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35 results about "Photometric system" patented technology

In astronomy, a photometric system is a set of well-defined passbands (or filters), with a known sensitivity to incident radiation. The sensitivity usually depends on the optical system, detectors and filters used. For each photometric system a set of primary standard stars is provided.

Light measuring system, applicable light measuring method thereof and smart phone

The invention discloses a light measuring system which is arranged in a smart phone. The light measuring system comprises an ambient light sensor and a processing module. The ambient light sensor which comprises a lens and a photoelectric sensor acquires ambient light and outputs ambient light information, wherein the lens is a spheroid scatterer. The input end of the processing module is in circuit connection with the ambient light sensor, and the processing module receives acquired light information output by the ambient light sensor and obtains corresponding photographic parameters according to the acquired light information and outputs photographic parameters. The light measuring system is arranged in the smart phone, the light intensity of the ambient can be measured at any time. Photographic parameters such as apertures, shutters and photo-sensibility are obtained through calculation and can be transmitted to the other mobile terminal through the wireless technology, the photographic parameters are displayed to a photographer through a mobile terminal, and the photographer sets corresponding parameters of a camera according to the transmitted information and obtains accurate exposure of pictures.
Owner:湖州丰源农业装备制造有限公司

Silicon slice edge exposure system and its light intensity control method

The invention provides a silicon wafer edge exposing system and a light intensity control method thereof, wherein the system comprises a rotatable silicon wafer bearing stage, an exposing light source and optical fiber, an imaging lens, a control computer and a light intensity control device; the method comprises the following steps that: through setting the position of a light sieve, the light intensity control device can calibrate exposing light intensity; the constant output of light intensity is controlled through the internal light intensity closed-loop feedback of the light source; through detecting the position of the light sieve, whether calibration is needed once more is judged; an exposing light source switch and the rotation time of a silicon wafer rotary stage are controlled through the calibrated data of light intensity. Adopting the system and the method can realize ladder-type constant output of light intensity, thereby making full use of the intensity of a mercury lamp light source and ensuring the constant output of light intensity within a certain time; meanwhile, the invention increases the efficiency and reliability of silicon wafer edge exposing process; in addition, the invention obtains the effect that a plurality of sets of silicon wafer edge exposing systems uses a set of photometric system; moreover, the invention further provides a simplified light intensity control device, thereby saving equipment cost.
Owner:SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD

Ultrafast time-resolved transient reflectance spectrometer

The embodiments of the present invention provide an ultrafast time-resolved transient reflectance spectrometer. The ultrafast time-resolved transient reflectance spectrometer comprises a femtosecond laser source, a beam splitter, a pumping light system, a probe laser system, a photodetector and a computer. The beam splitter divides the femtosecond pulsed laser into first pulsed laser and second pulsed laser, the first pulsed laser is transmitted to the pumping light system, the second pulsed laser is transmitted to the probe laser system, the pumping light system is used for receiving the first pulsed laser, carrying out frequency multiplication processing on the first pulsed laser to obtain half-wavelength pumping light and focusing the half-wavelength pumping light to the sample surface,and the probe laser system is used for delaying processing on the second pulsed laser to obtain full-wavelength probe laser and focusing the full-wavelength probe laser to the sample after the half-wavelength pumping light is focused to the sample surface. The ultrafast time-resolved transient reflectance spectrometer can measure the relative change rate of the bulk surface transient reflectivitythrough a dual-wavelength pumping-detection method.
Owner:BEIJING UNIV OF TECH

Voltage frequency conversion circuit for photometric system

The invention discloses a voltage frequency conversion circuit for a photometric system. The voltage frequency conversion circuit is characterized in that the comparison input pin of a converter is connected with a second resistor; a timing circuit pin of the converter is connected with a third resistor and a second capacitor respectively; the third resistor and the power end of the converter are connected with a 9V power supply through a first inductor, and the 9V power supply is further connected with a third capacitor; the frequency output pin of the converter is connected with a fourth resistor, the fourth resistor is connected with the base electrode of a second triode, the emitting electrode of the second triode is connected with a fifth resistor and a sixth resistor respectively, and the fifth resistor is connected to the ground; the collector electrode of the second triode is connected with a seventh resistor which is connected with the 9V power supply, the sixth resistor is connected with an eighth resistor and the base electrode of a first triode respectively, the emitting electrode of the first triode is connected to the ground, and the collector electrode of the first triode is connected with a ninth resistor and outputs pulse signals at the same time. According to the voltage frequency conversion circuit, sunlight conversion frequency is improved, accuracy is high, the circuit is simple in structure, and various requirements in practical application are met.
Owner:高彩云

Chemiluminescence immunoassay analyzer

The invention belongs to the technical field of detection equipment, and provides a chemiluminescence immunity analyzer which comprises a rack, a control system arranged on the rack, and a reaction cup feeding and conveying system, a uniform mixing system, an acquisition system, an incubation cleaning system and a photometric system which are arranged on the rack and are electrically connected with the control system respectively, the reaction cup feeding and conveying system is used for storing, feeding and carrying reaction cups, the collecting system is used for transferring samples in the sample tubes and reagents in the reagent tubes to a uniform mixing position and collecting information of the sample tubes and the reagent tubes, and the uniform mixing system is used for uniformly mixing substances in the reaction cups. The incubation and cleaning system is used for performing incubation, cleaning, substrate adding and uniform mixing on substances in the reaction cup, and the photometric system is used for performing optical detection on the substances in the reaction cup after the incubation, cleaning, substrate adding and uniform mixing operations. The chemiluminescence immunoassay analyzer provided by the invention is high in automation degree, and can prevent human factors from influencing the accuracy and reliability of detection as much as possible.
Owner:深圳市世鑫医疗科技有限公司

Integrated cleaning inspection vehicle for navigation assistance lamps

The invention discloses an integrated cleaning inspection vehicle for navigation assistance lamps. The integrated cleaning inspection vehicle comprises a vehicle body chassis and a vehicle main control system, a travelling control system, a jet cleaning system and a metering system; the vehicle main control system is used for obtaining data information of the navigation assistance lamps, and for controlling operation of the travelling control system and the jet cleaning system; the metering system is used for detecting illumination and chroma information of the navigation assistance lamps; andthe vehicle main control system is used for judging whether cleanness of the navigation assistance lamps is qualified. According to the integrated cleaning inspection vehicle, by arranging the jet cleaning system, light outlets of the navigation assistance lamps can be cleaned fast, cleaning efficiency is high, consistency is good, damage to the lamps is small, illumination and chromaticity coordinates of the lamps can be detected in real time through the metering system, positions and appearance states of the lamps can be detected through a displacement detection system and a laser scanner,and fully-intelligentizing of all functions is realized, and manual operation is not needed.
Owner:北京爱德空港设备工程有限公司

Photoelectric signal amplification circuit for photometric system

The invention discloses a photoelectric signal amplification circuit for a photometric system. A non-inverting input end of a second input pin of an operational amplifier is connected with a first voltage feedback sampling resistor, an inverting input end of the second input pin of the operational amplifier is connected with a fourth resistor and a fifth resistor, a first output pin of the operational amplifier is connected with a second luminosity adjusting resistor, the second luminosity adjusting resistor is connected with the fourth resistor, the fifth resistor is connected with a second voltage feedback sampling resistor, the second voltage feedback sampling resistor is grounded, and a second output pin of the operational amplifier outputs secondarily amplified voltage signals. According to the photoelectric signal amplification circuit, sensed sunlight is converted into the voltage signals by the aid of a phototriode, the secondarily amplified voltage signals are outputted by the operational amplifier through subsequent processing of a voltage-dividing resistor, the luminosity adjusting resistor and the operational amplifier, and the requirement of a subsequent circuit is met. By the aid of the photoelectric signal amplification circuit, sunlight conversion efficiency is improved, precision is high, and various requirements of practical application are met.
Owner:刘亚男

Method of constructing light-measuring look-up table, light-measuring method, and light-measuring system

The invention discloses a method of constructing light-measuring look-up table, a light-measuring method, and a light-measuring system. The method of constructing light-measuring look-up table is to construct a look-up table by according to spectrum parameters relative to a light spectrum model, three actual color-matching functions relative to the light-measuring system and three standard color-matching functions, calculating both a look-up color coordinate and a reference color coordinate corresponding to each of the spectrum parameters. The light-measuring method includes: first, measuring a to-be-measured light by the light-measuring system to obtain actual stimulus values and calculating an actual color coordinate; then, comparing the actual color coordinate with the look-up color coordinates to determine both a to-be-measured light spectrum parameter and an estimated color coordinate relative to the to-be-measured light; furthermore, according to the to-be-measured light spectrum parameter, one of the standard color-matching functions and one of the actual stimulus values, calculating an estimated luminance.
Owner:CHROMA ATE

Silicon slice edge exposure system and its light intensity control method

The invention provides a silicon wafer edge exposing system and a light intensity control method thereof, wherein the system comprises a rotatable silicon wafer bearing stage, an exposing light sourceand optical fiber, an imaging lens, a control computer and a light intensity control device; the method comprises the following steps that: through setting the position of a light sieve, the light intensity control device can calibrate exposing light intensity; the constant output of light intensity is controlled through the internal light intensity closed-loop feedback of the light source; through detecting the position of the light sieve, whether calibration is needed once more is judged; an exposing light source switch and the rotation time of a silicon wafer rotary stage are controlled through the calibrated data of light intensity. Adopting the system and the method can realize ladder-type constant output of light intensity, thereby making full use of the intensity of a mercury lamplight source and ensuring the constant output of light intensity within a certain time; meanwhile, the invention increases the efficiency and reliability of silicon wafer edge exposing process; in addition, the invention obtains the effect that a plurality of sets of silicon wafer edge exposing systems uses a set of photometric system; moreover, the invention further provides a simplified light intensity control device, thereby saving equipment cost.
Owner:SHANGHAI MICRO ELECTRONICS EQUIP (GRP) CO LTD

Spatial photometry system calibration device and method based on beam line characteristics

The invention provides a method and device for calibrating a spatial optical measurement system, which specifically includes: according to a preset projection rule, making the tracer beam scanning system project a tracer of a known vector into the public field of view of a multi-eye vision equipment group Beam, solve the control line equation of the tracer beam in the world coordinate system; make the multi-eye vision equipment group collect the two-dimensional image of the tracer beam in each visual device, and solve the image line equation of the tracer beam in the target surface coordinate system; Intrinsic parameters and / or extrinsic parameters of each visual device are calculated by bundle adjustment method or least squares method. Then, through the principle of coordinate transfer, the spatial conversion relationship between the various visual devices is solved to complete the calibration. The calibration method and device provided by the present invention utilize the linear characteristics of the tracer beam for calibration, without any space cooperation target or target plate, which reduces the calibration difficulty of the optical measurement system, especially the large-space optical measurement system, and improves the calibration efficiency. precision and stability.
Owner:湖南科天健光电技术有限公司

Voltage frequency conversion circuit for photometric system

The invention discloses a voltage frequency conversion circuit for a photometric system. The voltage frequency conversion circuit is characterized in that the comparison input pin of a converter is connected with a second resistor; a timing circuit pin of the converter is connected with a third resistor and a second capacitor respectively; the third resistor and the power end of the converter are connected with a 9V power supply through a first inductor, and the 9V power supply is further connected with a third capacitor; the frequency output pin of the converter is connected with a fourth resistor, the fourth resistor is connected with the base electrode of a second triode, the emitting electrode of the second triode is connected with a fifth resistor and a sixth resistor respectively, and the fifth resistor is connected to the ground; the collector electrode of the second triode is connected with a seventh resistor which is connected with the 9V power supply, the sixth resistor is connected with an eighth resistor and the base electrode of a first triode respectively, the emitting electrode of the first triode is connected to the ground, and the collector electrode of the first triode is connected with a ninth resistor and outputs pulse signals at the same time. According to the voltage frequency conversion circuit, sunlight conversion frequency is improved, accuracy is high, the circuit is simple in structure, and various requirements in practical application are met.
Owner:高彩云
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