Carrier deviation processing method, terminal and storage medium

Abstract

The embodiment of the invention discloses a carrier deviation processing method. The method comprises the following steps: sending a first UWB data packet to a second terminal at a first UWB carrier frequency through a first UWB module of a first terminal; the first UWB data packet carries a standard target value, and the standard target value is used for adjusting the actual UWB carrier frequency of a second UWB module of the second terminal to obtain the currently adjusted UWB carrier frequency; receiving a second UWB data packet sent by a second terminal through a second UWB module at the current adjusted UWB carrier frequency through the first UWB module; obtaining a first carrier deviation estimation value between the currently adjusted UWB carrier frequency and the first UWB carrier frequency; and if a first incidence relation exists between the first carrier deviation estimation value and the standard target value, it is determined that carrier deviation calibration for the second UWB module is completed. The embodiment of the invention further discloses a terminal and a storage medium.

Description

technical field [0001] The present application relates to the field of communication technologies, and in particular, to a method, terminal, and storage medium for processing a carrier offset. Background technique [0002] The accuracy of the clock plays a key role in the application of the terminal. Before the device leaves the factory, the frequency deviation of the crystal oscillator is calibrated. For example, by adjusting the variable capacitance of the crystal oscillator circuit in the integrated circuit (IC) of the device, to ensure that the carrier frequency of the crystal oscillator is at a certain reference value nearby for improved clock accuracy. [0003] However, during the use of the device, the carrier frequency of the crystal oscillator in the device will be affected by the ambient temperature, so that the carrier frequency of the crystal oscillator after calibration will still change, so that the carrier frequency of the crystal oscillator will not change d...

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Problems solved by technology

[0003] However, during the use of the device, the carrier frequency of the crystal oscillator in the device will be affected by the ambient temperature, resulting in a change in the carrier frequency of the crystal oscillator after calibration, so that the carrier frequency of the crystal oscillator will change during the application process. , there will still be a frequency deviation

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