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73results about How to "Improve horizontal resolution" patented technology
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Super-resolution laser polarization differential confocal imaging method and device
ActiveCN101852594AImprove horizontal resolutionImprove linearityUsing optical meansBeam expanderPupil
The invention belongs to the technical field of optical precision measurement, relating to super-resolution laser polarization differential confocal imaging method and device. The method improves the transverse resolution power by combining a radial polarized light and a pupil filtering technology, improves the axial resolution power by using a differential subtraction detection technology of an axial-offset dual-detector system and remarkably improves the spatial resolution power and tomography ability of the system. The device comprises a laser source as well as a beam expander, a polarization state modulation system, a pupil filter and a spectroscope which are sequentially arranged at a transmitting end of the laser source, an objective and a sample which are arranged in the transmitted light direction of the spectroscope in turn, and a differential confocal system in the opposite direction of the reflected light direction of the spectroscope. The invention combines the radial polarized light resolution technology with the pupil filtering technology and improves the transverse resolution power of the system; moreover, the differential work mode of the invention can remarkably improve the axial imaging ability of the system and is applicable to the high-precision detection and metering of nanometer-level geometrical parameters in the nanometer manufacturing field.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
Shaping ring light-beam differiential confocal sensor with high space resolution capability
InactiveCN1529123AExtended Axial Measuring RangeImprove horizontal resolutionUsing optical meansBeam splitterLine width
The invention is a kind of sizing ring light beam differential confocal sensor with high spatial resolution. It includes laser device, beam expanding device, pin hole, ring light sizing device, adjustable light conjunction, polarized beam splitter, 1 / 4 wave piece, tracing inductance sensor, measuring lens, the beam splitter, collecting mirror, pin hole and two photoelectric detector behind the two holes. The invention combines the optical hyper resolution and differential confocal micro trancing technology, in order to enhance the resolution and the range of the sensor; it caters the demands of high spatial resolution, high accuracy, and large measuring range. Especially applies to the measurement of tiny structure, micro stage, tiny grooves, line width and the surface shape.
Owner:HARBIN INST OF TECH
Method for measuring inside and outside outline as well as wall thickness of differential confocal targeting trigger-type hollow sphere and device therefor
ActiveCN101629814AReduce the effect of measuring aiming characteristicsImprove horizontal resolutionUsing optical meansInterference resistancePupil
The invention belongs to the field of precise optical measurement, and relates to a method for measuring inside and outside outline as well as wall thickness of a differential confocal targeting trigger-type hollow sphere and a device therefor. The method utilizes a differential confocal 'optic probe' sensor to collimate the inner and the outer surfaces of the hollow sphere, and the collimation is matched with the rotation of a working platform, so that the measurement for the outlines of the inner and the outer surfaces as well as the wall thickness of the whole hollow sphere can be completed. Meanwhile, pupil filter technique can be used for improving the resolution and the sensitivity of a system. The invention provides the method for measuring the outlines of the inner and the outer surfaces as well as the wall thickness of the hollow sphere in a trigger way by utilizing a zero point of a differential confocal response curve for a first time, so that the problem that the outlines of the inner and the outer surfaces as well as the wall thickness of the hollow sphere can not be measured at the same time. The differential confocal 'optic probe' sensor detects light intensity signals, and has the advantages of high accuracy, strong ambient interference resistance capability, not damaging measured objects, etc.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
Reflection multilight bean confocal interference microscope having several tens nanometer lateral discriminability
InactiveCN1758015AImprove horizontal resolutionImprove stabilityUsing optical meansMicroscopesFocal positionMicroscopic scale
A reflection-type multiple optical beams co-focusing and interfering microscope with high transverse resolution (tens nm) is composed of light source, collimation diffuser, the first polarized splitter, the first 1 / 4 wave plate, object lens, light-gathering lens, pinhole at the focuse position of said light-gathering lens, photoelectric detector, the second polarized splitter behind the first one, the second 1 / 4 wave plate and multi-beam generator.
Owner:HARBIN INST OF TECH +1
Ellipsoid-based reflecting lighting confocal measuring device
InactiveCN102818521ALarge numerical apertureImprove matchUsing optical meansBeam expanderMicrotechnique
The invention discloses an ellipsoid-based reflecting lighting confocal measuring device, belonging to an optics microtechnique. A collimation beam expander, a large numerical aperture focusing objective lens, a pinhole, a three-dimensional micrometric displacement objective table, a focusing objective lens, a detecting pinhole and a detector are arranged on a laser direct light path in sequence; an ellipsoid reflecting lens is configured on the laser direct light path and at a position between the focusing objective lens and the detecting pinhole; a remote focus of the ellipsoid reflecting lens is located on the pinhole; a near focus of the ellipsoid reflecting lens is located on a surface of a sample arranged on the three-dimensional micrometric displacement objective table. With the adoption of the ellipsoid-based reflecting lighting confocal measuring device, a defect that an axial resolution force in a traditional confocal measuring technology is limited by an objective lens numerical aperture is overcome, lighting to large numerical apertures is realized, so that a transverse resolution force and the axial resolution force of a system are greatly improved.
Owner:HARBIN INST OF TECH
Super-resolution array virtual structure light lighting imaging device and method
ActiveCN105758799ARaise the spatial cutoff frequencyHigh bandwidthMaterial analysis by optical meansBeam expanderLight spot
The invention relates to an imaging device and method, in particular to a super-resolution array virtual structure light lighting imaging device and method, and aims to solve the problem that microscopic imaging technology can only measure thin biological samples, thereby being low in measuring efficiency in the prior art.The device comprises an LED light source 1, a collimating beam expander 2, a scanning system 3, a micro lens array 4, a collimating lens 5, a beam splitting prism 7, a one-fourth wave plate 9, a lighting object lens 10, a sample 11, a collection lens 6 and a CCD (charge coupled device) detector 8.Detection light spots obtained by scanning of each time are directly stacked on the mirror surface to obtain primary detection data, scanning different in phase lighting is performed in each direction, and super-resolution images are obtained through image reconstruction.The super-resolution array virtual structure light lighting imaging device and method expands spatial frequency domain bandwidth and is suitable for the measuring field of industrial shape and thick biological sample imaging.
Owner:HARBIN INST OF TECH
Three-differential focasing micro-three-dimensional super-resolution imaging method
InactiveCN1609590AImproved lateral super-resolution characteristicsImprove horizontal resolutionSurface/boundary effectMaterial analysis by optical meansFine structureLine width
The present invention belongs to the field of optical microscopic imaging and micro measurement technology, and is one 3D three-differential confocal microscopic imaging method with very high S / N ratio and 3D super resolution imaging capacity. The present invention fuses the three-differential confocal scanning method with high axial resolution and pupil filtering confocal scanning method with high transverse resolution to constitute the 3D pupil filtering three-differential confocal microscopic imaging method. The method may be used in measuring 3D surface appearance, 3D fine structure, micro step, micro channel, IC line width, etc.
Owner:严格集团股份有限公司
Multichannel transient Rayleigh wave detection method
InactiveCN104216003AImprove work efficiencyImprove horizontal resolutionSeismic signal processingSoil propertiesPhase difference
The invention relates to the engineering geological investigation field, in particular to a multichannel transient Rayleigh wave detection method. The multichannel transient Rayleigh wave detection method includes steps: obtaining arrival time difference tau between two transient Rayleigh waves collected by two wave detectors on two adjacent detection points, wherein setting an interval between the two detection points to be arbitrary large on the premise of guaranteeing invariability of foundation soil properties between the two detection points; figuring out phase difference delta phi(f) among different frequency components of the two transient Rayleigh waves of the two adjacent detection points according to the equation that delta phi(f)=delta phi0(f)+2piftau, wherein defining 2piftau as a time difference phase position between two channels; using a phase difference method to figure out corresponding multichannel transient Rayleigh wave phase speed according to the obtained phase difference. The multichannel transient Rayleigh wave detection method gets rid of fetters of a channel interval by introducing the time difference phase position 2piftau into extraction of the Rayleigh wave phase difference among the different frequency components of the two transient Rayleigh waves, uses the two wave detectors to extract the Rayleigh wave phase difference among the different frequency components of the two transient Rayleigh waves, and thereby significantly improves work efficiency, transverse resolution and high frequency resolution of transient Rayleigh wave detection.
Owner:CHINA UNIV OF GEOSCIENCES (BEIJING)
High spatial resolution biaxial differential confocal spectrum microscopic imaging method and apparatus
ActiveCN103926197AImprove horizontal resolutionReduce intensityRaman scatteringMicroscopesVisual field lossHigh spatial resolution
The invention belongs to the technical field of spectrum measurement, and relates to a high spatial resolution biaxial differential confocal spectrum imaging method and an apparatus. According to the present invention, the biaxial differential confocal microscopy technology and the spectrum detection technology are fused, focal spot cutting differential detection is adopted so as to achieve precise imaging of the geometry position, simplify the optical path structure of the traditional differential confocal microscopy system, inherit the advantages of large visual field and large work distance of the biaxial microscopy technology, and achieve high spatial resolution spectrum integrated detection of the system; and high spatial resolution is provided, three modes such as three-dimensional tomography geometry imaging, spectrum detection and micro-region spectrum tomography imaging are provided, a new solving approach is provided for micro-region spectrum detection, and broad application prospects are provided in the fields of biomedicine, physical material science and the like.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
Super-resolution array scanning structure light illumination imaging apparatus and imaging method thereof
ActiveCN105486638AImprove horizontal resolutionRaise the spatial cutoff frequencyMaterial analysis by optical meansBeam expanderPrism
The invention relates to an imaging apparatus and an imaging method thereof, and concretely relates to a super-resolution array scanning structure light illumination imaging apparatus and an imaging method thereof. The purpose of the invention is to solve the problems of only measurement of a thin biological sample through a microscopic imaging technology, obvious influences of the scattering effect on incident diffracted lights of parallel lights, and low measurement efficiency in the prior art. The apparatus comprises an LED light source, and a light intensity modulator, a collimating beam expander, a scanning system, a microlens array, a collimating lens, a light splitting prism, a 1 / 4 wave plate, an illumination objective lens, a sample, a collecting lens, a CCD light intensity detector and a data collection card are sequentially arranged along the light propagation direction of the LED light source; and detection light spots obtained after every scanning are directly superposed on an image plane to obtain initial detection data, illumination scanning in different phases is carried out three times in every direction, and a super-resolution image is obtained through image reconstruction. The apparatus and the method widen the spatial frequency domain bandwidth, and are suitable for being used in the measurement fields of industrial morphology and imaging of thick biological samples.
Owner:HARBIN INST OF TECH
Laser stimulated emission depletion (STED) and three-dimensional superresolving spectral pupil differential confocal imaging method and device
ActiveCN104482880AImprove spatial resolutionImprove horizontal resolutionUsing optical meansMicro nanoPupil
The invention belongs to the technical field of test of optical precise imaging, and relates to a laser stimulated emission depletion (STED) and three-dimensional superresolving spectral pupil differential confocal imaging method and device. The method and device are characterized in that the spectral pupil laser differential confocal detecting technology and the laser STED imaging technology are organically integrated, the characteristics of high resolution and high scatter suppression of the spectral pupil laser differential confocal detecting technology are integrated, the laser differential confocal technology is performed to improve the axial resolution capacity, the STED technology is performed to improve the transverse resolution capacity, and as a result, the spatial resolution capacity of the system and the resistance to sample scattering can be improved. The device comprises an excitation laser system, a first dichroic mirror, a quarter-wave plate, a measuring objective lens, a sample, a scanning workbench, a quenching laser system, a beam-shaping system, a second dichroic mirror, a spectral pupil differential confocal detecting system and a data processing module. The method and device have an extensive application prospect in the micro-nano technical field with the high spatial resolution and high scattering sample suppression three-dimensional superresolving imaging and detecting capacities.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
Ultra-resolution dual shaft differential confocal measurement method and device
InactiveCN101458071AEffective balance space sizeImprove resolutionUsing optical meansDual axis confocalLight beam
The invention belongs to the technical field of optical precise measurement and relates to a super-resolution double-shaft differential confocal measuring method and a super-resolution double-shaft differential confocal measuring device. In the method and the device, pupil filtering technology is fused in a double-shaft confocal measuring structure, and a differential treatment method is used for receiving a measured light beam and carrying out treatment, thereby achieving the aims of improving resolution, expanding working distance, improving anti-interference capability and improving linear range. The invention can be used for precise measurement in such fields as micro-electronics, materials, industrial precise detection, biomedicine, etc.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
Full parameter detection apparatus of polished surface quality of optical element and detection method thereof
ActiveCN102425998ATrue and effective reflectionIncrease contrastPolarisation-affecting propertiesUsing optical meansControl cellEngineering
Owner:XIAN TECH UNIV
Laser three-differential cofocal theta imaging detection method
InactiveCN102636118AGood effectSuppresses fluctuations in light intensityUsing optical meansImage detectionLight beam
The invention belongs to the field of measuring a microfine structure of surfaces, relating to a laser three-differential cofocal theta imaging detection method. In the method, optical path arrangement with cofocal theta microscopy is adopted to scan and measure detected samples, the pupil plane of an objective lens is divided into a lighting pupil and a collecting pupil, an incident beam is converged on a detected surface by the objective lens after permeating the lighting pupil, reflected light carrying information of the detected samples is converged on a detection plane by a converging lens after passing the collecting pupil, three areas are arranged on a detected focal plane to obtain the response of the three areas and obtain the response characteristic equation of a detector, and the surface appearance and microscale of the detected samples can be reconstructed according to the intensity of a curve in a linear area or a position where the intensity is zero. In the method, the structure is simple, the resolution capability and range capacity can be effectively considered, and optical high-resolution absolute measurement on the surface appearance, three-dimensional microfine structure and the like of an object can be realized.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
Device for detecting domain modulation of ferroelectric crystals in real time
InactiveCN102866129AMonitor and quantify dynamic changesGood for quantitative researchPhase-affecting property measurementsBeam splitterPrism
The invention relates to a device for detecting domain modulation of ferroelectric crystals in real time, and the device comprises a helium-neon laser, a filter, a collimating device, a first totally-reflection mirror, a second total-reflection mirror, a beam splitter prism, an imaging lens, a charge couple device (CCD) coupler and a computer. The device is contactless and free from damage and has high resolution ratio, not only can the dynamic variation of a domain structure be monitored in real time and quantitatively analyzed, but also the static response of the domain structure for an external electric field can be detected, and two-dimensional information and three-dimensional information of the reversal domain structure can be obtained.
Owner:SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Laser stimulated emission depletion (STED) and three-dimensional superresolving differential confocal imaging method and device
ActiveCN104482881AImprove spatial resolutionImprove horizontal resolutionUsing optical meansMicro nanoStimulated emission
The invention belongs to the technical field of optical precise imaging test, and relates to a laser stimulated emission depletion (STED) and three-dimensional superresolving differential confocal imaging method and device. The method and device are characterized in that the laser differential confocal detecting technology and the laser STED imaging technology are organically integrated, the laser differential confocal technology is performed to improve the axial resolution capacity, and while the STED technology is performed to improve the transverse solution capacity, so that the spatial resolution capacity of the system can be improved. The device comprises an excitation laser system, a first dichroic mirror, a quarter-wave plate, an objective lens, a sample, a scanning workbench, a quenching laser system, a beam shaping system, a second dichroic mirror, a differential confocal detecting system and a data processing system. The method and device have an extensive application prospect in the micro-nano technical field with the high spatial resolution three-dimensional superresolving imaging and detecting capacities.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
Image recovery and pupil filtering type transverse super-resolution confocal microscopic imaging method and apparatus
InactiveCN1837890AImprove horizontal resolutionIncreased complexityMicroscopesPolarizerPolarization splitter
This invention relates to an image recovery and pupil filtering type transverse super-resolution confocal microscopic imaging method and apparatus, which comprises a light source (1) with a collimated beam expander (2) and a pupil filter (3), a split-beam polarizer (4) with a 1 / 4 plate (5) and a microscopic objective lens (6) both on reflection path and a collecting lens (7) on transmitted path that comprises a pinhole (8) on focus of (7) and a CCD probe (9) behind (8). This invention improves system lateral resolution and has wide application.
Owner:HARBIN INST OF TECH
Transient electromagnetic detection apparatus and method of eliminating inductive disturbance
PendingCN108008451AEnhanced magnetic field radiationReduced mutual inductanceElectric/magnetic detectionAcoustic wave reradiationEngineeringInductance
The invention provides a transient electromagnetic detection apparatus and a method of eliminating inductive disturbance. The transient electromagnetic detection apparatus includes a coil device and aframework carrier, wherein the coil device includes dual transmission coils, receiving coils and a coil fixing mount; the dual transmission coils include first and second transmission coils which areparallel to each other, are not in the same plane and can generate counter magnetic fields at the center of the respective coil at any power-on moment; the receiving coils are arranged between the dual transmission coils, and for the distance, the constraint is that earlier signals are not beyond the amplitude; a rotation shaft which is parallel to the dual transmission coils and can drive the coil device to overturn is arranged on the coil fixing mount; and a nonmetal handle is arranged on the rotation shaft. The method of eliminating inductive disturbance measures the signals before and after 180DEG overturning of the coil device at the same position point and performs difference processing, by enabling the transmission coils in the detection apparatus to approach the area to be detected and enabling the normal of the transmission coils to be perpendicular to the area to be detected. The method of eliminating inductive disturbance enables earlier signals not to be beyond amplitude,and can capture whole course secondary field signals by eliminating inductive disturbance and enhance the distinguishing result.
Owner:ANHUI HUIZHOU GEOLOGY SECURITY INST
Millimeter-wave radar based detection method for object throwing from height
PendingCN110568433AAchieve integrationHigh gainRadio wave reradiation/reflectionTransceiverInformation capture
The invention discloses a millimeter-wave radar based detection method for object throwing from a height. An antenna array module of a millimeter-wave radar is connected with a millimeter wave transceiver module so as to send millimeter wave emission signals and receive scattered echo signals, echoes are received after that radio waves of the millimeter-wave radar are sent out, position data of atarget is measured according to time difference between receiving and sending, a calibration relation is established between the millimeter-wave radar and a camera, and time difference between a millimeter-wave radar sensor and a camera sensor is synchronized through a coordinate transformation method under dead reckoning; and a region of interest is determined through the millimeter-wave radar, and finally object throwing from the height is located through an image algorithm. The detection method has the following advantages that 1, the antenna aperture is small, the beam is narrow, the tracking and guiding precision is high, monitoring at low elevation angle is easy to perform; 2, the millimeter wave radar can realize extremely high angle, distance and speed resolution; and 3, the Doppler frequency is high, and the slow and vibration targets can be effectively detected and identified. Via the method, an obstacle can be more effectively detected by fusing information captured by the radar and the camera.
Owner:ZHENGZHOU TIAMAES TECH
Linear laser phase-shift interference triangular micro-displacement measuring device and method
ActiveCN108680108AImprove measurement efficiencyImprove horizontal resolutionUsing optical meansConverting sensor output opticallyGratingMeasurement device
A linear laser phase-shift interference triangular micro-displacement measuring device and method belong to the technical field of ultra-precision measurement. According to the invention, a phase-shift interference technology and a laser triangulation technology are combined to realize wide-range and high-precision micro-displacement measurement. According to the phase-shift interference principleand the laser triangulation principle, a light source output is changed into a linear parallel beam by adopting shape beam expansion, and four linear interference beams with 90-degree phase shifts insequence are obtained synchronously by grating beam splitting and a four-quadrant analyzer group. Meanwhile, a linear laser triangulation system obtains rough displacement measurement data by partialdiffuse reflection light. When the maximum error of linear laser triangulation measurement is less than 1 / 4 of an interference signal period, an accurate displacement value can be obtained by certainsolution. The measuring accuracy is high, the measuring range is wide, linear scan measuring can be realized, and the measuring device and method are suitable for measuring the step height, the filmthickness, the displacement / position of a moving part and the like in a microstructure device.
Owner:HARBIN INST OF TECH
Super-resolution structure detection array confocal fluorescence imaging device and imaging method thereof
ActiveCN105319195AImproving the imaging rateImprove horizontal resolutionFluorescence/phosphorescenceBeam splitterPrism
The invention provides a super-resolution structure detection array confocal fluorescence imaging device and an imaging method thereof, relating to imaging devices and imaging methods thereof and aiming to solve the problems that the resolution of the existing confocal limiting technology is difficult to increase and confocal images are not clear. The device comprises a laser source, wherein a collimator and beam expander, a beam splitter prism, a 1 / 4 wave plate, a scanning system, an illumination objective, a fluorescent sample, a collecting lens and a CCD (charge coupled device) detector are arranged along the ray propagation direction of the laser source in sequence. The device has the effects that integration is carried out on a detection plane to change the light sensitivity of a corresponding detecting location; the OTF (optical transfer function) bandwidth of a system is expanded; the spatial cut-off frequency of a confocal fluorescence imaging system is improved and the spatial frequency domain bandwidth is expanded, thus obviously improving the lateral resolution of the imaging system; and the device is applicable to the measurement field of industrial topographic imaging.
Owner:HARBIN INST OF TECH
Long-focus depth super-resolution secondary confocal measuring apparatus
ActiveCN101469972AImprove horizontal resolutionAxial range extensionUsing optical meansOptical pathMeasurement device
The invention discloses a long focal length super resolution two-time confocal measuring device, comprising a laser device, a collimation extender lens group, a polarizing beam splitter, a quarter wave plate, a super resolution filter, an adjustable stop, and a splitter, which are arranged on one optical path. The long focal length super resolution two-time confocal measuring device further comprises a data processing device for attaining and recording the optical signals detected by a point detector when a focusing objective lens is driven by a micro-drive apparatus to be different positions, and converting a plurality of optical signals of the detector into phase values via four-step phase shifting method. The invention pupil filter to compress the transverse diffraction mode of measurement light spot, and expand axial diffraction mode, thereby improving transverse resolution and expanding axial measurement range without reducing axial resolution.
Owner:日照菁英传媒科技有限公司
Super-resolution structure detection confocal coherent imaging device and imaging method thereof
ActiveCN105547145AImprove horizontal resolutionHigh bandwidthUsing optical meansCoherent imagingPrism
A super-resolution structure detection confocal coherent imaging device and an imaging method thereof relate to an imaging device and an imaging method thereof. The objective of the invention is to solve the problems that the resolution of the confocal spacing technology is difficult to improve and the confocal imaging is not clear. The device provided by the invention comprises a laser source; a collimation device, a beam splitter prism, a 1 / 4 wave plate, a scanning system, an illumination object lens, an industrial sample, a collection lens and a CCD detector are arranged in order in the ray propagation direction of the laser source; and integration is performed on the detection surface to change the luminous sensitivity corresponding to the detection position so as to allow the system CTF bandwidth to be enlarged. The spatial-cut-off frequency of a confocal coherent imaging system is improved, and the space frequency domain bandwidth is broadened, so that the transverse resolution of the imaging system is substantially improved; and moreover, the super-resolution structure detection confocal coherent imaging device and the imaging method thereof are suitable for the measurement field of the industry morphology imaging.
Owner:HARBIN INST OF TECH
Super resolution moving grating confocal imaging device and confocal imaging method
InactiveCN103256888ARaise the spatial cutoff frequencyLarge numerical apertureUsing optical meansGratingTime integral
The invention belongs to the technical field of optical precision measurement, and provides a super resolution moving grating confocal imaging device and a confocal imaging method. The super resolution moving grating confocal imaging device is provided with a modulation moving grating, a demodulation moving grating and a signal processing device. The modulation moving grating and the demodulation moving grating are the same in type and in space cycle, and do linear motion or circumferential rotation at a conjugate position between an object space and an image space in constant speed in opposite directions. The signal processing device has a filtering or time integral function. The confocal imaging method includes the steps of using the modulation moving grating to carry out space-time modulation on light passing through samples in a confocal system, carrying out demodulation through the demodulation moving grating before the modulation light enters a light intensity detector, obtaining the instantaneous light intensity signals of scanning points, and carrying out signal processing to obtain the light intensity of the scanning points. The super resolution moving grating confocal imaging device and the confocal imaging method can improve spatial-cut-off frequency of the confocal system, even can enable implicit vector wave components to participate in imaging, broaden space frequency band width, and remarkably improve horizontal resolving ability, and is especially suitable for the measuring field for improving numerical aperture and achieving the measuring field of near-field implicit vector wave components imaging in a far field.
Owner:HARBIN INST OF TECH
Super-resolution acousto-optic modulation confocal imaging device and method
ActiveCN103245292ARaise the spatial cutoff frequencyLarge numerical apertureUsing optical meansPhysicsFrequency domain
A super-resolution acousto-optic modulation confocal imaging device and method belongs to the technical field of precise optical measurement. The device is provided with a Raman-Nath diffraction modulation acousto-optic grating and a Raman-Nath diffraction demodulation acousto-optic grating, which are the same in type and spatial period, and are driven ultrasonically at the same frequency in opposite directions in the conjugate position of the object space and the image space, and is provided with a signal processing device with a filtering or time integration function; the method is characterized in that light, passing through a sample, in a confocal system is subjected to space-time modulation by using the modulation acousto-optic grating, the modulation light is demodulated before entering into the demodulation acousto-optic grating so as to obtain a scanning spot instantaneous light intensity signal, and signal processing is carried out finally to obtain scanning spot light intensity. Even if no moving parts are required to be led into the device and the method, the spatial-cut-off frequency of the confocal system can be improved, even the implicit vector wave component can be enabled to participate in imaging, the space frequency domain bandwidth is widened, the transverse resolution of the system is improved remarkably, and the device and the method are especially suitable for increasing the numerical aperture and realizing the measuring field of the near-field implicit vector wave component during the far-field imaging.
Owner:HARBIN INST OF TECH
Method for improving phased array ultrasonic detection capability of R region of complex-shaped component
ActiveCN111289627AEasy to detectImprove lateral detection resolutionProcessing detected response signalNoiseEngineering
The invention discloses a method for improving phased array ultrasonic detection capability of an R region of a complex-shaped component, and belongs to the field of high-end equipment manufacturing and detection. The method comprises the following steps: establishing a phased array ultrasonic detection model of an R region of a component with a complex shape; designing a phased array ultrasonic surface adaptation method (SAUL), and combining the SAUL with a receiving focusing detection scheme; reading the sound time from each aperture array element to the corresponding focus by using a finiteelement model, and calculating a phased array ultrasonic detection receiving focusing rule of the R region of the complex-shaped component; transmitting ultrasonic waves by utilizing SAUL, receivingthe scanning signal A in parallel by each array element, and carrying out receiving focusing processing to obtain an imaging result of phased array ultrasonic surface self-adaption method combined with receiving focusing. According to the method, on the basis of SAUL, receiving focusing is combined to improve the transverse resolution of phased array ultrasonic detection of the R area of the component in the complex shape, so the detection noise is reduced, the artifacts are avoided, and a support is provided for high-quality detection of defects of the R area of the component in the complex shape.
Owner:DALIAN UNIV OF TECH
Super-resolution compound shade differential confocal measuring device and method
InactiveCN101358835ABest linear overlap intervalLarge axial response rangeUsing optical meansMeasurement deviceLight beam
The present invention discloses a super-resolution secondary-color differential confocal measurement method, which comprises the steps that a first differential confocal measuring device, a paralleling flat-plate correction color difference super-resolution measuring head and a computer device are provided; the thickness of the base of a super-resolution filter flat plate is precisely corrected, and the plane position adjustment of the two light beam is realized, so that the position difference of the two focus plane is equal to the sum of half of the linear measurement zone of the first differential confocal measuring device and half of the linear measuring zone of the second differential confocal measuring device. The present invention also provides a super-resolution secondary-color differential confocal measuring device. The device and the method have the advantages that on the premise of the technical advantage that the known secondary-color super-resolution differential confocal measurement technology has two independent dual-polarity tracing linearity areas, and the axial responding measuring range is maximum, so that the common mode interference can be prevented, the transverse resolution of the system is improved.
Owner:HARBIN INST OF TECH
Super-resolution structure detection array confocal coherent imaging device and imaging method thereof
ActiveCN105547144AImproving the imaging rateImprove horizontal resolutionUsing optical meansBeam splitterPrism
A super-resolution structure detection array confocal coherent imaging device and the imaging method thereof provided by the invention relate to an imaging device and an imaging method thereof. The objective of the invention is to solve the problems that the resolution of the confocal spacing technology is difficult to improve and the confocal imaging is not clear. The device provided by the invention comprises a laser source; a collimation device, a microlens array, a collimating lens, a beam splitter prism, a 1 / 4 wave plate, a scanning system, an illumination object lens, an industrial sample, a collection lens and a CCD detector are arranged in order in the ray propagation direction of the laser source; and integration is performed on the detection surface to change the luminous sensitivity corresponding to the detection position so as to allow the system CTF bandwidth to be enlarged. The transverse resolution of the confocal system is improved while the imaging rate of the structure detection confocal coherent imaging system is enhanced; and moreover, the super-resolution structure detection array confocal coherent imaging device and the imaging method thereof are suitable for the measurement field of the industry morphology imaging.
Owner:HARBIN INST OF TECH
Shallow transverse high-resolution Rayleigh wave exploration method and system
PendingCN111856551AAccurate mass testing or evaluationDetection qualitySeismic signal receiversSeismic signal processingRayleigh waveVery high resolution
The invention discloses a shallow transverse high-resolution Rayleigh wave exploration method and system. The method comprises the steps that: seismic wave data in a to-be-measured area are acquired;extracting Rayleigh wave data from the seismic wave data; calculating a frequency dispersion curve of Rayleigh waves by adopting an adjacent channel phase difference method; based on the obtained frequency dispersion curve, obtaining a depth profile corresponding to the Rayleigh wave phase velocity by adopting a depth-half wavelength conversion principle; and interpreting the profile according toa geological task to obtain the quality of a foundation reinforcing member and the strength of a geological anomalous body. According to the method and system of the invention, quality detection or evaluation can be carried out on the foundation reinforcing member (such as a mixing pile gravel pile, a dam diaphragm wall and the like) accurately; and the transverse resolution capability of the underground small geological anomalous body can also be improved.
Owner:SHANDONG ELECTRIC POWER ENG CONSULTING INST CORP
Tectonic background-based gravity fracture image recognition method
ActiveCN110703347AImprove effectivenessImprove practicalityGravitational wave measurementComputer graphics (images)Computer vision
The invention provides a tectonic background-based gravity fracture image recognition method. The tectonic background-based gravity fracture image recognition method comprises the steps: 1, bouguer gravity anomaly preprocessing is conducted, and basic data for carrying out processing and explaining is formed; 2, gravity difference trend surface field source separation is conducted, and gravity anomaly responses of a target strata are quantitatively depicted; 3, gravity anomaly enhancing and processing conversion are conducted, linear structure weak information is enhanced, and small-level fracture linear images are highlighted; 4, multiple processing conversion results are jointed to establish a nonlinear target function of a narrowing gradient zone; and 5, comprehensive analysis on the fracture linear images is conducted, and different levels of fracture occurrences and combination forms are determined. According to the tectonic background-based gravity fracture image recognition method, the effectiveness and practicability that gravity data fine depict a fracture target are improved, the lateral resolving capacity is improved, the fracture boundary characteristic is highlighted,and a fracture tectonic framework can be clearly recognized.
Owner:CHINA PETROLEUM & CHEM CORP +1
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