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Ultrafast time-resolved transient reflectance spectrometer

A time-resolved, spectrometer technology, applied in instruments, scientific instruments, analytical materials, etc., can solve problems such as unobservable and uncapturable dynamic changes

Inactive Publication Date: 2018-12-07
BEIJING UNIV OF TECH
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  • Description
  • Claims
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Problems solved by technology

[0005] The present invention provides an ultra-fast time-resolved transient reflectance spectrometer that overcomes the above-mentioned problems or at least partially solves the above-mentioned problems. Its changes cannot be observed, and thus its internal dynamic changes cannot be captured

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Embodiment Construction

[0016] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0017] Since the world's first ruby ​​laser was developed in 1960, with the continuous efforts of scientific researchers, various laser technologies have developed rapidly, and various methods for generating ultrashort laser pulses have emerged, mainly including Q-switching technology, locking Mode technology and chirp compensation technology, etc. With the development of these technologies, the duration of laser pulses has been shortened, from the initial nanosecond level to femtosecond level. In the early 1980s, Fork et al. used collision Pulse mode-locking technology, for the first time in a dye laser, has obtained a laser pulse with a pulse width of less than 100fs (10...

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Abstract

The embodiments of the present invention provide an ultrafast time-resolved transient reflectance spectrometer. The ultrafast time-resolved transient reflectance spectrometer comprises a femtosecond laser source, a beam splitter, a pumping light system, a probe laser system, a photodetector and a computer. The beam splitter divides the femtosecond pulsed laser into first pulsed laser and second pulsed laser, the first pulsed laser is transmitted to the pumping light system, the second pulsed laser is transmitted to the probe laser system, the pumping light system is used for receiving the first pulsed laser, carrying out frequency multiplication processing on the first pulsed laser to obtain half-wavelength pumping light and focusing the half-wavelength pumping light to the sample surface,and the probe laser system is used for delaying processing on the second pulsed laser to obtain full-wavelength probe laser and focusing the full-wavelength probe laser to the sample after the half-wavelength pumping light is focused to the sample surface. The ultrafast time-resolved transient reflectance spectrometer can measure the relative change rate of the bulk surface transient reflectivitythrough a dual-wavelength pumping-detection method.

Description

technical field [0001] The invention relates to the field of ultrafast laser technology, and more specifically, to an ultrafast time-resolved transient reflectance spectrometer. Background technique [0002] The field of ultrafast carrier dynamics in semiconductors has made tremendous progress over the past few decades. The driving force behind this achievement is the direct application of semiconductor devices and the endless demands for faster response and faster information processing. In order to improve and develop miniature electronic devices and meet the above requirements, it is necessary to have a basic understanding and detailed study of various dynamical processes in semiconductors. Therefore, the excitation of semiconductors in non-equilibrium state and the subsequent relaxation process of various carriers has become a key field of semiconductor research. [0003] Traditional experimental methods usually use an external electric field to drive the movement of e...

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Application Information

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IPC IPC(8): G01N21/55
CPCG01N21/55G01N2021/557
Inventor 刘海云张秀聂需辰刘世炳宋海英
Owner BEIJING UNIV OF TECH
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