High temperature calibration device and calibration method for microwave dielectric material testing
A microwave dielectric material and calibration device technology, which is applied in the direction of measuring devices, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problems of inability to deduct test parts and obtain the dielectric properties of materials, and achieve automatic calibration , Improve the test accuracy, and the effect of simple manufacturing process
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[0037] Embodiments of the present invention are described below through specific examples, and those skilled in the art can easily understand other advantages and effects of the present invention from the content disclosed in this specification. The present invention can also be implemented or applied through other different specific implementation modes, and various modifications or changes can be made to the details in this specification based on different viewpoints and applications without departing from the spirit of the present invention.
[0038] Please refer to accompanying drawing, present embodiment provides a kind of high-temperature calibration device for microwave dielectric material test, comprising: vector network analyzer 1, two sets of waveguides that are connected with vector network analyzer 1 respectively and the same size, each cover of waveguide includes The coaxial to waveguide conversion joint 2, cooling waveguide 3, high reflection and straight-through ...
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