Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry

A synchronous phase-shifting and relative-phase technology, applied in measurement devices, measurement optics, optical radiation measurement, etc., can solve problems such as difficulty in ensuring efficiency due to nonlinear effects, and difficulties in measuring pulse width and phase of several femtosecond or even attosecond pulses , to achieve the effect of clear principle, easy access and simple method

Inactive Publication Date: 2011-09-07
BEIJING UNIV OF TECH
View PDF3 Cites 11 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Because the existing techniques for measuring pulse width and relative phase all need to apply the nonlinear effect of nonlinear crystals, it is difficult to ensure good efficiency when the pulse width is very narrow, so for measuring several femtosecond or even attosecond pulses The pulse width and phase are extremely difficult

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry
  • Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry
  • Method and device for measuring laser pulse width and relative phase by simultaneous phase-shifting interferometry

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0017] Example: such as figure 1 Shown: The ultrashort pulse to be tested is first split into two beams by a beam splitting prism, and one beam is used as figure 1 Pulse 1 in the optical path, a beam as figure 1 Pulse 2 in the light path. The relative phase of the pulse width of pulses 1 and 2 can be measured with this measurement method.

[0018] Pulse 1 uses scanning mode to interact with pulse 2 to form an interference field: #1, #2, #3, #4, ..., #n+1.

[0019] The first interference field #1: Pulse 1 is reflected by the right-angle total mirror 3 and then reflected by the half-reflective prism 5; pulse 2 becomes circularly polarized light after passing through the quarter-wave plate 4, and the circularly polarized light is again passed through After being transmitted by the half-reflective prism 5, the reflected light of the half-reflective prism 5—pulse 1 forms a composite beam, which forms an interference field #1 after being reflected by the polarization beam splitte...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and a device for measuring a laser pulse width and a relative phase by a simultaneous phase-shifting interferometry, which can measure a femtosecond pulse and an attosecond pulse of which the pulse width is very narrow. In the technology, a component prism is used for splitting light beams, and simultaneously, a plurality of simultaneous phase-shifting interference fringe patterns are obtained once in a spatial domain through a polarization interference method. By computational analysis on interference fields of a plurality of paths, the pulse width and the phase of an ultra-short pulse can be directly measured. The method provided by the invention is simple, clear in principles and excellent in shock resistance of the measuring result, and can implement on-site dynamic measurement and monitoring on the pulse width and the relative phase of the ultra-short pulse in an ultra-fast process. The measuring process is simple and convenient.

Description

technical field [0001] The invention relates to a method and device for measuring the pulse width and relative phase of laser pulses by synchronous phase-shifting interferometry. Specifically, it can measure the pulse width of picosecond, femtosecond and attosecond ultrashort laser pulses and measure the The relative phase delay of two light pulses after pulse splitting. Background technique [0002] In the mid-1980s, ultrashort laser pulse technology developed rapidly, from picoseconds to femtoseconds. Ultrashort pulse technology is widely used to study various ultrafast phenomena and physical behaviors under strong fields, such as molecular relaxation process, biological cell metabolism, chemical reaction kinetics, fast ignition laser fusion, mesa nuclear physics, etc. Throughout the development history of ultrashort pulse generation technology, its progress is inseparable from the development of measurement technology. Therefore, research and explore new technologies for...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01J11/00G01J9/02
Inventor 刘世炳贺雪鹏
Owner BEIJING UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com