The invention discloses a dual-
wavelength phase-shift interference-based method for measuring optical heterogeneity, wherein according to dispersion characteristics of a material, an interferometer which comprises two lasers with different optical wavelengths or a
wavelength tunable laser is adopted, and
refractive index heterogeneity of a sample to be measured under optical
waves of two wavelengths is considered as the same as optical heterogeneity to be measured of the sample to be measured; a phase-shift interferogram of the sample to be measured under the optical
waves of the two wavelengths before being put into the interferometer, and a phase-shift interferogram of the sample to be measured under the optical
waves of the two wavelengths after being put into the interferometer are obtained by using phase-shifting
interferometry;and physical
light wave phase difference of the sample to be measured under the optical waves of the two wavelengths before / after being put into the interferometer is obtained by using a phase-shift interference phase
recovery algorithm, and then the optical heterogeneity of the sample to be measured is obtained. According to the dual-
wavelength phase-shift interference-based method for measuring the optical heterogeneity,
system errors are automatically eliminated, the sample to be measured does not need to be adjusted during a process of measuring, no special requirements for
surface shape, parallelism and
machining accuracy of a front and a rear surfaces of the sample to be measured exist, thus the dual-wavelength phase-shift interference-based method for measuring the optical heterogeneity is a genuine absolute measuring method and has high measuring accuracy.