The invention discloses a general auto test
system based on a
device under test (DUT) model. The general auto test
system comprises a data storage controller, a test development controller, a monitoring display controller, a fault diagnosis controller, a
test analysis controller, a test resource controller and an analogue
simulation controller which are connected by a data
bus controller; each controller is provided with a corresponding component. The invention further provides a method for the general auto test
system. The method comprises the following steps of creating the DUT model; performing hardware selection and design of a conditioning circuit; creating a test resource model; performing
software deployment; performing test development and configuration, and the like. The general
automatic testing system disclosed by the invention can be compatible with a
big data storage platform, and lays a technology foundation for
data analysis and
data mining; the deployment, development and extension difficulty of the testing system is greatly reduced, and the development cost and the
time cost of the testing system are reduced; entire life-cycle management of
test data is really realized, the adaptability of an ATS (Auto Test
System) is improved, and the general range of the ATS system is widened.