High temperature calibration device for testing microwave dielectric material and calibration method thereof

Abstract

The invention provides a high temperature calibration device for testing microwave dielectric material and calibration method thereof. The device comprises a vector network analyzer, two sets of waveguides which are respectively connected with the vector network analyzer; each set of waveguide comprises a coaxial line to waveguide adapter, a cooling waveguide, a high reflection and straight converting waveguide, a thermal insulation waveguide, a high temperature waveguide, and a short-circuit board which are sequentially connected; the short circuit is formed by opening a seam in the high reflection and straight converting waveguide and inserting a high reflection insertion piece therein; the calibration method comprises the following steps: starting a test software; controlling the insertion of the high reflection insertion piece at the seam of the waveguide; running the test software for automatic calibration; testing reflection factors S11r blank and S22r blank in two high temperature waveguides at a normal temperature; testing S11h and S22h blank at a high temperature after a to-be-tested dielectric sample is loaded in, and correcting S11h; calculating a complex dielectric constant at temperature T of the to-be-tested dielectric sample by using S'11 which is corrected with microwave loss. The device and method can be applied to a high temperature test system of microwave material dielectric performance, and can further increase the test precision of the test system.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic parameter testing of microwave and millimeter wave materials, and in particular relates to a device and a calibration method for high-temperature calibration of microwave materials. Background technique [0002] With the development of science and technology, microwave dielectric materials are widely used in various microwave fields as electromagnetic wave transmission media, such as satellite communication, microwave communication, electronic countermeasures, radar navigation, infrared remote sensing, telemetry and other systems. At the same time, aviation, aerospace And the development of military technology is very rapid, the speed of various aircraft is getting faster and faster, and the requirements for the development of high-temperature materials are becoming more and more urgent. Therefore, mastering the parameters of microwave dielectric materials is of great importance to its rese...

AI Technical Summary

Problems solved by technology

Because the microwave material high temperature test system is difficult to calibrate with calibration parts, it is impossible to deduct the influence of some test parts, and it is impossible to obtain very accurate dielectric properties of materials.

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