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Frozen sample preparation device for scanning electron microscope

A scanning electron microscope and impact device technology, which is used in the preparation of test samples, measuring devices, sampling, etc., can solve the problems of difficulty in ensuring the low temperature environment of the sample, complicated operation process, and unsuitable for large-scale sample preparation requirements. Avoid low temperature damage, low cost, fully functional effect

Inactive Publication Date: 2017-06-09
INNER MONGOLIA UNIV FOR THE NATITIES
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The current sample fracture device used for low-temperature brittle fracture needs to place the sample in an ultra-low temperature medium (such as liquid nitrogen, etc.), take it out of the medium after being cooled to ice, and cut the section of the sample at room temperature. This method has a complicated operation process , multiple equipment or devices are required to complete the sample preparation process, and it is difficult to ensure the low temperature environment of the sample during the brittle fracture process. It is not suitable for the mass sample preparation requirements of biological samples, ductile film samples, etc.

Method used

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  • Frozen sample preparation device for scanning electron microscope
  • Frozen sample preparation device for scanning electron microscope
  • Frozen sample preparation device for scanning electron microscope

Examples

Experimental program
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Effect test

Embodiment 1

[0053] Such as Figure 1~4 As shown, the frozen sample preparation device described in this embodiment includes a housing 1, a sampling and setting out device 2, and an impact device 3. The housing 1 includes a tank body 1.1 and a cover body 1.2. The cover body 1.2 is fastened on the tank body 1.1. The stakeout device 2 and the impact device 3 are both arranged inside the housing 1; the cover body 1.2 is provided with a sampling chamber 1.2.1 and a control box 1.2.3, and the sampling chamber 1.2.1 is provided with a cover 1.2.2; The stakeout bin 1.2.1 and the control box 1.2.3 are used for the control part of the sampling device 2 and the impact device 3 respectively, and ensure the airtightness of the housing 1; Sampling and stakeout.

[0054] Such as Figure 5 As shown, the taking and setting out device 2 includes a bracket 2.1, a lifting rod 2.2, and a clamping groove 2.3. The bracket 2.1 is fixed on the bottom of the housing 1, the clamping groove 2.3 is installed on the b...

Embodiment 2

[0060] Such as Figure 9 , 10 As shown, on the basis of the above embodiments, this embodiment designs the clamping part 2.3.1 to be rotatable around the bracket 2.1, so as to cooperate with the impact of the impact device 3, buffer the impact action, and avoid other forms of damage to the sample. For this reason, the bracket 2.1 is provided with a blocking piece 2.1.1, the bracket part above the blocking piece 2.1.1 is cylindrical, and the clamping part 2.3.1 is arranged above the blocking piece 2.1.1 and can rotate around the bracket 2.1. At the same time, connecting parts 2.2.1 are also provided at both ends of the lifting rod 2.2, and the clamping part 2.3.1 has a connecting groove 2.3.3. part 2.3; in addition, in order to make the clamping part 2.3.1 return to the original position after being impacted and rotated, a return spring 2.3.4 can be set in the connection groove 2.3.3, and the return spring 2.3.4 can be With the limit block 2.3.5 as the support point, the clam...

Embodiment 3

[0062] Such as Figure 11 , 12 As shown, on the basis of the above embodiments, the stroke of the impact spring 3.4 in this embodiment can be adjusted to control its impact strength and position, and the stroke adjustment is realized by the adjustment structure 3.5 arranged on the strut 3.2. The adjustment structure 3.5 has multiple implementation forms, the following are two typical forms.

[0063] The first type: the adjustment structure 3.5 is a slideway 3.5.1, the slideway 3.5.1 is fixed on the cover body 1.2, the top of the pole 3.2 is connected to the slideway 3.5.1, and the pole 3.2 can be placed on the slideway 3.5. 1 slides upward; one end of the slideway 3.5.1 is provided with a knob 3.5.2, and the knob 3.5.2 is connected to the pole 3.2 through a gear-link transmission mechanism (the gear-link transmission technology is common, not shown in the figure), and rotates Knob 3.5.2 can make strut 3.2 shift on slideway 3.5.1, thereby can adjust the impact intensity of la...

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Abstract

The invention relates to a sample processing device for assisting or improving a scanning electron microscope, and particularly relates to a frozen sample preparation device for the scanning electron microscope. At present, a sample fracture device for low-temperature brittle fracture needs multiple equipment or devices to complete a sample preparation process together, hardly ensures low-temperature environment of the sample in a brittle fracture process, and is not suitable for requirements of batch sample preparation. The invention provides the frozen sample preparation device for the scanning electron microscope, wherein the frozen sample preparation device comprises a housing, a sample picking and placing device and a shocking device; the sample picking and placing device comprises a clamping groove; the clamping groove is composed of two clamping parts; the shocking device comprises an impact rod, a support rod and a trigger mechanism; a shocking spring is arranged between the impact rod and the support rod; the trigger mechanism is arranged between the impact rod and the support rod; the trigger mechanism can return the impact rod to an original position or release the impact rod. The frozen sample preparation device provided by the invention has characteristics of sample picking and placing, freezing and brittle fracture-integrated low-temperature environment, complete function, low cost, easy operation and the like, and provides a good tool for frozen sample preparation of the scanning electron microscope.

Description

technical field [0001] The invention relates to a sample processing device for assisting or improving a scanning electron microscope, in particular to a small, fast freezing sample preparation device for a scanning electron microscope. Background technique [0002] Scanning electron microscope (short for scanning electron microscope, SEM) is a new type of electronic instrument. It has the characteristics of simple sample preparation, wide adjustable range of magnification, high image resolution and large depth of field. The depth of focus of a scanning electron microscope is 10 times greater than that of a transmission electron microscope and hundreds of times greater than that of an optical microscope. Due to the large depth of field of the image, the obtained scanned electronic image is full of stereoscopic effect and has a three-dimensional shape, which can provide much more information than other microscopes. This feature is very valuable to users. For decades, scannin...

Claims

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Application Information

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IPC IPC(8): G01N23/22G01N1/28G01N1/42
CPCG01N1/286G01N1/42G01N23/2202
Inventor 马新军晓琴白玉玲
Owner INNER MONGOLIA UNIV FOR THE NATITIES
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