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117 results about "Logic testing" patented technology

Nuclear power DCS platform test device based on simulation system and test method thereof

The invention belongs to the technical field of automatic control of instruments and meters, and particularly relates to a nuclear power DCS platform test device based on a simulation system and a test method thereof. The device comprises a model server which operates all the system simulation models including chemical and volume control systems; an upper computer of which the function is communication configuration and operates monitoring control frames; and a communication server which realizes data communication between field acquisition controllers and the model server, wherein the port A of the communication server is connected with a lower switch and the port B is connected with an upper switch. The model server is connected with the first port of the upper server, the upper computer is connected with the second port of the model server, and the communication server is connected with the third port of the upper switch. The field acquisition controllers 1-8 are connected with the first to eight ports of the lower switch. The problems that the conventional hardware simulation technology does not perform modeling and cannot realize simulation of the actual physical and technical process control of a power plant can be solved, and the problems that logic testing cannot realize testing according to the technical control requirements can also be solved.
Owner:CHINA NUCLEAR CONTROL SYST ENG

Method, device and system for testing web page

The invention discloses a method, device and system for testing a web page. The method comprises the steps that the web page to be tested, the URL of the web page to be tested, page controllable elements extracted from the web page to be tested and the page logical description information of the web page to be tested are sent by a client side and received by a web page test server, and the URL and the page controllable elements of the web page to be tested are added to a page element base; the web page test server generates a graphic user interface according to the page logical description information of the web page to be tested and the page element base; an instruction for selecting the page controllable elements in the web page URL is received, the corresponding page controllable elements in the web page URL are selected from the page element base according to the instruction through the graphic user interface, and a test script is generated according to the page logical description information; the web page test server sends the generated test script and the web page to be tested to a tester for web page testing, web page logic is tested through the graphical test scheme, and the threshold of the web page logic testing is lowered.
Owner:TENCENT TECH (SHENZHEN) CO LTD

Automatic closed-loop testing method for connecting-and-locking logic of substation bay level

The invention provides an automatic closed-loop testing method for a connecting-and-locking logic of a substation bay level. The automatic closed-loop testing method comprises the steps of loading a substation configuration description (SCD) model and a bay level connecting-and-locking logic role, extracting a semaphore which is related with a tested bay level connecting-and-locking logic operation and a reference that corresponds with a logical operation result; automatically generating a connecting-and-locking logic testing task sequence, and determining a testing-and-control device in a testing scene; wherein each testing task comprises a name and a description of primary equipment of the connecting-and-locking logic test, a related semaphore, a corresponding number, an index and a connecting-and-locking logic prediction result; constructing multiple scenes which supports automatic closed-loop testing of the connecting-and-locking logic, and acquiring the connecting-and-locking logical operation result in the testing scene; and evaluating the logical operation result. The automatic closed-loop testing method is suitable for in-substation local automatic closed-loop testing and remote scheduling automatic closed-loop testing, and furthermore has functions of preventing reconstruction and expansion of device which requires power-off operation, improving testing efficiency, saving time-wasting and labor-wasting working cost in manual testing and ensuring high correctness of an error locking preventing logic.
Owner:CHINA ELECTRIC POWER RES INST +2

Voltage time type logic tester and test method

PendingCN107064790ARealize logic checkRealize telemetry and telematics auxiliary function testCircuit interrupters testingLoop controlControl engineering
The invention discloses a voltage time type logic tester and a test method. The tester comprises a distribution terminal logic test module, a section switch opening time test module, a closing peak current test module, and a tele-signaling and telemetry aided test module. The distribution terminal logic test module comprises a control circuit, a contactor in the control circuit is connected with a contactor main output circuit, and the contactor main output circuit is connected with a power output end. The section switch opening time test module comprises an hour meter which automatically records the opening time of a switch. The closing peak current test module comprises a current transformer connected in series to the output port of a distribution terminal, and tests the closing peak current through a current meter. The tele-signaling and telemetry aided test module comprises an adjustable voltage and current output module and an analog switch, and the adjustable voltage and current output module outputs adjustable voltage and current and works together with the analog switch to complete tele-signaling and telemetry function test. Voltage time type distribution terminal logic verification, section switch closing peak current test, section switch opening time test, and tele-signaling and telemetry aided function test can be implemented.
Owner:STATE GRID SHANDONG ELECTRIC POWER +1

Direct access logic testing in integrated circuits

A method and circuit for allowing direct access logic testing in integrated circuits. In one embodiment, an interface between integrated circuit core logic and integrated circuit user-defined logic is exposed, and the integrated circuit core logic and the integrated circuit user-defined logic is tested via the exposed interface. In another embodiment, an integrated circuit has logic selection circuitry connected with core logic and user-defined logic. The logic selection circuitry is used to selectively test the core logic and user-defined logic.
Owner:RENESAS ELECTRONICS AMERICA

Test platform and test method for aircraft message trigger logic

The present invention relates to a platform and method for testing aircraft message trigger logics. Apparatus for testing message trigger logics of aircraft comprises: DFDAU (Digital Flight Data Acquisition Unit), which is adapted to receive message trigger logics to be tested; an input interface, which is adapted to receive data of aircraft condition; and a simulation signal generator, which is adapted to generate simulation signals according to the data of aircraft condition; wherein, the DFDAU is adapted to receive the simulation signals, and generate messages according to the message trigger logics to be tested.
Owner:AIR CHINA LTD

Detection method and system for one-key sequential control system of intelligent substation

PendingCN110989547ARealize logic decouplingUnified test dataProgramme controlElectric testing/monitoringWiring diagramSystem under test
The invention discloses a detection method and system for a one-key sequential control system of an intelligent substation, and the method comprises the steps: a one-key sequential control detection system communicating with a detected system through a switcher, and obtaining the information of the detected system; performing data distribution according to a preset SCD model based on the information of the one-key sequential control detection system and the detected system; the detected system performing equipment state migration based on an equipment state migration method specified by the one-key sequential control detection system; the one-key sequential control detection system issuing a remote control instruction to the migrated detected system, performing positive and negative testson the one-key sequential control anti-misoperation locking logic of the tested equipment, and automatically comparing a test result with an expected result to obtain a comprehensive anti-misoperationlocking logic test result; wherein the SCD model is designed on the basis of a main wiring diagram containing various wiring modes of a one-key sequential control detection system. According to the technical scheme provided by the invention, logic decoupling of the equipment state and the current test equipment is realized through equipment state migration, the test configuration is simplified, and the correctness and the coverage rate of an anti-error logic test are improved.
Owner:CHINA ELECTRIC POWER RES INST

Simulated battery logic testing device

A simulated battery test device and method that is capable of testing a battery charging circuit and logic circuit to determine proper operation. An operational amplifier is used that can both source and sink current to simulate the operation of the battery. A battery low signal can be generated using the simulated battery test device to test a battery charging circuit and logic circuit in a battery low condition. In addition, a battery open signal can be generated to test the battery charging and logic circuit in a battery open condition. Charging currents are detected to determine if currents fall within an acceptable range.
Owner:AVAGO TECH WIRELESS IP SINGAPORE PTE

Arrangement for testing network switch expansion port using external logic to emulate connected expansion port

A network switch chip having an expansion port configured for transferring data according to a prescribed bus protocol is tested using an external logic unit (e.g., a field programmable gate array) configured to emulate a connected expansion port. The external logic unit is configured for receiving an expansion port frame from the expansion port via an expansion bus, generating a new expansion port frame, and outputting the new expansion port frame to the expansion port via the expansion bus. Hence, a test engineer can validate the expansion port of the network switch chip by detecting the reception of the new expansion port frame by the expansion port. Hence, the expansion port of the network switch chip can be tested without the necessity of a second network switch chip.
Owner:ADVANCED MICRO DEVICES INC
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