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274 results about "Absolute measurement" patented technology

Absolute measures take the form of positive numbers, regardless of whether they represent high or low estimations. Relative measures are the major alternative to absolute measures. They use statistical variations based on percentages to determine how far from reality a figure is within context.

Device for high-resolution measurement of magnetic fields

A device is proposed for high-resolution measurement, in particular for high-resolution absolute measurement of magnetic fields, having a network (1) of transitions (3) between superconductors (5, 6) which exhibit Josephson effects, called junctions below, the network comprising closed meshes (7, 8, 9, 10, 11, 12, 13), denoted by cells below, which in each case have junctions (3), which junctions are connected in a superconducting fashion, and at least three of these cells being connected in a superconducting and / or nonsuperconducting fashion. The object of the invention consists in further developing this device in such a way that it is possible to make absolute measurements of magnetic fields in a highly sensitive fashion. This object is achieved by virtue of the fact that the junctions (3) of the at least three cells (7, 8, 9) can be energized in such a way that a time-variant voltage drops in each case across at least two junctions of a cell, the time average of which voltage does not vanish, and in that the at least three cells are configured differently geometrically in such a way that the magnetic fluxes enclosed by the cells in the case of an existing magnetic field differ from one another in such a way that the frequency spectrum of the voltage response function has no significant Phi0-periodic component with reference to the magnetic flux.
Owner:QEST QUANTENELEKTRONISCHE SYST

Self-calibrating optical fiber pressure, strain and temperature sensors

Broadband energy incident on a transducer having partially or fully reflective surfaces separated by a gap which is greater than the coherence length of the broadband energy but smaller than one-half a coherence length of a band of energy within said broadband energy causes a portion of the spectral content of the broadband energy corresponding to a coherence length greater than twice the gap length to exhibit interference effects while the average power of the broadband energy remains unaffected. Splitting energy reflected from the transducer into two beams which are filtered at preferably similar center frequencies but with different pass bands yields beams which are radically different in sensitivity to changes in gap length. Analyzing the beams to derive a ratio of powers (since source intensity and fiber attenuation in a common fiber are thus self-cancelling) allows high accuracy and high resolution absolute measurement of temperature, pressure or strain. Effects of any of these physical parameters which are not of interest in a measurement can be fully compensated or made arbitrarily insignificant in a simple transducer structure of extremely small size. Use of broadband energy permits measurement over greater lengths of optical fiber.
Owner:VIRGINIA TECH INTPROP INC

System and method for measuring an optical path difference in a sensing interferometer

An apparatus and a method of measuring an optical path difference in a sensing interferometer. Light from a source is directed in the sensing interferometer. The light reflected from the sensing interferometer is splitted into first and second beams respectively directed into two reference interferometers having optical path differences greater than the coherence length of the source and such that the optical signals are in quadrature. The intensities of the light transmitted by the reference interferometers and recombined light reflected from the reference interferometers are detected for measuring the optical path difference in the sensing interferometer. Additional light sources allow for correction of internal perturbations and absolute measurement of the optical path difference in the sensing interferometer.
Owner:FISO TECH

Scale structures and methods usable in an absolute position transducer

An absolute position-sensing device is usable to measure the relative position of two elements. An absolute scale includes an integrated track extending along a measuring axis of the scale. The integrated track includes a plurality of periodic portions interleaved with a plurality of non-periodic portions. Each periodic portion includes a plurality of periodically-placed scale elements. Each non-periodic portion includes a plurality of code elements indicative of an absolute measurement value. The code elements may have a length that is narrower along the measuring axis than the length of the periodic scale elements. The offset of the periodic-placed elements relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position.
Owner:MITUTOYO CORP

Attitude testing apparatus and method based on autocollimator

ActiveCN105021211AContinuous attitude measurementMeet measurement needsMeasurement devicesAttitude testingAutocollimation
The invention relates to an attitude testing apparatus and method based on an autocollimator. The apparatus mainly comprises the autocollimator, an optical hexahedron, a double-shaft electronic level meter and a pedestal with a leveling function. The method comprises the following steps: putting the attitude testing apparatus on a firm base, allowing the autocollimator to collimate a reflecting surface of an object, then collimating the optical hexahedron with an autocollimation gyro theodolite and measuring the included angle between the apparatus and a true north azimuth reference; starting the autocollimator for recording and retrieving of continuous data of the attitude of the reflecting surface of the object and starting the double-shaft electronic level meter for recording and retrieving of continuous data of horizontal attitude; and after completion of recording and retrieving of the data, processing the data of the autocollimator and the double-shaft electronic level meter by using a data processing method for the attitude testing apparatus so as to eventually obtain continuous changes of the attitude of the reflecting surface of the object in a geographic coordinate system, thereby meeting demands of continuous absolute measurement.
Owner:TIANJIN NAVIGATION INSTR RES INST

Modulated fibre bragg grating strain gauge assembly for absolute gauging of strain

A modulated fibre Bragg grating strain gauge assembly for absolute gauging of strain including at least one sensor element (1) in the form of a length of optical fibre containing, along part its length, means for partially reflecting light (1a), means for generating and passing a beam of light (2a) with a spectral feature less than 0.1 nanometers in width into the at least one sensor element (1) where reflection takes place, which reflection is a substantially sinusoidal intensity variation in wavelength over a range of from 2 to 3 nanometers comprising at least two substantially sinusoidal periods such that as the at least one sensor element sustains a change in length resulting from a strain thereon, the reflected intensity varies substantially sinusoidally along the at least two sinusoidal periods, means for receiving and processing the reflected light (2b) to establish the light intensity values at one (1f) and two times (2f) a modulation frequency (1f) applied to the means for generating the beam of light (2a), and means to determine an absolute direction and magnitude of strain from a ratio of the intensity values 1f:2f.
Owner:BAE SYSTEMS PLC

Nonspherical absolute measuring system based on multiwave front lens compensator

InactiveCN101876540AAvoid specificityWith flexible measuring rangeUsing optical meansData processing systemEngineering
The invention relates to a nonspherical absolute measuring system based on a multiwave front lens compensator, which comprises a phase shifting interferometer, a standard lens, a multiwave front lens compensator, an electric control adjusting device and a driver thereof, a measured nonspherical optical element, a six-dimensional adjusting frame, an electric control translation platform and a drive thereof as well as a computer control and date processing system, wherein the multiwave front lens compensator comprises a plurality of optical elements or element groups. The invention realizes error separation by a plurality of interferometry for improving the surface shape detecting precision of the nonspherical optical element and has certain flexible measuring range and larger application value.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Systems and methods for absolute positioning using repeated quasi-random pattern

An absolute 2D position-sensing device is usable to measure the position of a first element with respect to a second element. A 2D absolute scale includes an integrated 2D absolute scale pattern extending over the 2D scale area along each measuring axis of the scale. The integrated 2D absolute scale pattern includes a predetermined quasi-random pattern repeatedly interleaved with a plurality of code portions along each axis. Each code portion includes a plurality of code elements indicative of an absolute measurement value. The offset of the quasi-random pattern relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position to a very high resolution over a relatively large 2D range.
Owner:MITUTOYO CORP

Absolute position miniature grating encoder readhead using fiber optic receiver channels

ActiveUS7053362B2Highly accurate and economical and high configurationOvercome disadvantagesMaterial analysis by optical meansUsing optical meansFiberPhase grating
An absolute position fiber optic encoder readhead having multiple readhead portions for sensing the displacement of respective scale grating tracks of a scale is disclosed. The detector channels of the readhead portions are fiber optic detector channels having respective phase grating masks. The fiber optic encoder readhead portions are configured to detect the displacement of a self-image of a respective scale grating track of the scale. In various exemplary embodiments, the fiber optic readhead portions are constructed according to various design relationships that provide a relatively high signal-to-noise ratio. Accordingly, high levels of displacement signal interpolation may be achieved, allowing submicrometer displacement measurements. The fiber optic encoder readhead portions may be assembled in a particularly accurate and economical manner and may be provided in a package with dimensions on the order of 1–2 millimeters, resulting in a very small overall absolute readhead dimension that is dependent on the number of readhead portions that are incorporated. Optical fiber receiver channels carrying binary optical signals derived from a scale code track may be provided in the readhead, to provide an extended absolute measurement range.
Owner:MITUTOYO CORP

Track geometric state measurement system and method based on multisource information fusion technology

InactiveCN102251451AUniform push speedPushing for a uniform speedMeasuring apparatusTrackwayEngineering
The invention discloses a track geometric state measurement system based on a multisource information fusion technology and a track geometric state measurement method based on the multisource information fusion technology. The track geometric state measurement system comprises a track detection trolley and a total station, wherein the track detection trolley is provided with a computer with measurement software, a track gauge sensor, a longitudinal inclination angle sensor, a transverse inclination angle sensor, a mileage sensor and a three-dimensional top box. The invention also discloses the track geometric state measurement method. The invention has the advantages of high measurement precision and wide application range, integrates the advantage of absolute measurement of the total station and the advantage of locus measurement of the three-dimensional top box, and has remarkably higher measurement efficiency.
Owner:CHANGSHA HIGH TECH DEV ZONE RUIZHI ELECTROMECHANICAL TECH

Combination measuring instrument of optical fiber Mach-Zehnder and Michelson interferometer array

InactiveCN101329184ASolving Multiplexing ProblemsRealize inquiryCoupling light guidesConverting sensor output opticallyMeasuring instrumentMultiple sensor
The invention provides a measuring instrument with an optical fiber Mach-Zehnder interferometer and optical fiber Michdson interferometer arrays, which comprises a broad-band light source 1, a photoelectric detector 2, a 3dB optical fiber 2 multiplied by 2 coupler 3, the optical fiber Mach-Zehnder interferometer, a transposed 3dB optical fiber 2 multiplied by 2 coupler 7, optical fiber Michdson interferometers arrays 8 and 8', and a single-mode connecting optical fiber 9, wherein, the optical fiber Mach-Zehnder interferometer consists of an attenuator 4, a self-focusing lens 5, an axicon lens 6 with total reflection angle, and the connecting optical fiber 9. The measuring instrument with the optical fiber Mach-Zehnder interferometer and the optical fiber Michdson interferometer arrays utilizes a technique that measures strain and temperature at the same time, realizes the temperature compensation technique and the array arrangement of optical fiber sensors, realizes absolute measurement under the situation that the multiple sensors are not interfered by each other, lowers the cost of single-point measurement and ensures real-time measurement; furthermore, the measuring instrument has simple techniques and easy implementation, and as standard optical fiber communication elements are adopted as the optical fiber materials and devices, the measuring instrument has low cost, easy acquisition of the optical fiber materials and devices and easy popularization.
Owner:HARBIN ENG UNIV

Apparatus and method for testing optical glass homogeneity

The invention relates to an optical glass evenness testing device and a test method thereof. The testing device comprises a data acquisition system for an interferometer and a recombined system for a piece of optical glass to be tested, wherein, the interferometer and the data acquisition system consist of a laser, a beam splitter, an extender object lens, an imaging object lens, a CCD camera and an image acquisition processor; the recombined system for the optical glass to be tested comprises a flume; a bearing plate, a granite surface plate, a lifting net and the optical glass to be tested are arranged inside the flume in turn; the flume is provided with an exhaust valve and an injection valve, filled with refractive index matching liquid, communicated with a fluid reservoir which is provided with the refractive index matching liquid through a pipe and the injection valve, and is arranged on a tilt adjustment mechanism which is arranged on a shock-proof platform. The optical glass evenness testing device can directly measure the evenness of the optical glass the surface of which is not preprocessed, is absolute measurement of the refractive index evenness of the optical glass, and can reach the precision of 4x10<-7>.
Owner:SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI

Differential confocal Raman spectra test method

InactiveCN101290293AImproved microspectral detection capabilitiesImprove detection performanceRaman scatteringLight beamAbsolute measurement
The invention belongs to the micro-spectrum imaging technical field and relates to a differential confocal raman spectral test method. The method integrates the technical characteristics of the differential confocal detection method and the raman spectral detection method, forms a test method capable of realizing sample microarea spectral detection, precisely catches focus positions of excitation light beams through the differential confocal technology, detects raman spectra of corresponding positions, simultaneously adopts a designed pupil filter, sharpens Airy disc major lobes of a differential confocal raman spectral system, improves the microarea raman spectral detectability and precisely acquires microarea space spectrum information which comprises spectral information and position information of microarea samples. The method obviously improves the microarea spectral detectability of a confocal raman spectromicroscope, has absolute tracking zero points and bipolar tracking characteristics, realizes absolute measurement of physical dimension, can be widely applied in the technical fields such as biomedicine, life sciences, biophysics, biochemistry, industrial precision detection and so on to perform high-precision detection of geometric positions and spectral characteristics of microareas, and has very important application prospect.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

MEMS 2d and 3D magnetic field sensors and associated manufacturing method

The disclosure provides Hall effect device configurations capable of measuring magnetic fields in two dimensions (2D) and three dimensions (3D) along with associated microelectromechanical system (MEMS) manufacturing methods. The present invention includes various geometric layout configurations for 2D and 3D Hall effect devices with multidimensional magnetic field sensing elements. Advantageously, the present invention can provide, simultaneously and independently, absolute measurement of each of the components (i.e., x-, y-, and z-components) of a magnetic field. Additionally, the geometric layout configurations enable the Hall effect devices to be constructed with MEMS fabrication techniques.
Owner:JUNIVERSITI OF NORT KAROLINA EHT SHARLOTT

Scale structures and methods usable in an absolute position transducer

An absolute position-sensing device is usable to measure the relative position of two elements. An absolute scale includes an integrated track extending along a measuring axis of the scale. The integrated track includes a plurality of code portions interleaved with, or embedded in, a plurality of periodic portions. Each periodic portion includes a plurality of periodically-placed incremental scale elements. Each code portion includes a plurality of code elements indicative of an absolute measurement value. The code elements are arranged in code element zones along the direction perpendicular to the motion axis, and are detectable by associated variations along the direction perpendicular to the motion axis. The offset of the periodically placed elements relative to a readhead of the device is combined with the absolute measurement value to determine an absolute position.
Owner:MITUTOYO CORP

Sensing device for measuring the three-dimension shape and its measuring method

The present invention discloses a sensing device for measuring the three dimension shape and its measuring method. The said sensing device includes a projecting device, an observing device, a projecting localizer, an observing localizer and a computer for data processing. The optic axis of the projecting device and the optic axis of the observing device are crossed on the surface of the object by the relative motion and the focusing of the projecting device and the observing device, such that the viewing field of the whole field measurement and the position of the zero-order fringe are determined. The projecting device and the observing device are focused automatically by means of the object distance and the image distance of the projecting device in this viewing field, and the object distance and the image distance of the observing device in this viewing field. The camera in the observing device records the fringe patterns respectively after phase shifting and the computer calculates the three dimension surface shape of the object. The present invention achieves whole-field high accuracy and high speed absolute measurement of the three dimension object shape in the variable viewing field.
Owner:LIU LANG

Insulation Test Cryostat with Life Mechanism

A multi-purpose, cylindrical thermal insulation test apparatus is used for testing insulation materials and systems of materials using a liquid boil-off calorimeter system for absolute measurement of the effective thermal conductivity (k-value) and heat flux of a specimen material at a fixed environmental condition (cold-side temperature, warm-side temperature, vacuum pressure level, and residual gas composition). The apparatus includes an inner vessel for receiving a liquid with a normal boiling point below ambient temperature, such as liquid nitrogen, enclosed within a vacuum chamber. A cold mass assembly, including the upper and lower guard chambers and a middle test vessel, is suspended from a lid of the vacuum canister. Each of the three chambers is filled and vented through a single feedthrough. All fluid and instrumentation feedthroughs are mounted and suspended from a top domed lid to allow easy removal of the cold mass. A lift mechanism allows manipulation of the cold mass assembly and insulation test article.
Owner:NASA

Novel spherical absolute measurement system and method thereof

The invention discloses a novel spherical absolute measurement system and a method thereof, wherein the system comprises a computer, a light source, a light splitting unit, a filter, a standard object lens, a measured spherical reflecting mirror, an electro-control translation stage and a data acquisition and transmission unit; the method comprises the steps of: at first, adjusting the confocal location of the measured spherical reflecting mirror on the standard object lens by the electro-control translation stage, controlling a Fizeau interferometer by the computer to perform surface detection on the measured spherical reflecting mirror once and then storing the detection data in the computer, then controlling the electro-control translation stage by the computer to enable the measured spherical reflecting mirror to generate, around the focal point, confocal shears of lambda y and lambda y in relation to an optical axis of the interferometer, and using the interferometer to perform two detections respectively and storing the detection data of the two detections in the computer, and separating the surface data of the measured spherical reflecting mirror from errors of system and reference surface by data processing software in the computer among the three detected surface data so as to obtain the absolute surface information of the measured optical mirror surface.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Quick geometrical state measuring instrument for track

InactiveCN104775342AMileage real-time detectionTrack gauge real-time detectionTrack superstructureMeasuring apparatusFast measurementEnvironment effect
The invention discloses a quick geometrical state measuring instrument for a track. The quick geometrical state measuring instrument for the track comprises a hand-propelled track inspection trolley, an inertial navigation system, an inclination angle sensor, a linear displacement sensor, a speed and mileage sensor, an intelligent total station and a data acquisition controller, wherein a main body of the quick geometrical state measuring instrument for the track is the hand-propelled track inspection trolley which can walk along the track; sensors for detecting a speed, mileage, a track space, an inclination angle and the like, the inertial navigation system, the intelligent total station and the data acquisition controller are integrated on the hand-propelled track inspection trolley. The quick geometrical state measuring instrument for the track is based on the principle of combining absolute measurement with relative measurement, the geometrical ride comfort evaluation parameters, such as the mileage, the track space, the levelness, the twist warp, the track direction and the height of the track, and the absolute deviations of the plane and the elevation of the track can be detected in real time. By using the quick geometrical state measuring instrument for the track, the detection of the parameters of the track is realized through the inertial navigation system; the absolute constraint is carried out through the intelligent total station; the quick geometrical state measuring instrument for the track is high in precision and quick in speed, and is influenced less by an external environment.
Owner:北京力铁轨道交通设备有限公司

Absolute position encoder including scale with varying spatial characteristic and utilizing fourier transform or other signal processing

An electronic absolute position encoder is provided including a scale, a detector portion and a signal processing configuration. The scale includes a first scale pattern of signal modulating elements, wherein the first scale pattern includes a spatial characteristic of the signal modulating elements which progressively changes as a function of position along a measuring axis direction and defines an absolute measuring range. The spatial characteristic includes at least one of a spatial wavelength or a spatial frequency of the signal modulating elements and is unique at each unique position in the absolute measuring range. The detector portion includes a group of sensing elements, and the signal processing configuration determines an absolute position of the sensing elements relative to the scale within the absolute measuring range. In various implementations, the signal processing configuration may utilize Fourier transform processing and / or other processing for determining the absolute position.
Owner:MITUTOYO CORP

Method and device for absolutely measuring for radioactive gas nuclide activity

The invention relates to a method and a device for absolutely measuring for radioactive gap nuclide activity. The method comprises the following steps: 1) building a gas nuclide coincidence measurement device; 2) preparing a sample; 3) debugging the device; 4) measuring performance parameters of the device; and 5) measuring a gas radioactivity body source, and calculating specific activity. The invention solves the technical problem that the existing length compensation method has low absolute measurement specific activity to certain high-energy beta radial gas nuclide activity. The invention provides a new method for the absolute measurement of the gas nuclide activity.
Owner:NORTHWEST INST OF NUCLEAR TECH

Method for shimming first order of magnet

The invention relates to a method for actively shimming first order of a main magnet in a nuclear magnetic resonance measurement (NMR) system and a magnetic resonance imaging (MRI) system. The method comprises the steps of carrying out shimming on three directions orthogonalized in space, using echo deflection time as measurement of first order nonhomogeneity of a main magnetic field, using a linear relationship between difference of two echo deflection times and the first order nonhomogeneity gradient under a certain approximate condition so as to determine the first order nonhomogeneity gradient of the main magnetic field, changing absolute measurement to relative measurement, transforming calculation of determining the nonhomogeneity of the main magnetic field according to the phase position from calculation of determining the nonhomogeneity of the main magnetic field according to time through the Fourier transformation on the echo, and using slope of a straight line after multimetering linear fitting to replace calculation on single-point data. Meanwhile, the method can acquire quantitative data of vortex to provide solution for eliminating the vortex. The method remarkably improves the measurement precision, reduces number of iterations, accelerates shimming, and can be used for any magnet in NMR and MRI system.
Owner:北京海思威科技有限公司

Device and method for detecting optical surface profile

The invention discloses a device and a method for detecting an optical surface profile. Light which is emitted by a laser is reflected by a beam splitter, a collimation optical system, a reflective mirror and a reference surface to form reference light; the reference plane is interfered with a plane to be detected; interference light returns through an optical path, passes through the beam splitter and is collected to a charge coupled device (CCD) detector by a collecting mirror set to be received; a phase shifter is used for generating phase shift; a rotary table is used for controlling the rotation of the reference plane; a translation table is used for controlling the movement of the plane to be detected; the plane to be detected is moved by the translation table so as to measure different sub apertures on the plane to be detected; the rotary table is used for controlling the rotation of the reference plane; and surface profile information of two planes is solved by using two planes in the splicing process of the sub-apertures on the basis of the original three-plane measurement algorithm. By the method and the device, detection accuracy is improved, mirrors are not needed to be detected in the detection process, the absolute measurement can be finished by two planes, and the repeatability and the reproducibility of the detection are improved.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Method and device for surface appearance interference measurement

The invention relates to the field of surface appearance measurement and discloses a method and device for surface appearance interference measurement based on combination of multi-wavelength alternation and phase shift scanning. The method comprises the following steps that 1: a light source is started; 2: images are collected; 3: the light source is switched; 4: whether the light source is switched successfully or not is judged, and if the answer is negative, the step 2 is conducted; if the answer is positive, the position of a reference mirror is changed and interference signals of laser with different wavelengths in different positions of the reference mirror are collected; 5: whether collection is completed or not is judged, and if the collection is not completed, the step 1 is conducted; if the collection is completed, the data signals are processed and sample appearance parameters are calculated and displayed. The device for the surface appearance interference measurement comprises a light source unit, an interference microscopic measurement unit, an image collecting unit, a multi-wavelength switch unit, a piezoelectric ceramic PZY driving unit and an image processing and control unit. According to the method and device for the surface appearance interference measurement, the advantages of wavelength scanning and the phase shift scanning are fully used, so that high-accuracy absolute measurement of surface appearance is achieved.
Owner:HUBEI UNIV OF TECH

Optical path array and angular filter for translation and orientation sensing

A position sensor using a novel optical path array (OPA) element, an angle-selective spatial filter, and an imaging array is capable of measuring the translation and orientation relative to a target member in X, Y, Z, yaw, pitch, and roll (“6D”) simultaneously, and with high precision. A target member includes an array of target points surrounded by a contrasting surface. The position sensor uses the OPA element in combination with the angle-selective spatial filter in a target point imaging arrangement such that the imaging array of the position sensor only receives light rays that enter the OPA element according to an operable cone angle α. Accordingly, each target point generally produces a ring-shaped image having a size on the imaging array that varies with the Z position of each target point. The X-Y position of each target point image on the imaging array varies with the X-Y position of each target point. Accordingly, three or more target point images analyzed in the same image are usable to determine a 6D measurement relative to the target member. X and Y displacement of the target member can be accumulated by known methods and the other 6D measurement components are absolute measurements at any position.
Owner:MITUTOYO CORP

Method for measuring optical film absorption loss

A kind of method of measuring the optics thin film absorption loss and it is characterized in that: utilizes the drift phenomenon generating by the optics thin film component reflection or the transmitted spectrum changing with the temperature and collects the proper detection optical wavelength and adjusts the entrance angle of the detection laser-beam (low power) relative to the sample surface and makes the detection optical wavelength located in the maximum location of the brim of reflection or transmitted spectrum. Makes the strength cyclic modulate (high power) continuous or impulse leaser-beam as the heating light-struck thin film component thin layer and detecting the same or adjacent location and makes the detection light beam from the sample surface reflection or transmitted light strength modulated or generated the transient variation. Use the photoelectric detection to monitor the real-time variation of the detection light strength of the thin film component reflection or transmission of the illuminating process of heating leaser-beam and monitor the absorption loss water of the thin film and the real-time variation of the optics performance and it can realize the absolute measurement of actual absorption deterioration by scaling the signal amplitude of vibration. In addition that it can realize the two-dimension high resolution imaging of the absorption deterioration by scanning the lateral attitude of the thin film component. The method can enhance the sensitivity of measurement the absorption deterioration at some conditions.
Owner:INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI

Caliper method, system, and apparatus

A caliper atomic force microscope (AFM) comprises two AFM probes (each comprised of an oscillator and an attached tip) that operate on a sample in a coordinated manner. The coordinated operation of the AFM probes may be spatially or temporally coordinated. The result of the coordinated operation may be an image of the sample or a dimensional measurement of an unknown sample. The probes of the caliper AFM may be tilted, or the tips may be tilted at a non-orthogonal angle with respect to the probes, so as to enable the tips to access vertical sample surfaces or to enable the tips to touch each other. The tip shapes may include conical, boot-shaped, cylindrical, or spherical and materials from which the tips are fabricated may include silicon or carbon nanotubes. The oscillators may be beveled to allow the tips to operate in close proximity or in contact without interference of the oscillators. The disclosure of the present invention is discussed in terms of an atomic force (van der Waalls) interaction. Other interaction forces are contemplated, such as electrostatic force, magnetic force, and tunneling current. The caliper AFM may be calibrated with the help of a sample with known dimensions or by touching the probe tips. The tip-to-tip calibration enables absolute measurements without the need for a reference artifact, and it enables in-line calibration that may be performed during the measurement process.
Owner:XIDEX CORP

Phase-shift white light interferometry method based on 3*3 optical fiber coupler

The invention relates to an optical fiber white light interferometry method, in particular to a phase-shift white light interferometry method based on a 3*3 optical fiber coupler, belonging to the technical field of optical fiber sensing. A 2*2 optical fiber coupler and a 3*3 optical fiber coupler form an optical fiber M-Z interferometer, and a wavelength scanning light is injected into the optical fiber M-Z interferometer. Magnitudes of three paths of output white light interference spectrum signals are equal, and an angle of 120 degrees is formed between every two paths of output white light interference spectrum signals on the phase. When the wavelength scanning light scans from Lambda 1 to Lambda 2, three paths of output signals I1, I2 and I3 are obtained, and Delta is demodulated through computing or constructing two paths of orthorhombic signals and utilizing a derivation cross multiplying method. The Delta is subjected to the unwrapping operation to demodulate linear phase information after computed. The absolute optical path difference of the interferometer can be computed by using the linear phase information. The invention can absolutely measure the optical path difference of the optical fiber interferometer with high precision and high speed.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY
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