61 results about "Time of flight secondary ion mass spectroscopy" patented technology

A surface analysis apparatus includes a unit configured to bombard a sample surface with at least two types of ions having different sizes; a measurement device for measuring, with a time-of-flight secondary ion mass spectrometer, a mass spectrum of ions emitted from the sample surface; and an information processor outputting a difference between two mass spectra measured by bombardment of different types of ions.

The present invention relates to lithium composite compound particles having a composition represented by the formula: Li1+xNi1-y-zCoyMzO2 (M=B or Al), wherein the lithium composite compound particles have an ionic strength ratio A (LiO− / NiO2−) of not more than 0.3 and an ionic strength ratio B (Li3CO3+ / Ni+) of not more than 20 as measured on a surface of the respective lithium composite compound particles using a time-of-flight secondary ion mass spectrometer. The lithium composite compound particles of the present invention can be used as a positive electrode active substance of a secondary battery which has good cycle characteristics and an excellent high-temperature storage property.

In plane distribution of a target object contained in a sample is measured. The sample dispersedly placed on a substrate is treated to promote ionization of the target object. Then, the mass and flying amount of an ion containing the target object or a component thereof is determined by irradiating an ion beam to the sample and performing time-of-flight secondary ion mass spectrometry of the ion that flies from a portion in the sample where the ion beam is irradiated, and the in-plane distribution of the target object is determined from the mass and flying amount data obtained at plural portions by scanning the beam on the sample plane. The step of treating the sample to promote ionization of the target object includes contacting an aqueous solution of an acid that does not crystallize at ordinary temperature with the sample. A high spatial resolution two-dimensional image can be obtained.

A time-of-flight secondary ion mass spectrometer comprises an ion source which generates cluster ions each comprised of two or more atoms, a pulsing mechanism which pulses the cluster ions, a selecting mechanism which selects ions having a specific mass number from the pulsed cluster ions and passes the selected ions in an ON state of the selecting mechanism, and, passes the pulsed cluster ions without the selecting in an OFF state of the selecting mechanism, and a time-of-flight mass spectrometric unit which measures a mass spectrum of secondary ions generated from a sample using a difference in time of flight when the sample is irradiated with the ions passed through the selecting mechanism.

A measurement method is provided, which enables to obtain a two-dimensional image with better quantitative-ability by suppressing the influence of the charge-up, when the two-dimensional secondary ion image is obtained for a biological material fixed on a substrate having a high resistivity by utilizing a TOF-SIMS method in a certain wide area. A two-dimensional image having considerably high positioning resolution-ability can be obtained by the procedure in which the pulsed primary ion beam is irradiated at a spot, and the pulse-wise spot-applications of the primary ion beam and the simultaneous detection of the secondary ion generated from the irradiated primary ion beam proceed along with a discontinuous scanning pattern, and eventually the results of these secondary ion measurements are reconstructed into a two-dimensional image in line with the aforementioned discontinuous scanning pattern.

A rapid and efficient method for novel biological substance screening by surface analysis has been developed using Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). This method relies on the surface screening of an array of micro-organisms grown on porous membranes, which had previously been in contact with a solid growth medium. TOF-SIMS analysis differentiates among organisms producing different substances, either directly as molecular product, or indirectly through the use of multivariate statistical data reduction techniques. This method has many advantages over traditional microbial screening methods, which require sample preparation and time for assay development.

A time-of-flight secondary ion mass spectrometer comprises an ion source which generates cluster ions each comprised of two or more atoms, a pulsing mechanism which pulses the cluster ions, a selecting mechanism which selects ions having a specific mass number from the pulsed cluster ions and passes the selected ions in an ON state of the selecting mechanism, and, passes the pulsed cluster ions without the selecting in an OFF state of the selecting mechanism, and a time-of-flight mass spectrometric unit which measures a mass spectrum of secondary ions generated from a sample using a difference in time of flight when the sample is irradiated with the ions passed through the selecting mechanism.

The present invention aims to provide lithium composite compound particles which can exhibit good cycle characteristics and an excellent high-temperature storage property when used as a positive electrode active substance of a secondary battery, and a secondary battery using the lithium composite compound particles. The present invention relates to lithium composite compound particles having a composition represented by the compositional formula: Li1+xNi1−y−z−aCoyMnzMaO2, in which the lithium composite compound particles have an ionic strength ratio A (LiO− / NiO2−) of not more than 0.5 and an ionic strength ratio B (Li3CO3+ / Ni+) of not more than 20 as measured on a surface of the respective lithium composite compound particles using a time-of-flight secondary ion mass spectrometer.

A method for analyzing an object by means of TOF-SIMS is adapted to apply an ionization promoter (metal such as silver or gold) to the object and generate secondary ions that correspond to parent molecules and can be used to determine the type of the object. A segregation / refinement technique such as electrophoresis or thin-layer chromatography can be employed for a mixed protein sample by using the method to obtain a two-dimensional image showing a high spatial resolution.

A toner having good environmental stability, low-temperature fixability, development durability, and storage stability is provided. A toner includes toner particles each including a surface layer that contains an organic silicon polymer. The organic silicon polymer is obtained by polymerizing a compound having a specific structure. The surface layers have a particular average thickness Dav. In mapping by focused-ion-beam time-of-flight secondary ion mass spectroscopy, a ratio of silicon ions to carbon ions released from the toner particles upon irradiation of toner particle surfaces with primary ions is a particular value.

An information acquisition method for acquiring information on a target object, that includes a step of promoting ionization of the target object using a substance for promoting ionization of the target object to cause the target object to emit, and a step of acquiring information on the mass of the flew target object using time-of-flight secondary ion mass spectrometry.

The present invention provides a method of analysis which couples principle component analysis (PCA) with ToF-SIMS for obtaining surface chemical information from minerals. Statistical methods, based on the monolayer-sensitive time of flight secondary ion mass spectrometry (ToF-SIMS) technique, combined with principal component analysis (PCA) identifies combinations of factors strongly correlated (positively or negatively) in images or spectra from sets of data. In images, PCA selects these correlations from the mass spectra recorded at each of 256×256 pixels in a selected area of particles. In the image mode, PCA provides a much better method of selecting particles by mineral phase with clearer definition of particle boundaries due to multi-variable recognition.

A method of evaluating conjugation between materials using imaging of time-of-flight secondary ion mass spectrometry (TOF-SIMS) according to the present invention is carried out by following the steps, a) forming a spontaneous pattern on a substrate with a mixture containing nanoparticles and a conjugation material selected from organic, bio or inorganic material, b) obtaining an ion detection pattern from the conjugation material and nanoparticles, respectively, depending on their position on the substrate by using time-of-flight secondary ion mass spectrometry, and c) determining whether the conjugation is formed between the conjugation material and nanoparticles by comparing the ion detection pattern of the conjugation material with the ion detection pattern of the nanoparticles.

A measurement method is provided, which enables to obtain a two-dimensional image with better quantitative-ability by suppressing the influence of the charge-up, when the two-dimensional secondary ion image is obtained for a biological material fixed on a substrate having a high resistivity by utilizing a TOF-SIMS method in a certain wide area. A two-dimensional image having considerably high positioning resolution-ability can be obtained by the procedure in which the pulsed primary ion beam is irradiated at a spot, and the pulse-wise spot-applications of the primary ion beam and the simultaneous detection of the secondary ion generated from the irradiated primary ion beam proceed along with a discontinuous scanning pattern, and eventually the results of these secondary ion measurements are reconstructed into a two-dimensional image in line with the aforementioned discontinuous scanning pattern.

The invention discloses a method for evaluating the aging state of high-temperature vulcanized silicone rubber. According to the method, the aging state is evaluated by taking a mass spectrum peak height ratio of SiCH <3+> to SiC3H9 <+> as an aging judgment basis. Time-of-flight secondary ion mass spectrometry detection and quantitative analysis are carried out on a characteristic product in a silicone rubber aging process, so that the service life state of the material is accurately judged. A power grid company can judge whether a composite insulator needs to be replaced or not by adopting the diagnosis method, thereby ensuring safe and stable operation of a power grid.

Provided is a sample fixing member for a time-of-flight secondary ion mass spectrometer that: can prevent the contamination of a solid sample; can stably fix the solid sample; and enables accurate detection of a secondary ion in a time-of-flight secondary ion mass spectrometer. A sample fixing member for a time-of-flight secondary ion mass spectrometer of the present invention includes a fibrous columnar structure including a plurality of fibrous columnar objects each having a length of 200 μm or more.

[Object] To provide a metal-coated polyimide resin substrate that does not deteriorate the initial adhesion between the metal-coated polyimide resin film and the metal layer and has high adhesion after aging at 150° C. for 168 hours.[Solution] A metal-coated polyimide resin substrate in which a barrier layer is formed by a wet process after performing surface modification to one surface or both surfaces of a polyimide resin film by a wet process or a dry process or a combination thereof, a seed layer is thereafter formed by a wet process or a dry process, and a conductive film is formed on a surface layer thereof by a wet process; wherein, at the peeling surface on the conductive film layer side after the metal-coated polyimide resin substrate is subject to a 90-degree peel test, the thickness of a mixed layer of polyimide residue and barrier metal layer residue according to in-depth profiling with a time-of-flight secondary ion mass spectrometer (TOF-SIMS) is 2.60 nm or less based on Si sputter rate conversion, and peel strength retention after an aging test at 150° C. for 168 hours (peel strength after aging at 150° C. for 168 hours / initial peel strength) is 50% or higher.

Provided is a polarizer which is configured of a cellulose acylate film and a polarizing element and in which improved adhesion between the film and the polarizing element has been attained with a photocurable adhesive to inhibit the degree of polarization from decreasing. Also provided is a liquid-crystal display device equipped with the polarizer. The polarizer is a polarizer obtained by laminating a cellulose acylate film that comprises a cellulose acylate having a degree of substitution with an acyl group in the range of 2.0-2.5 and a glass transition temperature lowering agent to one surface of a polarizing element using a photocurable adhesive, and is characterized in that when the amount of the glass transition temperature lowering agent present in the laminating-side surface of the cellulose acylate film and the amount of the agent present in the other surface of the film, the amounts being determined using time-of-flight secondary-ion mass spectroscopy (TOF-SIMS), are expressed by dA and dB, respectively, then the value of r represented by equation (1) is 1.1 or larger. Equation (1) r = dA / dB

In a time of flight type secondary ionization mass spectrometry apparatus, spread of a primary beam irradiated on a sample is calculated through a numeric or practical experiment process, and the spread is used as a blurring function to restore an image to reduce blur. Provided is an image processing method of a mass spectrum image derived by irradiating a surface of a sample with a converged short pulsed primary beam, while changing an irradiating position, to display two-dimensionally a signal intensity based on a ratio of mass to an electric charge relating to a mass spectrum, derived by a time-of-flight secondary ion mass spectrometer, wherein the method comprising steps of: calculating a blurring function based on a shape of the primary beam incident in the surface of the sample; and restoring the mass spectrum image based on the blurring function.

The invention discloses a novel flight time secondary ion mass spectrometer. The structure of the novel flight time secondary ion mass spectrometer comprises a sample carriage, a primary ion source, a femtosecond laser device, an ion extraction system, a flight time ion mass analyzer and a signal generator. The novel flight time secondary ion mass spectrometer is a sensitive and efficient surface analysis device, and the device allows qualitative and quantitative analysis results of material components to be rapidly and accurately obtained. A femtosecond laser strong field off-resonance ionization technology is adopted to detect neutral particles, and the laser power can be controlled to simultaneously generate univalent and multivalent ions of a same element to provide a natural internal standard source for mass scaling of elements to be analyzed, so the mass of the elements to be analyzed can be accurately determined.

The invention relates to the field of high vacuum systems and discloses a microfluidic reactor, application thereof, a detection system and a method for detecting liquid phase interface ion distribution. The microfluidic reactor comprises a substrate and a silicon wafer, wherein a part of the silicon wafer is replaced by a silicon nitride membrane, the substrate has a concave structure for accommodating a sample, the concave structure is completely covered by the silicon wafer, the silicon wafer and the concave structure can jointly forms a sealed sample base, an the area replaced by the silicon nitride membrane is arranged above the concave structure, and the size of the area replaced by the silicon nitride membrane is smaller than or equal to the upper surface area of the concave structure. The invention further discloses application of the microfluidic reactor in detecting the liquid phase interface ion distribution. The detection system comprises the microfluidic reactor and a flight time secondary ion mass spectrometer. The method for detecting the liquid phase interface comprises the step of putting the microfluidic reactor where liquid to be detected is arranged into the flight time secondary ion mass spectrometer to befor being analyzed. The microfluidic reactor disclosed by the invention can achieve detection of the liquid phase interface in vacuum.

A soft magnetic film and a method of manufacturing the soft magnetic film are provided. The soft magnetic film is plated with Fe and Ni, Fe and Co, or Fe, Ni and Co. A ratio Cl / Fe of ion strengths between negative-charged Fe and Cl and a ratio S / Fe of ion strengths between negative-charged Fe and S are less than about 10 in measurement by a time-of-flight secondary ion mass spectrometry.

The present invention relates to an active substance, an electrode, a secondary battery, a battery pack, and an electric vehicle. The secondary battery comprises a positive electrode; a negative electrode comprising the active substance; and electrolyte, wherein the active substance comprises a central portion, and a covering portion which is located on the surface of the central portion, the central portion comprises silicon (Si) as a component, the covering portion comprises carbon (C) and hydrogen (H) as components, and kation analysis is carried out using a time of flight second ion mass spectroscopy method to detect one or more kinds of kation represented by CxHy (wherein x and y satisfy 2<=x<=6, and 3<=y<=9).

Disclosed is a gas barrier film which has both high gas barrier performance and high cracking (bending) resistance. Specifically disclosed is a gas barrier film which comprises, on a substrate in the following order, at least one silanol-containing layer and at least one gas barrier layer that contains silicon atoms and hydrogen atoms. The gas barrier film is characterized in that the relative SiOH ion strength in the central part of the silanol-containing layer in the film thickness direction as detected by time-of-flight secondary ion mass spectrometry (Tof-SIMS) is 0.02-1.0 when the relative Si ion strength is taken as 1. Also disclosed is an organic photoelectric conversion element which comprises the gas barrier film.

Provided is a metal-coated polyimide resin substrate that exhibits a high level of adhesion after aging at 150 DEG C for 168 hours without a reduction in the initial close adhesion between a metal-coated polyimide resin film and a metal layer. The metal-coated polyimide resin substrate is produced as follows. After surface modification is applied to one surface or both surfaces of a polyimide resin film using a wet method, a dry method, or a combination thereof, a barrier layer is formed using a wet method, a seed layer is subsequently formed using a wet method or a dry method, and a conductive film is formed on the surface layer using a wet method. The metal-coated polyimide resin substrate is characterized in that the thickness of a mixed layer of a polyamide residue and a barrier-metal layer residue at the peeled surface on the conductive film layer side of said metal-coated polyimide resin substrate after the metal-coated polyimide resin substrate is subjected to a 90 DEG peel test is 2.6 nm or less, in terms of Si sputtering speed, when measured by means of a depth profile analysis using a time-of-flight secondary ion mass spectrometer (TOF-SIMS), and the peel strength retention rate after a 168-hour aging test at 150 DEG C (peel strength after aging at 150 DEG C for 168 hours / initial peel strength) is 50% or higher.

A photomask blank including a transparent substrate, and at least one film (A) containing chromium and nitrogen and free of silicon and at least one film (B) containing silicon and oxygen, and free of a transition metal that are contacted to each other In the blank, when an intension of secondary ions is measured along a thickness direction of the films by a time-of-flight secondary ion mass spectrometry (TOF-SIMS), an intension of secondary ions derived from Cr2O5 is lower than an intension of secondary ions derived from SiN, at a position located at the interface or its vicinity of the film (A) and film (B) and having a maximum intensity of secondary ions derived from SiCrO5.

The invention relates to a nitrogen-doped soft carbon coated silicon-based lithium ion negative electrode material as well as a preparation method and application thereof. The method comprises the following steps: by taking a nitrogen-containing gas source or a high-boiling-point nitrogen-containing compound as a doping material, carrying out gas-phase mixing reaction on vapor of the doping material and preheated silicon source vapor at 1200-1700 DEG C for 1-24 hours to obtain a nitrogen-doped silicon monoxide material, wherein the silicon source steam is mixed steam of silicon steam and silicon dioxide steam, the nitrogen-containing gas source is a nitrogen-containing compound which is gaseous at normal temperature, and the high-boiling-point nitrogen-containing compound is a nitrogen-containing compound which is liquid or solid at normal temperature; cooling the nitrogen-doped silicon monoxide material to room temperature, discharging, crushing and screening; carrying out a flight time secondary ion mass spectrometry analysis test on the crushed and screened material, and determining whether the doping uniformity of the nitrogen doped in the silicon monoxide meets a preset condition or not; and performing carbon coating on the material of which the doping uniformity meets a preset condition to obtain the nitrogen-doped silicon-based lithium ion battery negative electrode material.

Provided is a sample fixing member for a time-of-flight secondary ion mass spectrometer, capable of preventing contamination of a solid sample, capable of stably fixing the solid sample, and capable of accurately detecting secondary ions in a time-of-flight secondary ion mass spectrometer. This sample fixing member for a time-of-flight secondary ion mass spectrometer includes a fibrous columnar structure comprising a plurality of fibrous columnar objects having a length of at least 200 [mu]m.