32results about How to "Problem is caused" patented technology

A cable winding mechanism with reduced friction includes a cable, a case, a reel disc, a spring device, a roller and a friction-reducing member. The case includes a first case element and a second case element, wherein a cable locking structure is formed in an inner surface of the second case element. The reel disc has a confining groove. The roller is movable along the confining groove of the reel disc. When a pulling operation of the cable causes the roller to move in the cable locking structure of the second case element, a desired length of the cable is pulled out and locked. When the roller is detached from the cable locking structure, the cable pulled outside the case is rewound on the reel disc. The friction-reducing member is disposed on the reel disc for reducing friction during the process of pulling out or rewinding the cable.

A test chamber is pivotably suspended in an aircraft, so that the center of gravity of the test chamber always self-actingly orients itself in the direction of the effective residual acceleration. To simulate a selected acceleration greater than 0 g and less than 1 g, the aircraft is flown along a parabolic flight path with a downward vertical acceleration such that the difference between Earth's gravitational acceleration and the aircraft's acceleration corresponds to the selected acceleration to be simulated. To simulate gravitational conditions on Mars, the aircraft is flown with a downward vertical acceleration of about 2 / 3 g, so that the residual acceleration acting on the test chamber is about 1 / 3 g. The atmospheric conditions, such as the gas composition, pressure and temperature, of Mars can also be established in the test chamber.

An apparatus for imaging a field of view, according to an embodiment of the present invention, comprises an x-ray source positioned adjacent to the field of view, a source mask located between the x-ray source and the field of view having at least one source aperture defined therethrough, and an emission detector, such as a gamma camera, adjacent to the field of view. The apparatus may allow substantially concurrent x-ray imaging and gamma imaging of the field of view.

A cab for a construction machine includes hinges that swingably mount the door to the wall. Each of the hinges includes a first member secured to a first cut-out portion of the wall, a second member secured to a second cut-out portion of the door, an interposed member interposed between the first and second members, and first and second pivot shafts pivotally respectively coupling the first and second members to the interposed member. The cab further includes first and second stoppers that regulate first and second angles of the interposed member with respect to the first and second members, respectively, and a bolt member arranged in the second stopper to move in its axial direction to adjust the second angle. An imaginary surface corresponding to an outermost part of each of the hinges is substantially coplanar with exterior surfaces of the wall and the door, when the door is closed.

The present invention provides organic-inorganic composite particles having a suitable biodegradability. The organic-inorganic composite particles of the present invention include a silica component and a biodegradable plastic. The organic-inorganic composite particles have a mean particle diameter (d1) ranging from 0.5 μm to 25 μm, an absolute specific gravity greater than 1.0 g / cm3 and equal to or smaller than 2.0 g / cm3, and a contact angle with water of 90° or less. A cosmetic product including the organic-inorganic composite particles has good texture characteristics.

A semiconductor device having a multilayer structure, each layer including: a dummy pattern for ensuring a flatness thereof; a pad area in which a bonding pad is formed; an input-output circuit area in which an input-output circuit is formed, the input-output circuit area being adjacent to the pad area in plan view; and a dummy pattern confined area for forbidding an arrangement of the dummy pattern in every layer included in the semiconductor device, the dummy pattern confined area being provided between the pad area and the input-output circuit area in plan view.