Spatial photometry system calibration device and method based on beam line characteristics

A calibration device and spatial light technology, applied in the field of visual measurement and image detection, can solve the problems of difficulty in target manufacturing and setting, difficult maintenance efficiency, uneven layout, etc., to achieve easy operation and maintenance, improve efficiency, and reduce labor intensity Effect

Active Publication Date: 2022-06-24
湖南科天健光电技术有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Based on this, the purpose of the present invention is to solve the problems of difficulty in target manufacturing and setting, uneven layout, labor intensity, difficult maintenance and low efficiency in the calibration process of the spatial optical measurement system, and to provide a space without a target or a target plate. Optical measurement system calibration device and method

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  • Spatial photometry system calibration device and method based on beam line characteristics
  • Spatial photometry system calibration device and method based on beam line characteristics
  • Spatial photometry system calibration device and method based on beam line characteristics

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Embodiment 1

[0040] figure 1 A flow chart of a method for calibrating a spatial photometric system provided by an embodiment of the present invention is shown. In step S101, the left camera and the right camera are set at two observation points corresponding to the spatial photometric system, and the observation angle of each camera is adjusted so that There is a common field of view between each camera; the left camera target surface coordinate system and the right camera target surface coordinate system are established; the tracking beam generator is fixedly installed on the total station to form a tracking beam scanning system;

[0041] In step S102, the tracer beam scanning system is made to project the tracer beam of a known vector to the public field of view of the camera; make each camera carry out image acquisition to this tracer beam, and obtain the two-dimensional image of this tracer beam at each camera;

[0042] In step S103, solve the control line equation of this tracer beam ...

Embodiment 2

[0082] In this embodiment, a one-dimensional high-precision turntable is selected as the multi-degree-of-freedom turntable, that is, the tracer beam projected by the one-dimensional turntable must be on a plane. For the convenience of calculation, a coordinate system such as figure 2 As shown, a two-dimensional world coordinate system XOY is established on the coplanar plane of each tracer beam, and the control line 7 of the i-th tracer beam is selected, which is the image line 8 of the left camera target surface coordinate system xoy. Without loss of generality, neither the control line 7 nor the image line 8 is parallel to the coordinate axis of the coordinate system where they are located.

[0083] From the high-precision azimuth positioning characteristics of the one-dimensional turntable, the control line equation can be obtained:

[0084] Y=AX+B

[0085] and the corresponding equation like a straight line:

[0086]

[0087] Substitute into the collinear equation

...

Embodiment 3

[0109] like image 3 As shown, the embodiment of the present invention also provides a calibration device of a space photometric system, the device comprising:

[0110] The multi-eye vision device group includes two vision devices, the left camera 1 and the right camera 2, which are used for image acquisition of the tracer beam 3 according to the preset projection rules, and output the tracer beam 3 formed on the target surface of each camera. Each camera of the two-dimensional image is arranged at each observation point of the spatial photometric system, and each camera is arranged at a certain angle to each other, and has a common field of view;

[0111] A tracer beam scanning system, used for projecting tracer beams 3 of different orientations to the public field of view of each camera according to a preset projection rule, and outputting the spatial orientation data of each tracer beam;

[0112] The processing system 4 is used to preset projection rules, input the spatial...

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Abstract

The invention provides a method and device for calibrating a spatial optical measurement system, which specifically includes: according to a preset projection rule, making the tracer beam scanning system project a tracer of a known vector into the public field of view of a multi-eye vision equipment group Beam, solve the control line equation of the tracer beam in the world coordinate system; make the multi-eye vision equipment group collect the two-dimensional image of the tracer beam in each visual device, and solve the image line equation of the tracer beam in the target surface coordinate system; Intrinsic parameters and / or extrinsic parameters of each visual device are calculated by bundle adjustment method or least squares method. Then, through the principle of coordinate transfer, the spatial conversion relationship between the various visual devices is solved to complete the calibration. The calibration method and device provided by the present invention utilize the linear characteristics of the tracer beam for calibration, without any space cooperation target or target plate, which reduces the calibration difficulty of the optical measurement system, especially the large-space optical measurement system, and improves the calibration efficiency. precision and stability.

Description

technical field [0001] The invention belongs to the field of visual measurement and image detection, and in particular relates to a calibration device and method of a spatial photometric system based on the linear characteristic of a light beam. Background technique [0002] Vision measurement is based on the theory of computer vision, using advanced high-density, low-noise and low-distortion image sensors, through high-speed real-time image acquisition system, dedicated image hardware processing system and high-performance computer to complete binary or grayscale images. Advanced system for efficient processing. [0003] The measurement principle of the vision measurement system is based on the pinhole camera model. This model is an idealized simple camera model, which is used to establish a mapping relationship between the three-dimensional space point coordinates in the world coordinate system and the two-dimensional image point coordinates on the camera target surface. ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/80G06F17/11
CPCG06T7/80G06F17/11
Inventor 曹动曹力
Owner 湖南科天健光电技术有限公司
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