A self-calibrating
test probe system of the present invention does not require probing head removal and replacement. Using the
system of the present invention, the
test probe and / or the entire
system (including a testing instrument) may be calibrated or may self-calibrate while the probing head remains connected to an electrical component under test. The self-calibrating
electrical testing probe system includes calibration circuitry including at least one input
resistor, at least one
relay, and at least one known calibration reference
signal. If the
test probe is an active test probe, the calibration circuitry may also include at least one
amplifier. Each
relay has a first position that provides
signal access to a testing
signal from an electrical component under test and a second position that provides signal access to the known calibration reference signal. Using the present invention, the error of the test probe and / or system is determined and compensated. Exemplary methods by which error compensation may be provided includes, for example, amplifying the testing signal, creating a correction table of correction values and adding an appropriate value from the correction table, or mathematically compensating.