The invention relates to a
sample processing device for assisting or improving a
scanning electron microscope, and particularly relates to a frozen
sample preparation device for the
scanning electron microscope. At present, a sample fracture device for low-temperature
brittle fracture needs multiple equipment or devices to complete a
sample preparation process together, hardly ensures low-temperature environment of the sample in a
brittle fracture process, and is not suitable for requirements of batch
sample preparation. The invention provides the frozen sample preparation device for the
scanning electron microscope, wherein the frozen sample preparation device comprises a housing, a sample picking and placing device and a shocking device; the sample picking and placing device comprises a clamping groove; the clamping groove is composed of two clamping parts; the shocking device comprises an
impact rod, a support rod and a trigger mechanism; a shocking spring is arranged between the
impact rod and the support rod; the trigger mechanism is arranged between the
impact rod and the support rod; the trigger mechanism can return the impact rod to an original position or release the impact rod. The frozen sample preparation device provided by the invention has characteristics of sample picking and placing, freezing and
brittle fracture-integrated low-temperature environment, complete function, low cost, easy operation and the like, and provides a good tool for frozen sample preparation of the scanning
electron microscope.