A two-step phase-shift interferometric phase microscopy primary imaging system and method

Abstract

The invention discloses an interferometric phase microscopy one-step imaging system and method based on two-step phase shift, and adopts the technical scheme that based on a typical Mach-Zehnder interference light path, lateral displacement beam splitting mirrors are adopted to perform light splitting on sample light and reference light respectively, a wave plate is utilized as a phase shifter, and two interference figures can be acquired at the same time through single exposure, and phase imaging can be realized quickly through corresponding phase recovery operation, and a spatial form structure of a phase body is further deconstructed. The interferometric phase microscopy one-step imaging system and method are suitable for all interferometric phase microscopy imaging systems, such as traditional coaxial interference, off-axis interference and slight off-axis interference, and have high practical value and wide application prospect in the aspect of phase microscopy, particularly in the field of application and identification of biological cell morphology.

Description

technical field [0001] The invention belongs to the field of imaging technology, and in particular relates to a primary imaging technology of interference phase microscopy based on two-step phase shifting. Background technique [0002] Numerous biological samples, such as living cells, are mostly transparent and behave as phase objects. In order to make these phase objects clearly visible, it is generally necessary to convert the phase information into an intensity distribution, for which phase microscopic imaging technology emerges as the times require. Especially in the past ten years, various quantitative phase microscopic imaging techniques have been proposed one after another, which provide powerful tools for the microscopic observation and dynamic behavior of phase objects similar to biological cells. Most of the phase microscopic imaging technology is based on the interference principle of light, so this kind of technology is often called interference phase microscop...

AI Technical Summary

Problems solved by technology

It should be noted that in order to avoid the spherical secondary phase error caused by the microscopic objective lens, the same microscopic objective lens is added to the sample arm and the reference arm, but the increase of optical devices will lead to greater noise to a certain extent

In addition, this system also needs to separate the interference items through high-pass filtering, which leads to the inability to fully utilize the spatial bandwidth of the CCD

In this regard, Professor Adam Wax of Duke University in the United States proposed a slight off-axis interferometry technology between coaxial interferometry and off-axis interferometry. Only two phase-shifted interferometric patterns can be collected to achieve phase imaging. The disadvantage is that the two interferometric images is timeshare

Images