temperature, and test the S11h Carry out correction; Utilize S ' 11 after
microwave loss correction, calculate the complex
dielectric constant of the medium sample to be tested at temperature T; This device and method can be applied in the
microwave material
dielectric property high-temperature test
system, can further improve The test accuracy of the test
system.