The invention relates to a
circular dichroism spectrum and
refractive index measuring
system based on linear polarized light incidence. Wide-spectrum
continuous light emitted by a super-
continuous light source passes through a first lens and is adjusted to obtain parallel light, and the parallel light is modulated through an adjustable
polarizer into linear polarized light, wherein the linear polarized light and a one-dimensional period
metal groove structure form a first angle; after the linear polarized light is emitted into a to-be-measured chiral sample attached to the surface of the one-dimensional period
metal groove structure, transmission light is focused by a second lens to be collected by a
spectrograph; the adjustable
polarizer is further adjusted, and the parallel light is modulated into linear polarized light, wherein the linear polarized light and the one-dimensional period
metal groove structure form a second angle, and the second angle and the first angle are oppositely symmetrical; then after the linear polarized light is emitted in the to-be-measured chiral sample, the transmission light is focused by the second lens to be collected by the
spectrograph; according to the transmission spectrums collected twice, a
circular dichroism spectrum single and the
refractive index of the to-be-measured chiral sample can be calculated and obtained. According to the
circular dichroism spectrum and
refractive index measuring
system, a test method is simple; as adopted elements are universal components, the whole
machine cost of the
system is quite low, and the system has the quite large popularization value.