37results about How to "Eliminate the effects of testing" patented technology

The invention discloses a dangling type micro-impulse testing device and method. A dangling system is fixed in a vacuum box, a thruster ignition power source, a circuit switch, a wire and a miniature thruster are integrated to the dangling system in a modularization mode, a dangling type micro-impulse testing system works in a vacuum environment, a remote control switch serves as a circuit switch to conduct remote control ignition, and influences of a miniature thruster ignition resistance wire power source and the wire on testing results are eliminated. A laser Doppler measurer is installed outside the vacuum box, a light path of a single beam laser head in the laser Doppler measurer is adjusted to be centered with a target reflector, the deviation of outgoing beams and incident beams is eliminated, displacement changes of the thruster are accurately measured, and influences of air friction during dangling are avoided. By means of the dangling type micro-impulse testing device and method, the working force of a miniature rocket motor in a short time can be tested, the micro impulses can be tested, and the impulse testing accuracy is high.

The invention is a method for rapidly evaluating the lifetime of an atomic gas chamber. The method first regulates the distribution state of the alkali metal in the atomic gas chamber to achieve a stable and concentrated regional distribution, and uses a glass shell packaged standard sample pair equal to the sample of the atomic gas chamber to be tested. The differential scanning calorimeter is calibrated to ensure accurate measurement of the amount of alkali metal in the gas chamber, and then the gas chamber is accelerated at high temperature T, and the amount of alkali metal in the gas chamber is periodically monitored at intervals of time t1. When the amount of alkali metal decreases linearly, accelerate the aging of the gas chamber at three different temperatures T0, T1, and T2 to obtain the consumption rate of alkali metal at these temperatures, and finally extrapolate from the Arrhenius equation to obtain the gas chamber at the operating temperature. The consumption rate of the alkali metal in the chamber can be used to quickly estimate the lifetime of the atomic gas chamber based on the initial amount of alkali metal. Compared with the traditional method of tracking and testing the amount of alkali metal for several years, this method not only accurately measures the consumption rate of alkali metal but also can complete the evaluation of the lifetime of the atomic gas chamber in a short period of time.

The invention belongs to a laser application technology, and relates to a photoelectric receiver time stability test method based on double-acousto-optical frequency shift. The method includes using a single-frequency laser as a light source, outputting a double-frequency laser after the single-frequency laser passes a double-acousto-optical frequency shifter, utilizing a non-polarized beam splitting prism for beam splitting, and testing phase difference between a to-be-tested photoelectric receiver and a reference photoelectric receiver. The method has the advantages that in testing, linearly polarized light with the frequencies of v1 and v2 in a reference light beam is transmitted in a coaxial identical-optical-path mode, and linearly polarized light with the frequencies of v1 and v2 in a measurement light beam is transmitted in a coaxial identical-optical-path mode; phases of the two light beams are unaffected by external environmental changes, extra phase errors are not introduced, and test accuracy is high; test frequency can be changed by the aid of the double-acousto-optical frequency shifter, and time stability of photoelectric receivers is tested when different beat frequencies interfere the frequency.

The invention belongs to a laser application technology, and relates to a photoelectric receiver temperature coefficient test method based on non-polarized beam splitting of a dual-frequency laser. The method includes using the dual-frequency laser as a light source, utilizing a non-polarized beam splitting prism for beam splitting, and testing phase difference between a to-be-tested photoelectric receiver and a reference photoelectric receiver at difference temperatures to obtain temperature coefficient of the to-be-tested photoelectric receiver. The method has the advantages that phases of a reference light beam and a measurement light beam are unaffected by external environment changes in testing, extra phase errors are not introduced, and test accuracy is high.